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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 21 to 30 of 216 records.
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21. CAVITY OPTOMECHANICAL SENSORS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/5/2011
Authors: Houxun H. Miao, Kartik A Srinivasan, Matthew T. Rakher, Marcelo Ishihara Davanco, Vladimir A Aksyuk
Abstract: We report a novel type of fully integrated optomechanical sensor and demonstrate high sensitivity mechanical displacement measurements on chip. We sense the motion of micro and nano-mechanical devices by near field coupling them to high quality facto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908272

22. CEINT/NIST PROTOCOL for the PREPARATION OF NANOSCALE TiO2 DISPERSIONS IN AN ENVIRONMENTAL MATRIX FOR ECO-TOXICOLOGICAL ASSESSMENT
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/2/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
Abstract: Toxicity and fate assessment are key elements in the evaluation of the environmental, health and safety risks of engineered nanomaterials (ENMs). While significant effort and resources have been devoted to the toxicological evaluation of many ENMs, i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910395

23. Calibration of 1 nm SiC Step Height Standards
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/31/2010
Authors: Theodore Vincent Vorburger, Albert M. Hilton, Ronald G Dixson, Ndubuisi George Orji, J. A. Powell, A. J. Trunek, P. G. Neudeck, P. B. Abel
Abstract: We aim to develop and calibrate a set of step height standards to meet the range of steps useful for nanotechnology. Of particular interest to this community is the calibration of atomic force microscopes operating at their highest levels of magnifi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905193

24. Capabilities of Single Particle Inductively Coupled Plasma Mass Spectrometry for the Size Measurement of Nanoparticles: A Case Study on Gold Nanoparticles
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/28/2014
Authors: Jingyu Liu, Karen E Murphy, Robert I. MacCuspie, Michael R Winchester
Abstract: The increasing application of engineered nanomaterials in consumer and medical products has motivated the development of single particle inductively coupled plasma mass spectrometry (spICP-MS) for characterizing nanomaterials under realistic envi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914724

25. Carbon Nanotube Nucleation Driven by Catalyst Morphology Dynamics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/14/2011
Authors: Elena Pigos, Evgeni S Penev, Morgana A Ribas, Renu Sharma, Boris I. Yakobson, Avetik R. Harutyunyan
Abstract: In situ observation of carbon nanotube nucleation process accompanied by catalyst particle dynamic morphology reconstruction is considered within a thermodynamic approach, and reveals the driving force for the liftoff,a crucial event in the nanotube ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908296

26. Carbon nanotube applications to scanning probe microscopy for next generation semiconductor metrology
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/3/2010
Authors: Victor H. Vartanian, Paul McClure, Vladimir Mancevski, Joseph J Kopanski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin, Vincent LaBella, Kathleen Dunn
Abstract: This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope measurements. Variations in CNT tip conductivity and contact resistance during fabrication ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907033

27. Challenges and Opportunities of Organic Electronics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

28. Challenges for Physical Characterization of Silver Nanoparticles Under Pristine and Environmentally Relevant Conditions
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/17/2011
Authors: Robert I. MacCuspie, Kim Rogers, Manomita Patra, Zhiyong Suo, Andrew John Allen, Matthew N. Martin, Vincent A Hackley
Abstract: The conditions used to disperse silver nanoparticles (AgNPs) strongly impact their resulting size measurements and agglomeration state, based on the underlying metrology and physical chemistry, respectively. A series of AgNP materials with reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907651

29. Characterization and Resistive Switching Properties of Solution-Processed HfO2, HfSiO4, and ZrSiO4 Thin Films on Rigid and Flexible Substrates
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/7/2011
Authors: Joseph Leo Tedesco, Walter Zheng, Oleg A Kirillov, Sujitra Jeanie Pookpanratana, Hyuk-Jae Jang, Premsagar Purushotham Kavuri, Nhan V Nguyen, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910358

30. Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/15/2008
Authors: Shaw C Feng, Che B. Joung, Theodore Vincent Vorburger
Abstract: Critical Dimension Atomic Force Microscopy (CD-AFM) is a primary means to measure the geometric shapes of walls and trenches on the nanometer scale in laboratories supporting the electronic industry. As the widths of commercially available CD-AFM pro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824690



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