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Topic Area: Conformance Testing

Displaying records 71 to 80 of 135 records.
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71. High-Dimensional Empirical Linear Prediction (HELP) Toolbox User's Guide, Version 2.2
Series: Technical Note (NIST TN)
Report Number: 1428
Topic: Conformance Testing
Published: 5/1/1999
Authors: Andrew David Koffman, T. Michael Souders, Gerard Nordeen Stenbakken, Hans Engler
Abstract: This user's guide will assist software users in the understanding of the theory and procedures underlying the High-dimensional Empirical Linear Prediction (HELP) Toolbox, developed for use with the MATLAB(r) mathematical software environment. The HE ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14609

72. Internet-Based Test Service for Multifunction Calibrators
Topic: Conformance Testing
Published: 5/1/1999
Authors: Nile M. Oldham, Mark E. Parker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18278

73. SIMnet - a Collaborative Tool for Metrology in the Americas
Topic: Conformance Testing
Published: 5/1/1999
Authors: Piotr S. Filipski, Nile M. Oldham
Abstract: The use of video conferencing equipment used with the Internet to facilitate international comparisons and collaborations is described. The system employs standard hardware and software at a number of National Metrology Institutes within the America ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27378

74. The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic
Topic: Conformance Testing
Published: 5/1/1999
Authors: S. Avramov, Andrew David Koffman, Nile M. Oldham, Bryan C Waltrip
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18201

75. Uncertainty Analysis for Four Terminal-Pair Capacitance and Dissipation Factor Characterization at 1 MHz and 10 MHz
Topic: Conformance Testing
Published: 5/1/1999
Authors: Andrew David Koffman, S. Avramov, Bryan C Waltrip, Nile M. Oldham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5083

76. A Pulse Measurement Intercomparison
Topic: Conformance Testing
Published: 10/1/1998
Authors: T. Michael Souders, J R Andrews, A. Caravone, J. P. Deyst, C. Duff, S. Naboicheck
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=26535

77. The Effect of Histogram Size on Histogram-Derived Pulse Parameters
Topic: Conformance Testing
Published: 6/1/1998
Author: Nicholas G Paulter Jr
Abstract: The effects of the number of histogram bins on histogram-derived pulse parameters of step-like waveforms is examined. An empirical method for selecting the optimal number of bins is described.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20809

78. Criteria for United States Geological Survey (USGS) Recognizing Certificate Issuing Organizations: Functions and Requirements
Series: OTHER
Report Number: 6126
Topic: Conformance Testing
Published: 5/1/1998
Authors: W H. Dashiell, L Arnold Johnson, Lynne S. Rosenthal
Abstract: This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector Certification Issuing Organizations which provide conformance assessment for the SDTS/TV standard.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151636

79. Model for Test Method Executive Control Committee (TMECC) Organization and Procedures Part of United States Geological Survey Recognition of Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) Certification System
Series: OTHER
Report Number: 6125
Topic: Conformance Testing
Published: 5/1/1998
Authors: W H. Dashiell, L Arnold Johnson, Lynne S. Rosenthal
Abstract: This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector certification issuing organizations which provide conformance assessment for the SDTS/TV standard.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151635

80. Overview of Model for United States Geological Survey Recognition of Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) Certification System
Series: OTHER
Report Number: 6124
Topic: Conformance Testing
Published: 5/1/1998
Authors: W H. Dashiell, L Arnold Johnson, Lynne S. Rosenthal
Abstract: This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector certification issuing organizations which provide conformance assessment for the SDTS/TV standard.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151634