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Displaying records 21 to 25.
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21. Soft-Decision Metrics for Coded Orthogonal Signaling in Symmetric Alpha-Stable Noise
Topic: Statistics
Published: 1/1/2008
Authors: Michael R Souryal, E G Larsson, B M Peric, B R Vojcic
Abstract: This paper derives new soft decision metrics for coded orthogonal signaling in impulsive noise, more specifically symmetric alpha-stable noise. For the case of a known channel amplitude and known noise dispersion, exact metrics are derived both for C ...

22. Statistical Analysis of NIST Interlaboratory Comparison of Polystyrene Molecular Mass Distribution Obtained by MALDI TOF MS
Topic: Statistics
Published: 1/1/1999
Authors: S Wetzel, Charles Martin Guttman, Kathleen M. Flynn

23. Statistical Analysis of Reader Measurement Variability in Nodule Sizing with CT Phantom Imaging Data
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7879
Topic: Statistics
Published: 11/23/2012
Authors: John Lu, Charles D. Fenimore, Nicholas Petrick, Rongping Zeng, Marios A Gavrielides, David Clunie, Kristin Borradaile, Robert Ford, Hyun J. Grace Kim, Michael McNitt-Gray, Binsheng Zhao, Andrew Buckler
Abstract: RSNA has conducted a phantom quantitative imaging biomarker (QIBA) study to assess reader measurement variability of both spherical and non-spherical nodules using CT imaging. Statistical analysis of intra-reader and inter-reader variability of v ...

24. The Axes of Random Infinitesimal Rotations and the Propagation of Orientation Uncertainty
Topic: Statistics
Published: 5/5/2015
Authors: Marek Franaszek, Mili Shah, Geraldine S Cheok, Kamel S Saidi
Abstract: Perception systems can measure the orientation of a solid 3D object; however, their measurements will contain some uncertainties. In many robotic applications, it is important to propagate the orientation uncertainties of a rigid object onto the unce ...

25. Use of Bayesian Statistics to Improve Optical Measurement Uncertainty by Combined Multi-Tool Metrology
Topic: Statistics
Published: 6/25/2015
Authors: Nien F Zhang, Richard M Silver, Hui Zhou, Bryan M Barnes
Abstract: Recently, there has been significant research investigating new optical technologies for dimensional metrology of features 32 nm in critical dimension and smaller. When modeling optical measurements a library of curves is assembled through the simula ...

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