NIST logo

Publications Portal

You searched on:
Topic Area: Modeling
Sorted by: title

Displaying records 81 to 90 of 137 records.
Resort by: Date / Title

81. Micromagnetic investigation of periodic cross-tie/vortex wall geometry
Topic: Modeling
Published: 5/18/2012
Author: Michael J Donahue
Abstract: A systematic series of micromagnetic simulations on periodic cross-tie/vortex wall structures in an ideal soft film at various width, thickness, and period lengths is performed. For each width and thickness a natural period length is found which has ...

82. Modeling Affiliations in Networks
Topic: Modeling
Published: 12/6/2010
Author: Brian Dale Cloteaux
Abstract: One way to help understand the structure of certain networks is to examine what common group memberships the actors in the network share. Linking actors to their common affiliations gives an alternative type of network commonly called an affiliation ...

83. Modeling Methodologies and Simulation for Dynamical Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7875
Topic: Modeling
Published: 8/27/2012
Authors: Ion Matei, Conrad E Bock
Abstract: Computer-interpretable representations of system structure and behavior are at the center of designing today‰s complex systems. Engineers create and review such representations using graphical modeling languages that support specification, analys ...

84. Modeling Scanning Electron Microscope Measurements with Charging
Topic: Modeling
Published: 4/3/2013
Author: John S Villarrubia

85. Modeling atomic structure at the nanoscale using the PDF: simulation studies of monoatomic nanoparticles
Topic: Modeling
Published: 8/17/2010
Authors: Katharine M Mullen, Victor Lvovich Krayzman, Igor Levin
Abstract: The pair distribution function (PDF), as determined from total x-ray or neutron scattering, is a valuable probe of atomic arrangements in nanoparticles. Structural information in such experimental PDF data is convoluted with the effects of particle ...

86. Modeling of Photochemical Reactions in a Focused Laser Beam
Series: Journal of Research (NIST JRES)
Topic: Modeling
Published: 7/1/2007
Authors: Fern Y Hunt, Adolfas Kastytis Gaigalas, Lili Wang
Abstract: This paper presents a mathematical model of photodegradation of fluorophores passing through a laser beam. The beam is focused on the sample and thus the power distribution of incident light is strongly dependent on spatial location while the fluorop ...

87. Modeling queuing dynamics of TCP: a simple model and its empirical validation.
Topic: Modeling
Published: 5/6/2011
Authors: Daniel Ilya Genin, Anastase Nakassis
Abstract: Understanding queuing dynamics of TCP is important for correct router buffer sizing as well as for optimizing the performance of the TCP protocol itself. However, modeling of buffer content dynamics under TCP has received relatively little attent ...

88. Modelling Type Ia Supernova Light Curves
Topic: Modeling
Published: 9/15/2010
Authors: Bert W Rust, Dianne M O'Leary, Katharine M Mullen
Abstract: Type Ia supernova light curves are characterized by a rapid rise from zero luminosity to a peak value, followed by a slower quasi-exponential decline. The rise and peak last for a few days, while the decline persists for many months. It is widely b ...

89. Multiresolution Representation of Urban Terrain By L^1^ Splines, L^2^ Splines, and Piecewise Planar Surfaces
Topic: Modeling
Published: 12/11/2000
Authors: J E Lavery, David E. Gilsinn
Abstract: Cubic L^d1^ and L^d2^ interpolating splines based on C^u1^ smooth piecewise cubic Sibson elements on a tensor-product grid are investigated. Computational tests were carried out for a 102.4 km area of Fort Hood, Texas represented by a 1025 x 1025 set ...

90. Multiscale Model of Germanium Quantum Dots in Silicon
Topic: Modeling
Published: 3/1/2007
Authors: David Thomas Read, Vinod K Tewary
Abstract: Atomic displacements, strains and strain energies in the neighborhood of near-spherical, coherent germanium ¿quantum dots¿ (QD) in crystalline silicon and near a {001} Si surface have been predicted by multiscale modeling, using a combination of clas ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series