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Topic Area: Product Data

Displaying records 21 to 30 of 62 records.
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21. User's Guide for the Quality of Design Testing Tool and the Content Checker
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7538
Topic: Product Data
Published: 11/5/2008
Authors: Katherine C Morris, Simon Paul Frechette, Puja Goyal, Joshua Lubell, Boonserm Kulvatunyou, Salifou Sidi Malick, Nicolas Brayard, Severin Tixier
Abstract: This document describes the operation and usage of the Quality of Design and the Content Checker Testing Tools. These tools were developed at the National Institute of Standards and Technology (NIST) to support people in developing standards for the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824715

22. Scanning Probe Microscopy for Dielectric and Metal Characterization
Topic: Product Data
Published: 6/10/2008
Authors: Joseph J Kopanski, Thomas R Walker
Abstract: The properties of both insulators and metals can be characterized capacitively with scanning probe microscopy, though the techniques employed are different. Intermittent contact scanning capacitance microscopy (IC-SCM) is a useful technique for chara ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32949

23. Understanding EuP and REACH
Topic: Product Data
Published: 6/10/2008
Authors: John V Messina, Eric D Simmon
Abstract: There has been a world-wide trend towards legislation meant to encourage sustainable manufacturing and minimize the environmental impact of product manufacturing. In the global economy, with its distributed supply chain, local environmental laws may ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32845

24. Understanding the IPC 175X Data Model
Topic: Product Data
Published: 5/1/2008
Authors: Eric D Simmon, John V Messina
Abstract: More and more political bodies (countries, states, and unions) are enacting legislation designed to protect the environment from the impact of manufacturing. One category of restrictive legislation is called Extended Producer Responsibilities (EPR). ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32849

25. THE FAST INITIAL THRESHOLD VOLTAGE SHIFT: NBTI OR HIGH-FIELD STRESS
Topic: Product Data
Published: 4/27/2008
Authors: Jason P Campbell, Kin P Cheung, John S Suehle
Abstract: Recent 'NBTI' studies have come to involve very high electric fields, yet these same studies are used to criticize the lower field 'NBTI' models. This study examines both high- and low-field degradation phenomena by monitoring the initial threshold v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32954

26. Information management for Environmental Concerns
Topic: Product Data
Published: 2/8/2008
Authors: Eric D Simmon, John V Messina, Kevin G Brady
Abstract: Around the world there is a growing awareness that the environmental impact from manufacturing needs to be minimized. Concerns about issues from toxic materials ending up in landfills to manufacturing process chelmicals causing health problems are ca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32935

27. Sustaining Engineering Informatics: Toward Methods and Metrics for Digital Curation
Topic: Product Data
Published: 9/1/2007
Authors: Joshua Lubell, Eswaran Subrahmanian, Mahesh M. Mani, Rachuri Rachuri
Abstract: Ensuring the long-term usability of engineering informatics (EI) artifacts is a challenge, particularly for products with longer life cycles than the computing hardware and software used for their design and manufacture. Addressing this challenge req ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822746

28. Collaborative Augmented Reality for Better Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7441
Topic: Product Data
Published: 8/15/2007
Authors: Matthew L Aronoff, John V Messina
Abstract: Concurrent engineering depends on clear communication between all members of the development process. As that communication becomes more and more complex -- including not only textual descriptions, but CAD models, diagnostic data, process control dat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32632

29. Advancing Problem Definition and Concept Generation for Improved Product Life Cycle Management
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7430
Topic: Product Data
Published: 7/1/2007
Authors: Eswaran Subrahmanian, Yoram Reich
Abstract: Large engineering projects have become the norm with new additional requirements arising from the point of view of life cycle management of the product. Traditional methods for generating requirements and concept generation often have not taken into ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822328

30. An Ontology for Assembly Representation
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7436
Topic: Product Data
Published: 7/1/2007
Authors: Xenia Fiorentini, Iacopo Gambino, V.C. Liang, Sebti Foufou, Rachuri Rachuri, Mahesh M. Mani, Conrad E Bock
Abstract: Mechanical assemblies are systems composed of modules that are either subassemblies or parts. Traditionally an assembly information model contains information regarding parts, their relationships, and its form. But it is important that the model also ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822740



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