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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 21 to 30 of 208 records.
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21. Determination of nanoparticle surface coatings and nanoparticle Purity using microscale thermogravimetric analysis analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/8/2014
Authors: Elisabeth Mansfield, Christopher Michael Poling, Jenifer L. (Jenifer) Blacklock, Katherine M Tyner
Abstract: The use of nanoparticles in some applications (i.e., nanomedical, nanofiltration or nanoelectronic) requires small-scale samples with well-known purities and composition. In addition, when nanoparticles are introduced into complex environments ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914528

22. Development of a conceptual framework for evaluation of nanomaterials release from nanocomposites: environmental and toxicological implications
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/2/2014
Authors: Jame Ging, Raul Tejerina-Anton, Girish Ramakrishnan, Mark Nielsen, Kyle Murphy, Justin M Gorham, Tinh Nguyen, Alexander Orlov
Abstract: Despite the fact that nanomaterials are considered potentially hazardous in a freely dispersed form, they are often considered safe when encapsulated into a polymer matrix. However, systematic research to confirm the abovementioned paradigm is lackin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914575

23. Statistical Sampling of Carbon Nanotube Populations by Thermogravimetric Analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/25/2013
Authors: Elisabeth Mansfield, Aparna Kar, Chih-Ming Wang, Ann Chiaramonti Chiaramonti Debay
Abstract: Carbon nanotubes are one of the most promising nanomaterials on the market, with applications in electronics devices, sensing, batteries, composites and medical communities. Strict control of the carbon nanotube chemistry and properties is neces ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913801

24. Assembly and evaluation of a pyroelectric detector bonded to vertically aligned multiwalled carbon nanotubes over thin silicon
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/20/2013
Authors: John H Lehman, Evangelos Theocharous, Savva Theocharous
Abstract: A novel pyroelectric detector consisting of a vertically aligned nanotube array on thin silicon (VANTA/Si) bonded to a 60 μm thick crystal of LiTaO^d3^ has been fabricated. The performance of the VANTA/Si-coated pyroelectric detector was evaluat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914408

25. Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/13/2013
Authors: Norman A Sanford, David R Diercks, Brian Gorman, R Kirchofer, Kristine A Bertness, Matthew David Brubaker
Abstract: The field evaporation behavior of c-axis GaN nanowires was explored in two different laser-pulsed atom probe tomography (APT) instruments. Transmission electron microscopy imaging before and after atom probe tomography analysis was used to assist in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915760

26. Strong Casimir force reduction by metallic surface nanostructuring
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/27/2013
Authors: Francesco Intravaia, Stefan T. Koev, Il Woong Jung, Albert A. Talin, Paul S Davids, Ricardo Decca, Vladimir A Aksyuk, Diego A. R. Dalvit, Daniel Lopez
Abstract: The Casimir force is a quantum-mechanical interaction arising from vacuum fluctuations of the electromagnetic (EM) field and is technologically significant in micro- and nanomechanical systems. Despite rapid progress in nanophotonics, the goal of e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910133

27. Generalized Tabletop EUV Coherent Diffractive Imaging in a Transmission Geometry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/11/2013
Authors: Justin M Shaw, Bosheng Zhang, Matthew Seaberg, Daniel Adams, Dennis Gardner, Elizabeth Shanblatt, Henry C. Kapteyn, Margaret M. Murnane
Abstract: We demonstrate the first generalized tabletop EUV coherent microscope that can image extended, non-isolated, non-periodic, objects. By implementing keyhole coherent diffraction imaging with curved mirrors and a tabletop high harmonic source, we demon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914128

28. PEGylated Gold Nanorod Separation and Characterization by Asymmetric Field Flow Fractionation Based on Aspect Ratio with UV-Vis Detection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/5/2013
Authors: Thao Minh Nguyen, Julien C. Gigault, Vincent A Hackley
Abstract: The development of highly efficient asymmetric-flow field flow fractionation (A4F) methodology for biocompatible PEGylated gold nanorods (GNR) without the need for surfactants in the mobile phase is presented. We report on the potential of A4F for r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914165

29. Temperature-Programmed Electrospray-Differential Mobility Analysis for Characterization of Ligated Nanoparticles in Complex Media
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/12/2013
Authors: De-Hao D. Tsai, Frank W DelRio, John M Pettibone, Pin Ann Lin, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: In this study, an electrospray-differential mobility analyzer (ES-DMA) was operated with an aerosol flow-mode, temperature-programmed approach to enhance its ability to characterize the particle size distributions (PSDs) of nanoscale particles (NPs) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913860

30. Through-focus scanning optical microscopy for defect inspection of EUV masks
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/12/2013
Authors: Ravikiran (Ravikiran) Attota, Vibhu Jindal
Abstract: The TSOM method provides three-dimensional nanoscale metrology using a conventional optical microscope. Substantial improvements in defect detectability using the TSOM method will be presented. The TSOM method shows potential to (i) detect phase defe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914027



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