NIST logo

Publications Portal

You searched on:
Topic Area: Metrology
Sorted by: title

Displaying records 821 to 830 of 855 records.
Resort by: Date / Title


821. Update on DMIS Certification
Topic: Metrology
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. Th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903180

822. Updated NIST Photomask Linewidth Standard
Topic: Metrology
Published: 1/1/2003
Authors: James Edward Potzick, J Pedulla, Michael T. Stocker
Abstract: NIST is preparing to issue the next generation in its line of binary photomask linewidth standards. Called SRM 2059, it was developed for calibrating microscopes used to measure linewidths on photomasks, and consists of antireflecting chrome line and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821970

823. Updated NIST Photomask Linewidth Standard
Topic: Metrology
Published: 5/1/2003
Authors: J Pedulla, James Edward Potzick, Michael T. Stocker
Abstract: NIST is preparing to issue the next generation in its line of binary photomask linewidth standards. Called SRM 2059, it was developed for calibrating microscopes used to measure linewidths on photomasks, and consists of antireflecting chrome line and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822399

824. User Manual for the Interim Testing Artifact for CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5602
Topic: Metrology
Published: 2/1/1995
Authors: Amy Singer, J Land, Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, Gregory W Caskey, et al
Abstract: The Interim Testing Artifact (ITA) is designed to quickly test CMMs for performance problems so that they can be repaired before significant numbers of good parts are erroneously rejected (or bad parts accepted) by the CMM. Frequent testing using the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820767

825. User's Manual for the Program MONEL-I: Monte Carlo Simulation of SEM Signals for Linewidth Metrology
Series: Technical Note (NIST TN)
Report Number: 400
Topic: Metrology
Published: 1/1/1995
Authors: J R. Lowney, Egon Marx
Abstract: This user's manual is a guide to the FORTRAN code MONSEL-I which is a Monte Carlo simulation of the transmitted and backscattered electron signals in a scanning electron microscope (SEM) associated with a line specimen with a trapezoidal cross sectio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820688

826. Users Manual for Version 2.1.5 of the NIST DMIS Test Suite (for DMIS 5.1)
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7603
Topic: Metrology
Published: 8/19/2009
Authors: Thomas Rollin Kramer, John A Horst
Abstract: The NIST DMIS Test Suite, version 2.1.5, is described. The test suite is intended to serve two purposes, 1) to help users and vendors use version 5.1 of DMIS (the Dimensional Measuring Interface Standard) and 2) to provide utilities and test files fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903026

827. Users Manual for Version 2.2.1 of the NIST DMIS Test Suite
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7735
Topic: Metrology
Published: 10/25/2010
Authors: Thomas Rollin Kramer, John A Horst
Abstract: This manual is a users manual for the NIST DMIS Test Suite, version 2.2.1. DMIS (Dimensional Measuring Interface Standard) is a language for writing programs for coordinate measuring machines and other dimensional measurement equipment. The manual d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905756

828. Using Helium as a Standard of Refractive Index: Correcting Errors in a Gas Refractometer
Topic: Metrology
Published: 6/1/2004
Authors: Jack A Stone Jr, Alois Stejskal
Abstract: The refractive index of helium at atmospheric pressure can be determined from ab initio calculations in combination with careful pressure and temperature measurements. Therefore helium can serve as a theory-based standard of refractive index; it migh ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823173

829. Using a Potentiostat to Model In-Process Electromechanical Dressing
Topic: Metrology
Published: 1/1/1996
Authors: Robert S. Polvani, A Fraker, Christopher J. Evans
Abstract: In-process electrochemical dressing insures true, sharp, stable wheels for efficient ceramic grinding. To better implement electrochemical dressing, we couple laboratory studies based on a potentiostat with shop floor grinding runs. To do this, a cal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820804

830. Using uncalibrated lasers as wavelength standards
Topic: Metrology
Published: 10/1/2008
Author: Jack A Stone Jr
Abstract: The fundamental atomic physics of a gas laser transition is such that the transition frequency, or equivalently, the vacuum wavelength of the laser, cannot vary from its central value by more than a few parts in 106. The uncertainty of the gas laser ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900948



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series