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Topic Area: Semiconductors
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Displaying records 21 to 30 of 150 records.
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21. ITRS Chapter: RF and A/MS Technologies
Topic: Semiconductors
Published: 1/12/2012
Authors: Herbert S Bennett, John J. Pekarik
Abstract: Radio frequency and analog/mixed-signal (RF and A/MS) technologies are essential and critical technologies for the rapidly diversifying semiconductor market that comprises many more applications than the wireless and wire-line communications mark ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909850

22. MEMS
Topic: Semiconductors
Published: 1/12/2012
Author: Michael Gaitan
Abstract: Micro-Electro-Mechanical Systems (MEMS) are devices that are fabricated using techniques similar to those used for integrated circuits (ICs) to create micrometer-sized mechanical structures (suspended bridges, cantilevers, membranes, fluid channels ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910072

23. Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Topic: Semiconductors
Published: 12/28/2011
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910545

24. More than Moore or More Moore: a SWOT analysis
Topic: Semiconductors
Published: 12/28/2011
Authors: Herbert S Bennett, G. Dan Hutcheson
Abstract: Over the last decade, the world of semiconductors has broadened its horizon from More Moore and beyond conventional scaling to More than Moore. Some first hypothesized the end of Moore‰s law and the beginning of a new era. They saw it as an OR gate w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909225

25. Impact of Electrolyte Deposition Technique on Resistive Pt/Ta2O5/Cu Switch Performance
Topic: Semiconductors
Published: 12/7/2011
Authors: Pragya Rasmi Shrestha, Adaku Ochia, Mohinee Verma, Yuhong Kang, Helmut Baumgart, Marius Orlowski
Abstract:
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910527

26. Spectroscopic charge pumping investigation of the amphoteric nature of Si/SiO2 interface states
Topic: Semiconductors
Published: 6/6/2011
Authors: Jason T Ryan, Liangchun Yu, Jae Han, Joseph J Kopanski, Kin P Cheung, Fei Zhang, Chen Wang, Jason P Campbell, John S Suehle
Abstract: The amphoteric nature of Si/SiO2 interface states in submicron sized metal-oxide-silicon-field-effect-transistors is observed using an enhanced spectroscopic charge pumping method. The method‰s simplicity and high sensitivity makes it a powerful too ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908429

27. Fabrication and characterization of silicon-based molecular electronic devices
Topic: Semiconductors
Published: 5/21/2011
Authors: Christina Ann Hacker, Michael A Walsh, Sujitra Jeanie Pookpanratana, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908433

28. Electrically Detected Magnetic Resonance in Dielectric Semiconductor Systems of Current Interest
Topic: Semiconductors
Published: 5/1/2011
Authors: P. M. Lenahan, Corey Cochrane, Jason P Campbell, Jason T Ryan
Abstract: Several electrically detected magnetic resonance techniques provide insight into the physical and chemical structure of technologically significant deep level defects in solid state electronics. Spin dependent recombination is sensitive to deep level ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909230

29. Investigation of SiO2/HfO2 stacks for flash memory applications
Topic: Semiconductors
Published: 4/28/2011
Authors: Nhan V Nguyen, Bashwar Chakrabarti
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908443

30. Optical illumination optimization for patterned defect inspection
Topic: Semiconductors
Published: 4/20/2011
Authors: Bryan M Barnes, Richard Quintanilha, Martin Y Sohn, Hui Zhou, Richard M Silver
Abstract: Rapidly decreasing critical dimensions (CD) for semiconductor devices drive the study of improved methods for the detection of defects within patterned areas. As reduced CDs are being achieved through directional patterning, additional constraints a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908276



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