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Topic Area: Conformance Testing

Displaying records 91 to 100 of 143 records.
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91. Comparison of Time Base Nonlinearity Measurements Techniques
Topic: Conformance Testing
Published: 2/1/1998
Authors: Gerard Nordeen Stenbakken, J. P. Deyst
Abstract: Distortions in the timebases of equivalent-time oscilloscopes and digitizers cause distortions of waveforms sampled by them. This paper reports on a comparison of two methods of characterizing timebase distortion, using pure sine-wave inputs of know ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21398

92. 3 of Electronic Devices
Topic: Conformance Testing
Published: 1/1/1998
Authors: Hans Engler, T. Michael Souders, Gerard Nordeen Stenbakken
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20061

93. Timebase Distortion Measurements Using Multiphase Sinewaves
Topic: Conformance Testing
Published: 5/1/1997
Authors: Gerard Nordeen Stenbakken, J. P. Deyst
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13433

94. Empirical Linear Prediction Applied to a NIST Calibration Service
Topic: Conformance Testing
Published: 8/1/1996
Authors: Andrew David Koffman, T. Michael Souders, Gerard Nordeen Stenbakken, Thomas E Lipe, Joseph R. Mr. (Joseph R.) Kinard Jr.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28330

95. A Fast and Accurate Method for Measuring the Dielectric Constant of Printed Wiring Board Materials
Topic: Conformance Testing
Published: 7/1/1996
Author: Nicholas G Paulter Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17264

96. Uncertainties of Frequency Response Estimates Derived from Responses to Uncertain Step-Like Inputs
Topic: Conformance Testing
Published: 6/1/1996
Authors: J. P. Deyst, T. Michael Souders, Jerome J. Blair
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14544

97. Bounds on Frequency Response Estimates Derived from Uncertain Step Response Data
Topic: Conformance Testing
Published: 4/1/1996
Authors: J. P. Deyst, T. Michael Souders
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18092

98. Effects of Nonmodel Errors on Model-Based Testing
Topic: Conformance Testing
Published: 4/1/1996
Author: Gerard Nordeen Stenbakken
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21863

99. Binary Versus Decade Inductive Voltage Divider Comparison and Error Decomposition
Topic: Conformance Testing
Published: 8/1/1995
Authors: S. Avramov, Gerard Nordeen Stenbakken, Andrew David Koffman, Nile M. Oldham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24325

100. Effects of Nonmodel Errors on Model-Based Testing
Topic: Conformance Testing
Published: 4/1/1995
Author: Gerard Nordeen Stenbakken
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23215



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