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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 101 to 110 of 196 records.
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101. Imaging of nanoscale charge transport in bulk heterojunction solar cells
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/17/2011
Authors: Behrang H Hamadani, Nadine Emily Gergel-Hackett, Paul M Haney, Nikolai B Zhitenev
Abstract: We have studied the local charge transport properties of organic bulk heterojunction solar cells based on the blends of poly(3-hexylthiophene) (P3HT) and phenyl-C61-butyric acid methyl ester (PCBM) with a photoconductive atomic force microscope (PCAF ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905890

102. Hydrodynamic Fractionation of Finite Size Nano Gold Clusters
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/15/2011
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Julian S. Taurozzi, Michael Russel Zachariah, Vincent A Hackley
Abstract: We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908232

103. Methodology for imaging of nano-to-microscale water condensation dynamics on complex nanostructures
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/11/2011
Authors: Konrad Rykaczewski, John Henry j Scott
Abstract: By transferring of a small part of a macroscale sample to a novel thermally insulated sample platform we are able to mitigate flooding and electron heating problems typically associated with Environmental Scanning Electron Microscopy imaging of water ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908396

104. CAVITY OPTOMECHANICAL SENSORS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/5/2011
Authors: Houxun H. Miao, Kartik A Srinivasan, Matthew T. Rakher, Marcelo Ishihara Davanco, Vladimir A Aksyuk
Abstract: We report a novel type of fully integrated optomechanical sensor and demonstrate high sensitivity mechanical displacement measurements on chip. We sense the motion of micro and nano-mechanical devices by near field coupling them to high quality facto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908272

105. Fabrication and characterization of silicon-based molecular electronic devices
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/21/2011
Authors: Christina Ann Hacker, Michael A Walsh, Sujitra Jeanie Pookpanratana, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908433

106. Flexible Memristors Fabricated through Sol-Gel Hydrolysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/4/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Madelaine Herminia Hernandez, Andrew A Herzing, Lee J Richter, Christina Ann Hacker, Joseph J Kopanski, Jan Obrzut, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908437

107. Flexible Memristors Fabricated through Sol-Gel Hydrolysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/1/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A Herzing, Madelaine Herminia Hernandez, Joseph J Kopanski, Christina Ann Hacker, Curt A Richter
Abstract: Memristors were fabricated on flexible polyethylene terephthalate substrates consisting of an oxide film generated through hydrolysis of a spun-on sol-gel. X-ray photoelectron spectroscopy, spectroscopic ellipsometry, transmission electron microscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907805

108. TSOM Method for Semiconductor Metrology
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/18/2011
Authors: Ravikiran Attota, Ronald G Dixson, John A Kramar, James Edward Potzick, Andras Vladar, Benjamin D. Bunday, Erik Novak, Andrew C. Rudack
Abstract: Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement resolution using conventional optical microscopes; measurement sensitivities are comparable to what is typical using Scatterometry, SEM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908177

109. Silicon-based Molecular Electronics in the Post-Hype Era
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/8/2011
Author: Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908431

110. Flexible Memristors: Fabrication and Characterization for Electronics Applications
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/4/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A Herzing, Madelaine Herminia Hernandez, Jan Obrzut, Joseph J Kopanski, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908436



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