NIST logo

Publications Portal

You searched on:
Topic Area: Conformance Testing

Displaying records 71 to 80 of 144 records.
Resort by: Date / Title

71. An Overview of the Common Criteria Evaluation and Validation Scheme
Series: ITL Bulletin
Topic: Conformance Testing
Published: 10/1/2000
Author: Patricia R Toth
Abstract: This ITL Bulletin describes the Common Criteria Evaluation and Validation Sceheme.

72. Pulse Transition Duration Measurements and Standards at NIST -- 1975 to 1988
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6550
Topic: Conformance Testing
Published: 8/1/2000
Authors: W L Gans, N. S. Nahman, J R Andrews, E E Baldwin
Abstract: The techniques employed by NBS from the mid 70s through 1988 for the calibration of the pulse transition duration (TD) of a fast, step-like, electrical pulse generator are described along with the artifact requirements imposed on the pulse generator. ...

73. Internet-Based Calibration of a Multifunction Calibrator
Topic: Conformance Testing
Published: 7/1/2000
Authors: L. B. Baca, L. Duda, R. J. Walker, Nile M. Oldham, Mark E. Parker

74. SIMnet: An Internet-Based Video Conferencing System Supporting Metrology
Topic: Conformance Testing
Published: 7/1/2000
Authors: William E Anderson, Nile M. Oldham, Mark E. Parker
Abstract: SIMnet is a computer network implemented in 1999 to facilitate international comparisons, and foster collaborations between national metrology laboratories in the Americas. The system employs standard hardware and a special network server to allow au ...

75. Temperature Effects on the High Speed Response of Digitizing Sampling Oscilloscopes
Topic: Conformance Testing
Published: 7/1/2000
Authors: Donald R Larson, Nicholas G Paulter Jr
Abstract: We describe the effects of temperature on the performance of 20 GHz and 50 GHz digital sampling oscilloscopes and high speed pulse generators. The temperature of the sampling heads is varied through the manufacturer's specified minimum operating tem ...

76. Time-Base Setting Dependence of Pulse Parameters Using High-bandwidth Digital Sampling Oscilloscopes
Topic: Conformance Testing
Published: 7/1/2000
Authors: Nicholas G Paulter Jr, Donald R Larson
Abstract: Errors in the time-base of digital sampling oscilloscopes (samplers) will cause errors in the reported pulse parameters of the sampler-acquired waveforms and will also contribute to the uncertainty estimate for these parameters. We present the resul ...

77. Application of Neural Networks in the Development of Nonlinear Error Modeling and Test Point Prediction
Topic: Conformance Testing
Published: 5/1/2000
Authors: X. Han, Gerard Nordeen Stenbakken, F. J. Von Zuben, Hans Engler
Abstract: This paper explores the neural network approach for empirical nonlinear error modeling. For systems that have a significant amount of nonlinearity, nonlinear error models require fewer parameters compared to linear models and require fewer test point ...

78. The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method
Topic: Conformance Testing
Published: 5/1/2000
Authors: Donald R Larson, Nicholas G Paulter Jr
Abstract: The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset voltage. The amplitude is almost linear for offset voltages from -500 mV to 500 mV except ...

79. Software to Optimize the Testing of Mixed-Signal Devices
Topic: Conformance Testing
Published: 6/1/1999
Authors: Gerard Nordeen Stenbakken, Andrew David Koffman, T. Michael Souders
Abstract: New software is now available to help test and measurement engineers optimize the testing of complex electronic devices. Examples of products that are benefiting from this software range from A/D and D/A converters to multi-range precision instrument ...

80. High-Dimensional Empirical Linear Prediction (HELP) Toolbox User's Guide, Version 2.2
Series: Technical Note (NIST TN)
Report Number: 1428
Topic: Conformance Testing
Published: 5/1/1999
Authors: Andrew David Koffman, T. Michael Souders, Gerard Nordeen Stenbakken, Hans Engler
Abstract: This user's guide will assist software users in the understanding of the theory and procedures underlying the High-dimensional Empirical Linear Prediction (HELP) Toolbox, developed for use with the MATLAB(r) mathematical software environment. The HE ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series