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Topic Area: Metrology
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Displaying records 821 to 830 of 851 records.
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821. User's Manual for the Program MONEL-I: Monte Carlo Simulation of SEM Signals for Linewidth Metrology
Series: Technical Note (NIST TN)
Report Number: 400
Topic: Metrology
Published: 1/1/1995
Authors: J R. Lowney, Egon Marx
Abstract: This user's manual is a guide to the FORTRAN code MONSEL-I which is a Monte Carlo simulation of the transmitted and backscattered electron signals in a scanning electron microscope (SEM) associated with a line specimen with a trapezoidal cross sectio ...

822. Users Manual for Version 2.1.5 of the NIST DMIS Test Suite (for DMIS 5.1)
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7603
Topic: Metrology
Published: 8/19/2009
Authors: Thomas Rollin Kramer, John A Horst
Abstract: The NIST DMIS Test Suite, version 2.1.5, is described. The test suite is intended to serve two purposes, 1) to help users and vendors use version 5.1 of DMIS (the Dimensional Measuring Interface Standard) and 2) to provide utilities and test files fo ...

823. Users Manual for Version 2.2.1 of the NIST DMIS Test Suite
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7735
Topic: Metrology
Published: 10/25/2010
Authors: Thomas Rollin Kramer, John A Horst
Abstract: This manual is a users manual for the NIST DMIS Test Suite, version 2.2.1. DMIS (Dimensional Measuring Interface Standard) is a language for writing programs for coordinate measuring machines and other dimensional measurement equipment. The manual d ...

824. Using Helium as a Standard of Refractive Index: Correcting Errors in a Gas Refractometer
Topic: Metrology
Published: 6/1/2004
Authors: Jack A Stone Jr, Alois Stejskal
Abstract: The refractive index of helium at atmospheric pressure can be determined from ab initio calculations in combination with careful pressure and temperature measurements. Therefore helium can serve as a theory-based standard of refractive index; it migh ...

825. Using a Potentiostat to Model In-Process Electromechanical Dressing
Topic: Metrology
Published: 1/1/1996
Authors: Robert S. Polvani, A Fraker, Christopher J. Evans
Abstract: In-process electrochemical dressing insures true, sharp, stable wheels for efficient ceramic grinding. To better implement electrochemical dressing, we couple laboratory studies based on a potentiostat with shop floor grinding runs. To do this, a cal ...

826. Using uncalibrated lasers as wavelength standards
Topic: Metrology
Published: 10/1/2008
Author: Jack A Stone Jr
Abstract: The fundamental atomic physics of a gas laser transition is such that the transition frequency, or equivalently, the vacuum wavelength of the laser, cannot vary from its central value by more than a few parts in 106. The uncertainty of the gas laser ...

827. Variable Pressure/Environmental SEM a Powerful Tool for Nanotechnology and Nanomanufacturing
Topic: Metrology
Published: 1/1/2005
Authors: Michael T Postek, Andras Vladar
Abstract: Instrumentation and metrology are integral to the emerging nanotechnology enterprise, and have been identified by the U. S. National Nanotechnology Initiative (NNI) as one of a number of critical nanotechnology areas. Instrumentation and metrology cr ...

828. Variations in Size Measurements by Indicating Gaging Systems
Topic: Metrology
Published: 1/1/1994
Authors: Ralph C. Veale, A Strang, S Merrit, H Chou
Abstract: The National Institute of Standards and Technology has investigated the efficacy of indicating gaging systems used to measure pitch diameter and functional size of threaded fasteners. Three external systems and four internal systems, representing fou ...

829. Verifying Measurement Uncertainty Using a Control Chart With Dynamic Control Limits
Topic: Metrology
Published: 9/1/2007
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A control chart with dynamic control limit is proposed for promoting the developing process of an uncertainty budget, and verifying the developed measurement uncertainty. The up and low dynamic control limit, 2 sd, is calculated from the updated ...

830. Verifying Measurement Uncertainty Using a Control Chart With Dynamic Control Limits
Topic: Metrology
Published: 1/1/2007
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: We propose a control chart with dynamic control limits that promotes the process of developing and refining an uncertainty budget and verifying the measurement uncertainty. The upper and lower dynamic control limits, µ +2s and µ - 2s, are ...

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