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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: date

Displaying records 21 to 30 of 163 records.
Resort by: Date / Title


21. A method to determine the number of nanoparticles in a cluster using conventional optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/10/2015
Authors: Hyeong G. Kang, Ravikiran Attota, Premsagar Purushotham Kavuri, Vipin Nagnath Tondare, Andras Vladar
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918715

22. Quantitative tool characterization of a 193 nm scatterfield microscope
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/9/2015
Authors: Martin Y Sohn, Bryan M Barnes, Hui Zhou, Richard M Silver
Abstract: Optical microscope tool characterization has been investigated for the quantitative measurements of deep sub-wavelength features using a Fourier plane normalization method. The NIST 193 nm scatterfield microscope operating with an ArF Excimer laser, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919267

23. Protocols for Accelerating Laboratory Weathering and Measurements of Degradation of Polymer-Multiwalled Carbon Nanotube Composites
Series: Special Publication (NIST SP)
Report Number: 1200-15
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/3/2015
Authors: Li Piin Sung, Tinh Nguyen
Abstract: Polymer nanocomposites containing multi-walled carbon nanotubes (MWCNTs) are increasingly or potentially will be used in many large-volume industries. These advanced composites are exposed to severe mechanical and environmental stresses, such that, d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918290

24. Fractionation and characterization of high aspect ratio gold nanorods using asymmetric-flow field flow fractionation and single particle inductively coupled plasma mass spectrometry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/14/2015
Authors: Thao M. Nguyen, Jingyu Liu, Vincent A Hackley
Abstract: Development of methods for the in situ fractionation and characterization of high aspect ratio (AR) gold nanorods (GNRs) is a rapidly growing area of interest within the nanotechnology field, particularly with respect to nanomanufacturing and biomedi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918653

25. Electron beam induced current in the high injection regime
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/2/2015
Authors: Paul M Haney, Heayoung Yoon, Prakash Koirala, Robert W. Collins, Nikolai B Zhitenev
Abstract: Electron beam induced current (EBIC) is a powerful technique which measures the charge collection efficiency of photovoltaics with sub-micron spatial resolution. The exciting electron beam results in a high generation rate density of electron-hole ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917436

26. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/1/2015
Authors: Christian J Long, Rachel J. Cannara
Abstract: Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917591

27. Unexpected Changes in Functionality and Surface Coverage for Au Nanoparticle PEI Conjugates: Implications for Stability and Efficacy in Biological Systems
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/26/2015
Authors: Tae Joon Cho, John M Pettibone, Justin M Gorham, Thao M. Nguyen, Robert I. MacCuspie, Julien C. Gigault, Vincent A Hackley
Abstract: Attached.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918002

28. The effect of systematic errors on the hybridization of optical critical dimension measurements
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/21/2015
Authors: Mark Alexander Henn, Richard M Silver, Nien F Zhang, Hui Zhou, Bryan M Barnes
Abstract: In hybrid metrology two or more measurements of the same measurand are combined to provide a more reliable result that ideally incorporates the individual strengths of each of the measurement methods. While these multiple measurements may come from d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918395

29. Characterizing the three-dimensional structure of block copolymers via sequential infiltration synthesis and scanning transmission electron tomography
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/26/2015
Authors: Tamar Segal-Peretz, Jonathan P. Winterstein, Manolis Doxastakis, Abelardo Ramirez-Hernandez, Mahua Biswas, Jiaxing Ren, Hyo Seon Suh, Seth B. Darling, James Alexander Liddle, Jeffrey Elam, Juan J. de Pablo, Nestor Zaluzec, Paul Nealey
Abstract: Understanding and controlling the three-dimensional structure of block copolymer (BCP) thin films is critical for utilizing these materials for sub-20 nm nanopatterning in semiconductor devices, as well as in membranes and solar cell applications. Co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917920

30. Preparation of Multi-Walled Carbon Nanotube Dispersions in a Polyetheramine Epoxy for Eco- Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-9
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/30/2015
Authors: Chelsea Simone Davis, Jeremiah W Woodcock, Jeffrey W Gilman
Abstract: Carbon nanotubes (CNT) are a widely studied nanomaterial due to their unique electrical, thermal, and mechanical properties which can be transferred to commercially-relevant products. As a result, several industries have made significant effo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917859



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