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Topic Area: Metrology

Displaying records 51 to 60 of 851 records.
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51. Methodology for imaging of nano-to-microscale water condensation dynamics on complex nanostructures
Topic: Metrology
Published: 6/11/2011
Authors: Konrad Rykaczewski, John Henry j Scott
Abstract: By transferring of a small part of a macroscale sample to a novel thermally insulated sample platform we are able to mitigate flooding and electron heating problems typically associated with Environmental Scanning Electron Microscopy imaging of water ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908396

52. Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment
Topic: Metrology
Published: 3/8/2011
Authors: Ndubuisi George Orji, Ronald G Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
Abstract: A key requirement for nano-manufacturing is maintaining acceptable traceability of measurements performed to determine size. Given that properties and functionality at the nanoscale are governed by absolute size, maintaining the traceability of dimen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906853

53. Mixed Pallet Stacking: An Overview and Summary of the 2010 PerMIS Special Session
Topic: Metrology
Published: 2/4/2011
Authors: Stephen B. Balakirsky, Henrik I. Christensen, Thomas Rollin Kramer, Pushkar Kolhe, Frederick M Proctor
Abstract: Stacking boxes of various sizes and contents on pallets (i.e. making mixed pallets) is a primary method of preparing goods for shipment from a warehouse to a store or other distant site. A special session of the 2010 PERMIS workshop was held to exami ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907419

54. Present Estimates of the Differences Between Thermodynamic Temperatures and the ITS-90
Topic: Metrology
Published: 1/29/2011
Authors: Joachim Fischer, M. DePodesta, K. D. Hill, Michael R Moldover, Laurent Pitre, R. Rusby, Peter Steur, Osamu Tamura, R. White, L. Wolber
Abstract: In 2005, the Consultative Committee for Thermometry (CCT) recommended the creation of a Mise en pratique for the definition of the kelvin and envisioned that future versions of the Mise en pratique would recommend values of the differences between ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905075

55. On Modeling the Peak Temperature on the Tool-Chip Interface during High-Speed Machining of AISI 1045 Steel
Topic: Metrology
Published: 12/8/2010
Authors: Timothy J Burns, Steven P Mates, Richard L. Rhorer, Eric Paul Whitenton, Debasis Basak
Abstract: New experimental data on AISI 1045 steel from the NIST pulse-heated Kolsky Bar Laboratory is presented. The material is shown to exhibit a stiffer response to compressive loading when it has been rapidly preheated than it does when it has been heated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907309

56. Inexpensive Ground Truth and Performance Evaluation for Human Tracking using multiple Laser Measurement Sensors
Topic: Metrology
Published: 10/27/2010
Authors: William P Shackleford, Tsai Hong Hong, Tommy Chang
Abstract: This paper will describe a flexible and inexpensive method of obtaining ground truth for the evaluation of Human Tracking systems. It is expected to be appropriate for evaluating systems used to allow robots and/or autonomous vehicles to operate safe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906630

57. Maintainers Manual for Version 2.2.1 of the NIST DMIS Test Suite
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7720
Topic: Metrology
Published: 10/25/2010
Authors: Thomas Rollin Kramer, John A Horst
Abstract: This manual is a maintainers manual for the NIST DMIS Test Suite, version 2.2.1. DMIS (Dimensional Measuring Interface Standard) is a language for writing programs for coordinate measuring machines and other dimensional measurement equipment. The ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905759

58. Performance Assessment of Face Recognition Using Super-Resolution
Topic: Metrology
Published: 10/25/2010
Authors: Shuowen Hu, Robert Maschal, S. Susan Young, Tsai Hong Hong, P Jonathon Phillips
Abstract: Recognition rate of face recognition algorithms is dependent on the resolution of the imagery, specifically the number of pixels contained within the face. Using a sequence of frames from low-resolution videos, super-resolution reconstruction can fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906932

59. System Builders Manual for Version 2.2.1 of the NIST DMIS Test Suite
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7715
Topic: Metrology
Published: 10/25/2010
Authors: Thomas Rollin Kramer, John A Horst
Abstract: This manual is a system builders manual for the NIST DMIS Test Suite, version 2.2.1. DMIS (Dimensional Measuring Interface Standard) is a language for writing programs for coordinate measuring machines and other dimensional measurement equipment. Th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905758

60. Users Manual for Version 2.2.1 of the NIST DMIS Test Suite
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7735
Topic: Metrology
Published: 10/25/2010
Authors: Thomas Rollin Kramer, John A Horst
Abstract: This manual is a users manual for the NIST DMIS Test Suite, version 2.2.1. DMIS (Dimensional Measuring Interface Standard) is a language for writing programs for coordinate measuring machines and other dimensional measurement equipment. The manual d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905756



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