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Topic Area: Conformance Testing

Displaying records 71 to 80 of 147 records.
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71. An Overview of the Common Criteria Evaluation and Validation Scheme
Series: ITL Bulletin
Topic: Conformance Testing
Published: 10/1/2000
Author: Patricia R Toth
Abstract: This ITL Bulletin describes the Common Criteria Evaluation and Validation Sceheme.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151220

72. Pulse Transition Duration Measurements and Standards at NIST -- 1975 to 1988
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6550
Topic: Conformance Testing
Published: 8/1/2000
Authors: W L Gans, N. S. Nahman, J R Andrews, E E Baldwin
Abstract: The techniques employed by NBS from the mid 70s through 1988 for the calibration of the pulse transition duration (TD) of a fast, step-like, electrical pulse generator are described along with the artifact requirements imposed on the pulse generator. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21825

73. Guidelines to Federal Organizations on Security Assurance and Acquisition/Use of Tested/Evaluated Products
Series: Special Publication (NIST SP)
Report Number: 800-23
Topic: Conformance Testing
Published: 8/1/2000
Author: E Roback
Abstract: Computer security assurance provides a basis for one to have confidence that security measures, both technical and operational, work as intended. Use of products with an appropriate degree of assurance contributes to security and assurance of the sys ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151229

74. Internet-Based Calibration of a Multifunction Calibrator
Topic: Conformance Testing
Published: 7/1/2000
Authors: L. B. Baca, L. Duda, R. J. Walker, Nile M. Oldham, Mark E. Parker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16181

75. SIMnet: An Internet-Based Video Conferencing System Supporting Metrology
Topic: Conformance Testing
Published: 7/1/2000
Authors: William E Anderson, Nile M. Oldham, Mark E. Parker
Abstract: SIMnet is a computer network implemented in 1999 to facilitate international comparisons, and foster collaborations between national metrology laboratories in the Americas. The system employs standard hardware and a special network server to allow au ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20105

76. Temperature Effects on the High Speed Response of Digitizing Sampling Oscilloscopes
Topic: Conformance Testing
Published: 7/1/2000
Authors: Donald R Larson, Nicholas G Paulter Jr
Abstract: We describe the effects of temperature on the performance of 20 GHz and 50 GHz digital sampling oscilloscopes and high speed pulse generators. The temperature of the sampling heads is varied through the manufacturer's specified minimum operating tem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18414

77. Time-Base Setting Dependence of Pulse Parameters Using High-bandwidth Digital Sampling Oscilloscopes
Topic: Conformance Testing
Published: 7/1/2000
Authors: Nicholas G Paulter Jr, Donald R Larson
Abstract: Errors in the time-base of digital sampling oscilloscopes (samplers) will cause errors in the reported pulse parameters of the sampler-acquired waveforms and will also contribute to the uncertainty estimate for these parameters. We present the resul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25408

78. Application of Neural Networks in the Development of Nonlinear Error Modeling and Test Point Prediction
Topic: Conformance Testing
Published: 5/1/2000
Authors: X. Han, Gerard Nordeen Stenbakken, F. J. Von Zuben, Hans Engler
Abstract: This paper explores the neural network approach for empirical nonlinear error modeling. For systems that have a significant amount of nonlinearity, nonlinear error models require fewer parameters compared to linear models and require fewer test point ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7751

79. The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method
Topic: Conformance Testing
Published: 5/1/2000
Authors: Donald R Larson, Nicholas G Paulter Jr
Abstract: The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset voltage. The amplitude is almost linear for offset voltages from -500 mV to 500 mV except ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5695

80. Modes of Operation Validation System for the Triple Data Encryption Algorithm (TMOVS): Requirements and Procedures
Series: Special Publication (NIST SP)
Report Number: 800-20
Topic: Conformance Testing
Published: 10/29/1999
Author: Sharon Staley Keller
Abstract: The National Institute of Standards and Technology (NIST) Modes of Operation Validation System for the Triple Data Encryption Algorithm (TMOVS) specifies the procedures involved in validating implementations of the Triple DES algorithm in ANSI X9.52 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151204



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