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Topic Area: Conformance Testing

Displaying records 91 to 100 of 144 records.
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91. Experience Report: Comparing an Automated Conformance Test Development Approach with a Traditional Development Approach
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6114
Topic: Conformance Testing
Published: 4/1/1998
Authors: Alan Howard Goldfine, G E Fisher, Lynne S. Rosenthal

92. Comparison of Time Base Nonlinearity Measurements Techniques
Topic: Conformance Testing
Published: 2/1/1998
Authors: Gerard Nordeen Stenbakken, J. P. Deyst
Abstract: Distortions in the timebases of equivalent-time oscilloscopes and digitizers cause distortions of waveforms sampled by them. This paper reports on a comparison of two methods of characterizing timebase distortion, using pure sine-wave inputs of know ...

93. 3 of Electronic Devices
Topic: Conformance Testing
Published: 1/1/1998
Authors: Hans Engler, T. Michael Souders, Gerard Nordeen Stenbakken

94. Timebase Distortion Measurements Using Multiphase Sinewaves
Topic: Conformance Testing
Published: 5/1/1997
Authors: Gerard Nordeen Stenbakken, J. P. Deyst

95. Empirical Linear Prediction Applied to a NIST Calibration Service
Topic: Conformance Testing
Published: 8/1/1996
Authors: Andrew David Koffman, T. Michael Souders, Gerard Nordeen Stenbakken, Thomas E Lipe, Joseph R. Mr. (Joseph R.) Kinard Jr.

96. A Fast and Accurate Method for Measuring the Dielectric Constant of Printed Wiring Board Materials
Topic: Conformance Testing
Published: 7/1/1996
Author: Nicholas G Paulter Jr

97. Uncertainties of Frequency Response Estimates Derived from Responses to Uncertain Step-Like Inputs
Topic: Conformance Testing
Published: 6/1/1996
Authors: J. P. Deyst, T. Michael Souders, Jerome J. Blair

98. Bounds on Frequency Response Estimates Derived from Uncertain Step Response Data
Topic: Conformance Testing
Published: 4/1/1996
Authors: J. P. Deyst, T. Michael Souders

99. Effects of Nonmodel Errors on Model-Based Testing
Topic: Conformance Testing
Published: 4/1/1996
Author: Gerard Nordeen Stenbakken

100. Binary Versus Decade Inductive Voltage Divider Comparison and Error Decomposition
Topic: Conformance Testing
Published: 8/1/1995
Authors: S. Avramov, Gerard Nordeen Stenbakken, Andrew David Koffman, Nile M. Oldham

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series