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Topic Area: Semiconductors
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Displaying records 101 to 110 of 152 records.
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101. Optical illumination optimization for patterned defect inspection
Topic: Semiconductors
Published: 4/20/2011
Authors: Bryan M Barnes, Richard Quintanilha, Martin Y Sohn, Hui H. Zhou, Richard M Silver
Abstract: Rapidly decreasing critical dimensions (CD) for semiconductor devices drive the study of improved methods for the detection of defects within patterned areas. As reduced CDs are being achieved through directional patterning, additional constraints a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908276

102. Organic Electronics: Challenges and Opportunities
Topic: Semiconductors
Published: 3/31/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905389

103. Organic single crystal field-effect transistors of a soluble anthradithiophene
Topic: Semiconductors
Published: 10/22/2008
Authors: Oana Jurchescu, Sankar Subramanian, R J Kline, Steven D Hudson, John E Anthony, Thomas Jackson, David J Gundlach
Abstract: We use single crystals (grown by physical vapor transport) of a soluble oligomer to obtain a better understanding of the intrinsic properties, limitations and potential of these materials. Single crystals are well-suited for studies exploring the eff ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32830

104. Oxide Reliability of SiC MOS Devices
Topic: Semiconductors
Published: 10/12/2008
Authors: Liangchun Yu, Kin P Cheung, Jason P Campbell, John S Suehle, Kuang Sheng
Abstract: Silicon carbide possesses excellent material properties for high temperature, high frequency and high power applications. Among all the device structures, MOSFET has advantages such as low gate leakage current, easier device control etc., and therefo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900182

105. Performance Analysis of 10 kV, 100 A SiC Half-Bridge Power Modules
Topic: Semiconductors
Published: 3/3/2008
Author: Allen R Hefner Jr
Abstract: Abstract: The DARPA Wide Bandgap Semiconductor Technology (WBGS) High Power Electronics (HPE) Phase II program is developing high-voltage, high-frequency SiC device and package technology needed to meet the specific program objectives for a 13.8 kV, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32930

106. Photoemission Threshold Spectroscopy: MOS Band alignments
Topic: Semiconductors
Published: 4/7/2011
Author: Nhan V Nguyen
Abstract: In this talk I will 1) briefly review SED‰s history of the optical thin metrology project, 2) describe the principle of internal photoemission (IPE) and the applications to determine the band alignments of metal-oxide-semiconductor structures, an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908441

107. Physical Model for Random Telegraph Noise Amplitudes and Implications
Topic: Semiconductors
Published: 6/12/2012
Authors: Richard G. Southwick, Kin P Cheung, Jason P Campbell, Serghei Drozdov, Jason T Ryan, John S Suehle, Anthony Oates
Abstract: Random Telegraph Noise (RTN) has been shown to surpass random dopant fluctuations as a cause for decananometer device variability, through the measurement of a large number of ultra-scaled devices [1]. The most worrisome aspect of RTN is the tail of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911514

108. Physics Careers in Government Agencies
Topic: Semiconductors
Published: 3/14/2010
Author: David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905142

109. Planning Report 07-2: Economic Impact of Measurement in the Semiconductor Industry
Series: OTHER
Report Number: 07-2
Topic: Semiconductors
Published: 12/31/2007
Author: Gregory C. Tassey
Abstract: The semiconductor industry has long been a driving force behind major advances in computing and electronics. Advances in the speed of processing power have enabled individuals and companies to create, access, and analyze data rapidly, improving ind ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912236

110. Power Conditioning System Technologies for High-Megawatt Fuel Cell Plants
Topic: Semiconductors
Published: 8/7/2008
Author: Allen R Hefner Jr
Abstract: High-megawatt Power Conditioning Systems (PCSs) are required to convert the low-voltage produced by fuel cell modules in central station scale plants to the very much higher voltage levels required for delivery to the grid. As part of a NIST/DOE Inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902439



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