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You searched on: Topic Area: Software Testing Metrics Sorted by: title

Displaying records 11 to 20 of 30 records.
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11. Foreword to Information Modeling for Interoperable Dimensional Metrology
Topic: Software Testing Metrics
Published: 12/30/2011
Author: John A Horst
Abstract: The value of information exchange standards development is described and defended against other data exchange interoperability options in the context of dimensional metrology in manufacturing.

12. Guide to Contracting for Software Conversion Services
Series: Special Publication (NIST SP)
Report Number: 500-90
Topic: Software Testing Metrics
Published: 5/1/1982
Author: Mark Skall

13. Introducing Combinatorial Testing in a Large Organization: Pilot Project Experience Report
Topic: Software Testing Metrics
Published: 4/1/2014
Authors: Jon Hagar, David R Kuhn, Raghu N Kacker, Thomas Wissink
Abstract: This poster gives an overview of the experience of eight pilot projects, over two years, applying combinatorial testing in a large aerospace organization. While results varied across the different pilot projects, overall it was estimated that CT wou ...

14. Maintainers Manual for Version 2.2.1 of the NIST DMIS Test Suite
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7720
Topic: Software Testing Metrics
Published: 10/25/2010
Authors: Thomas Rollin Kramer, John A Horst
Abstract: This manual is a maintainers manual for the NIST DMIS Test Suite, version 2.2.1. DMIS (Dimensional Measuring Interface Standard) is a language for writing programs for coordinate measuring machines and other dimensional measurement equipment. The ma ...

15. Metrics for the Cost of Proprietary Information Exchange Languages in Intelligent Systems
Topic: Software Testing Metrics
Published: 1/31/2011
Authors: John A Horst, Nathan W. Hartman, George Wong
Abstract: The increasing number of intelligent software components is accompanied by an increase of proprietary information exchange languages between components. One of the challenges for the smart technology worker is to achieve intelligent system component ...

16. Pseudo-Exhaustive Testing for Software
Topic: Software Testing Metrics
Published: 4/28/2006
Authors: David R Kuhn, Vadim Okun
Abstract: Pseudo-exhaustive testing uses the empirical observation that, for broad classes of software, a fault is likely triggered by only a few variables interacting. The method takes advantage of two relatively recent advances in software engineering: algor ...

17. Research Directions in Security Metrics
Topic: Software Testing Metrics
Published: 4/4/2011
Author: Wayne Jansen
Abstract: More than 100 years ago, Lord Kelvin observed that measurement is vital to deep knowledge and understanding in physical science. During the last few decades, researchers have made various attempts to develop measures and systems of measurement for co ...

18. SARD: A Software Assurance Reference Dataset
Topic: Software Testing Metrics
Published: Date unknown
Author: Paul E Black
Abstract: Software assurance tools examine code for problems. To test such tools, we need programs with known bugs as ground truth. The Software Assurance Reference Dataset (SARD) is a publicly accessible collection of over 100,000 test cases in different prog ...

19. SATE V Ockham Sound Analysis Criteria
Topic: Software Testing Metrics
Published: 3/14/2014
Author: Paul E Black

20. SATE V Ockham Sound Analysis Criteria
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 8113
Topic: Software Testing Metrics
Published: 3/22/2016
Authors: Paul E Black, Athos Ribeiro
Abstract: Static analyzers examine the source or executable code of programs to find problems. Many static analyzers use some heuristics or approximations to handle programs up to millions of lines of codes. We established the Ockham Sound Analysis Criteria ...

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Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series