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Displaying records 101 to 110 of 112 records.
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101. Statistical Interpretation of Key Comparison Degrees of Equivalence Based on Distributions of Belief
Topic: Statistics
Published: 4/2/2007
Author: Blaza Toman
Abstract: In a Key Comparison experiment, the Mutual Recognition Arrangement (MRA) requires the calculation of the Degrees of Equivalence (DoE) and the accompanying measures of uncertainty. Unilateral DoEs have been defined as a difference between a laboratory ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50904

102. Statistical Interpretation of Key Comparison Reference Value and Degrees of Equivalence
Series: Journal of Research (NIST JRES)
Topic: Statistics
Published: 11/1/2003
Authors: Raghu N Kacker, Raju Vsnu Datla, Albert C Parr
Abstract: This paper responds to comments received by the authors on the paper, Combined Result and Associated Uncertainty from Interlaboratory Evaluations Based on the ISO Guide that appeared in Metrologia, 2002, 39, 279-293.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150873

103. Testing Equality of Cell Populations Based on Shape and Geodesic Distance
Topic: Statistics
Published: 12/3/2013
Authors: Robert Charles Hagwood, Javier Bernal, Michael W Halter, John T Elliott
Abstract: Image cytometry has emerged as a valuable in-vitro screening tool and advances in automated microscopy have made it possible to readily analyze large cellular populations of image data. A statistical procedure to study homogeneity of such data ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911573

104. Three Statistical Paradigms for The Assessment and Interpretation of Measurement Uncertainty
Topic: Statistics
Published: 1/12/2009
Authors: William F Guthrie, Hung-Kung Liu, Andrew L Rukhin, Blaza Toman, Chih-Ming Wang, Nien F Zhang
Abstract: The goals of this chapter are to present different approaches to uncertainty assessment from a statistical point of view and to relate them to the methods that are currently being used in metrology or are being developed within the metrology communit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51273

105. Tutorial for metrologists on the probabilistic and statistical apparatus underlying the GUM and related documents
Topic: Statistics
Published: 11/9/2011
Authors: Antonio M Possolo, Blaza Toman
Abstract: A review and précis of the meaning and calculus of probability, including random variables, probability distributions, functions of random variables, and of Bayesian statistical inference, with many illustrative examples.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910148

106. Two SVDs Suffice: Spectral decompositions for probabilistic topic modeling and latent Dirichlet allocation
Topic: Statistics
Published: 12/6/2012
Authors: Yi-Kai Liu, Animashree Anandkumar, Dean P. Foster, Daniel Hsu, Sham M. Kakade
Abstract: The problem of topic modeling can be seen as a generalization of the clustering problem, in that it posits that observations are generated due to multiple latent factors (e.g. the words in each document are generated as a mixture of several activ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911442

107. Uncertainty Analysis for Vector Measurands Using Fiducial Inference
Topic: Statistics
Published: 1/1/2006
Authors: Chih-Ming Wang, Hariharan K Iyer
Abstract: This paper presents a method for constructing uncertainty regions for a vector measurand in the presence of both type-A and type-B errors. The method is based on the principle of fiducial inference and generally requires a Monte Carlo approach for co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150367

108. Uncertainty Machine --- User's Manual
Topic: Statistics
Published: 7/10/2013
Authors: Antonio M Possolo, Thomas Victor Emmanuel Lafarge
Abstract: NIST's Uncertainty Machine is a software application to evaluate the measurement uncertainty associated with an output quantity defined by a measurement model of the form y = f(x[1],...,x[n]), where the real-valued function f is specified fully and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913874

109. Uncertainty in Reference Values for the Charpy V-notch Verification Program
Topic: Statistics
Published: 5/1/2005
Authors: Jolene D Splett, Chih-Ming Wang
Abstract: We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO GUM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50807

110. Universal Low-rank Matrix Recovery from Pauli Measurements
Topic: Statistics
Published: 12/12/2011
Author: Yi-Kai Liu
Abstract: We study the problem of reconstructing an unknown matrix M of rank r and dimension d using O(rd poly log d) Pauli measurements. This has applications in quantum state tomography, and is a non- commutative analogue of a well-known problem in compress ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909979



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