NIST logo

Publications Portal

You searched on:
Topic Area: Scientific Computing
Sorted by: title

Displaying records 1 to 10 of 43 records.
Resort by: Date / Title

1. "Just Try"
Topic: Scientific Computing
Published: 11/1/2011
Author: Isabel M Beichl

2. A Bayesian Quantitative Nondestructive Evaluation (QNDE) Approach to Estimating Remaining Life of Aging Pressure Vessels and Piping
Topic: Scientific Computing
Published: 1/1/2013
Authors: Jeffrey T Fong, William F Guthrie, James J Filliben, Nathanael A Heckert
Abstract: In this paper, we use a Bayesian quantitative nondestructive evaluation (QNDE) approach to estimating the remaining life of aging structures and components. Our approach depends on in-situ NDE measurements of detectable crack lengths and crack g ...

3. A Hybrid CPU-GPU Approach to Fourier-Based Image Stitching of Optical Microscopy Images
Topic: Scientific Computing
Published: 3/3/2013
Authors: Walid Keyrouz, Timothy J Blattner, Bertrand Clement Stivalet, Joe Chalfoun, Mary C Brady, Shujia Zhou
Abstract: We present a hybrid CPU-GPU approach for the Fourier-based stitching of optical microscopy images. This system achieves sub-minute stitching rates with large grids; it stitches a grid of 59x42 tiles in 26 seconds on a two-CPU (8 physical cores) & two ...

4. A Hybrid CPU-GPU System for Fourier-Based Stitching of Optical Microscopy Images
Topic: Scientific Computing
Published: 3/15/2013
Authors: Walid Keyrouz, Bertrand Clement Stivalet, Timothy J Blattner, Shujia Zhou, Joe Chalfoun, Mary C Brady
Abstract: We present a high performance hybrid CPU-GPU implementation that accelerates the Fourier-based stitching of 2D optical microscopy images to less than 1-minute (end-to-end execution times). This implementation takes advantage of coarse-grained parall ...

5. An Evaluation of Local Shape Descriptors for 3D Shape Retrieval
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7812
Topic: Scientific Computing
Published: 3/8/2012
Author: Sarah Y. Tang
Abstract: As the usage of 3D models increases, so does the importance of developing accurate 3D shape retrieval algorithms. Most prominently, shape descriptors are used to describe the geometric and topological properties of objects and compared to determine t ...

6. Analysis for Dynamic Metrology
Topic: Scientific Computing
Published: 1/30/2014
Authors: Andrew M Dienstfrey, Paul D Hale
Abstract: Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may b ...

7. Artificial Intelligence Tools for Failure Event Data Management and Probability Risk Analysis for Failure Prevention
Topic: Scientific Computing
Published: 10/25/2009
Authors: Jeffrey T Fong, Pedro Vincente Marcal
Abstract: Over the last thirty years, much research has been done on the development of failure event databases and fatigue modeling of crack growth in pressure vessels and piping. According to a USNRC report (NUREG/CR6674, 2000), results of a fatigue crack g ...

8. Ave Atque Vale
Topic: Scientific Computing
Published: 11/1/2012
Author: Isabel M Beichl

9. Conformance of Image Features to Classifier Assumptions
Topic: Scientific Computing
Published: 7/27/2012
Authors: Julien Marc Amelot, Peter Bajcsy, Mary C Brady
Abstract: Cell measurements are derived frequently from the results of pixel classification and contiguous region segmentation of microscopy images. Image segmentation is accomplished by classifying image pixels based on high dimensional image features com ...

10. Cut it out!
Topic: Scientific Computing
Published: 5/1/2009
Authors: Isabel M Beichl, Francis Sullivan
Abstract: This is a tutorial article on a probabilistic method for finding minimum cut sets of a connected graph.

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series