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Displaying records 21 to 30 of 153 records.
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21. Conduction and Loss Mechanisms in Flexible Oxide-Based Memristors
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/21/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A Herzing, Madelaine Herminia Hernandez, Christina Ann Hacker, Jan Obrzut, Lee J Richter, Curt A Richter
Abstract: In order to study the conduction and loss mechanisms behind their operation, flexible sol-gel based memristors were fabricated with differing oxide film thicknesses and device sizes. XPS, TEM, EELS, and VASE measurements indicated the oxide was amor ...

22. Controlled Formation and Characterization of Dithiothreitol-Conjugated Gold Nanoparticle Clusters
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/5/2014
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Justin M Gorham, Jiwen Zheng, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: We report a systematic study of the controlled formation of discrete-size gold nanoparticle clusters (GNCs) by interaction with the reducing agent dithiothreitol (DTT). Asymmetric-flow field flow fractionation and electrospray differential mobility a ...

23. Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/7/2013
Authors: Ravikiran Attota, Benjamin D. Bunday, Victor Vertanian
Abstract: We present results using simulations and experiments to demonstrate metrological applications of the through-focus scanning optical microscopy (TSOM) down to features at and well below the International Technology Roadmap for Semiconductors' 22  ...

24. Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical Normalization
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/5/2015
Authors: Jing Qin, Richard M Silver, Bryan M Barnes, Hui Zhou, Ronald G Dixson, Mark Alexander Henn
Abstract: Quantitative optical measurements of deep sub-wavelength, three-dimensional, nanometric structures with sensitivity to sub-nanometer details address an ubiquitous measurement challenge. A Fourier domain normalization approach is used in the Fourier ...

25. Detecting Carbon in Carbon: Application of Differential Charging to Obtain Information on the Chemical Identity and Spatial Location of Carbon Nanotube Aggregates in Composites by Imaging X-ray Photoelectron Spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/24/2015
Authors: Justin M Gorham, William A Osborn, Jeremiah W Woodcock, Keana C K Scott, John Michael Heddleston, Angela R Hight Walker, Jeffrey W Gilman
Abstract: The surface contributions and dispersion properties of multiwalled carbon nanotubes (MWCNT) within a composite are important measurements to perform on nano-enabled products in order to help answer environmental health and safety questions associated ...

26. Determination of nanoparticle surface coatings and nanoparticle Purity using microscale thermogravimetric analysis analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/8/2014
Authors: Elisabeth Mansfield, Christopher Michael Poling, Jenifer L. (Jenifer) Blacklock, Katherine M Tyner
Abstract: The use of nanoparticles in some applications (i.e., nanomedical, nanofiltration or nanoelectronic) requires small-scale samples with well-known purities and composition. In addition, when nanoparticles are introduced into complex environments ( ...

27. Development of a conceptual framework for evaluation of nanomaterials release from nanocomposites: environmental and toxicological implications
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/2/2014
Authors: Jame Ging, Raul Tejerina-Anton, Girish Ramakrishnan, Mark Nielsen, Kyle Murphy, Justin M Gorham, Tinh Nguyen, Alexander Orlov
Abstract: Despite the fact that nanomaterials are considered potentially hazardous in a freely dispersed form, they are often considered safe when encapsulated into a polymer matrix. However, systematic research to confirm the abovementioned paradigm is lackin ...

28. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian J Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...

29. Dimensional Analysis of Through Silicon Vias Using the TSOM Method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/12/2011
Authors: Ravikiran Attota, Andrew Rudack
Abstract: There is a great need for accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). Through-focus scanning optical microscopy (TSOM) is an optical metrology method that pr ...

30. Direct evidence of active and inactive phases of Fe catalyst nanoparticles for carbon nanotube formation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/1/2014
Authors: Stefano Mazzuccoo, Ying Wang, Mihaela M. Tanase, Matthieu C. Picher, Kai Li, Zhijian WU, Stephan Irle, Renu Sharma
Abstract: Iron and carbon interactions play an important role in various industrial processes such as steel manufacturing, liquid fuel the production by Fischer Tropsch process and carbon nanotube synthesis by chemical vapor deposition process. Interestingly, ...

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