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Displaying records 51 to 60 of 64 records.
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51. Scanning Probe Microscopy for Dielectric and Metal Characterization
Topic: Product Data
Published: 6/10/2008
Authors: Joseph J Kopanski, Thomas R Walker
Abstract: The properties of both insulators and metals can be characterized capacitively with scanning probe microscopy, though the techniques employed are different. Intermittent contact scanning capacitance microscopy (IC-SCM) is a useful technique for chara ...

52. Some Standards Updates
Topic: Product Data
Published: 5/1/1997
Author: Curtis H. Parks

53. Sustaining Engineering Informatics: Toward Methods and Metrics for Digital Curation
Topic: Product Data
Published: 9/1/2007
Authors: Joshua Lubell, Eswaran Subrahmanian, Mahesh Mani, Rachuri Rachuri
Abstract: Ensuring the long-term usability of engineering informatics (EI) artifacts is a challenge, particularly for products with longer life cycles than the computing hardware and software used for their design and manufacture. Addressing this challenge req ...

54. System Builders Manual for Version 2.1.5 of the NIST DMIS Test Suite
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7610
Topic: Product Data
Published: 8/19/2009
Authors: Thomas Rollin Kramer, John A Horst
Abstract: This is a system builders manual for the NIST DMIS Test Suite, version 2.1.5. The purpose of the manual is to help system builders use software provided in the test suite for building systems that implement DMIS (the Dimensional Measuring Interface S ...

Topic: Product Data
Published: 4/27/2008
Authors: Jason P Campbell, Kin P Cheung, John S Suehle
Abstract: Recent 'NBTI' studies have come to involve very high electric fields, yet these same studies are used to criticize the lower field 'NBTI' models. This study examines both high- and low-field degradation phenomena by monitoring the initial threshold v ...

56. The Role of Standards in Vacuum Electronics
Topic: Product Data
Published: 6/1/1994
Author: Michael McLay

57. Theory and Algorithms for L1 Fitting Used for Planar Datum Establishment in Support of Tolerancing Standards
Topic: Product Data
Published: 10/15/2013
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: We present the theory and algorithms for establishing a datum plane consistent with ASME Y14.5 standard definitions corresponding to a planar datum feature sampled with coordinate data that is weighted,. The method uses a one-sided minimization searc ...

58. Toward an Integrated Decision Support Framework for Sustainability CAE
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7909
Topic: Product Data
Published: 4/22/2013
Authors: Lalit Patil, Lakshmi Srinivas, Krishna Murthy, Debasish Dutta, Rachuri Rachuri
Abstract: Sustainability evaluation is typically conducted after the product is completely designed. However, sustainability, like cost and weight, needs to be managed on a continuous basis, throughout the product development cycle. This requires a decisio ...

59. Understanding EuP and REACH
Topic: Product Data
Published: 6/10/2008
Authors: John V Messina, Eric D Simmon
Abstract: There has been a world-wide trend towards legislation meant to encourage sustainable manufacturing and minimize the environmental impact of product manufacturing. In the global economy, with its distributed supply chain, local environmental laws may ...

60. Understanding the IPC 175X Data Model
Topic: Product Data
Published: 5/1/2008
Authors: Eric D Simmon, John V Messina
Abstract: More and more political bodies (countries, states, and unions) are enacting legislation designed to protect the environment from the impact of manufacturing. One category of restrictive legislation is called Extended Producer Responsibilities (EPR). ...

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