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Topic Area: Semiconductors
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Displaying records 101 to 110 of 149 records.
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101. Planning Report 07-2: Economic Impact of Measurement in the Semiconductor Industry
Series: OTHER
Report Number: 07-2
Topic: Semiconductors
Published: 12/31/2007
Author: Gregory C. Tassey
Abstract: The semiconductor industry has long been a driving force behind major advances in computing and electronics. Advances in the speed of processing power have enabled individuals and companies to create, access, and analyze data rapidly, improving ind ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912236

102. Non Uniform Structural Degradation in Porous Organosilicate Films Exposed to Plasma, Etching and Ashing as Characterized by X-Ray Porosimetry
Topic: Semiconductors
Published: 10/25/2007
Authors: Hae-Jeong Lee, Christopher Soles, Eric K Lin, Wen-Li Wu, Yiping Liu
Abstract: The microelectronics industry critically needs non-destructive methodologies capable of profiling the porosity characteristics as a function of depth in the highly porous film that are used as interlayer dielectric insulators in integrated semiconduc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852742

103. The Direct Patterning of Nanoporous Interlayer Dielectric Insulator Films by Nanoimprint Lithography
Topic: Semiconductors
Published: 10/2/2007
Authors: Hyun W. Ro, Ronald Leland Jones, H Peng, Daniel R. Hines, Hae-Jeong Lee, Eric K Lin, Alamgir Karim, Do Y. Yoon, D Gidley, Christopher Soles
Abstract: Directly patterning dielectric insulator materials via nanoimprint lithography has the potential to simplify fabrication processes and significantly reduce the manufacturing costs for semiconductor devices. However, the prospect of mechanically form ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852642

104. Extracting Electron Densities in N-Type GaAs from Raman Spectra: Theory
Series: Journal of Research (NIST JRES)
Topic: Semiconductors
Published: 7/1/2007
Author: Herbert S Bennett
Abstract: Raman measurements are proposed as a non-destructive method for wafer acceptance tests of carrier density. The interpretation of Raman spectra to determine the majority electron density in n-type semiconductors requires an interdisciplinary effort in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32643

105. I-NEMI 2007 Organic and Printed Electronics Roadmap
Topic: Semiconductors
Published: 4/2/2007
Authors: Jan Obrzut, Regis J Kline, Eric K Lin, David J Gundlach, Daniel Gamota
Abstract: This roadmap provides an overview of the most critical technologies necessary for commercial launch and market diffusion of organic & printed electronics based products. To the best of our knowledge, this roadmap is the first of its kind and as such ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854054

106. Extraction of Sheet Resistance and Linewidth from All-Copper ECD Test-Structures Fabricated from Silicon Preforms
Topic: Semiconductors
Published: 3/22/2007
Authors: Byron J Shulver, Andrew S Bunting, Alan Gundlach, Les I Haworth, Alan W Ross, A. J Smith, Anthony J Snell, J. Tom Stevenson, Anthony Walton, Michael W Cresswell, Richard A Allen
Abstract: Test Structures for the extraction of Electrical Critical Dimensions (ECD) and having all-copper features with no barrier metal films have been fabricated. The advantage of this approach is that electrical measurements provide a non-destructive metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32582

107. Reliability and Characterization Challenges for Nano-Scale Electronic Devices
Topic: Semiconductors
Published: 3/14/2007
Authors: John S Suehle, Hao Xiong, Moshe Gurfinkel
Abstract: Scaling electronic devices to nano-scale dimensions may introduce unforeseen physical mechanisms that may seriously compromise device reliability. It has been discussed that as individual atoms comprise a larger fraction of the actual device area, de ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32607

108. Will Future Measurement Needs for the Semiconductor Industry Be Met?
Series: Journal of Research (NIST JRES)
Topic: Semiconductors
Published: 1/1/2007
Authors: Herbert S Bennett, Alain C. Diebold, C. Michael Garner
Abstract: We present an assessment of the state of the nation''s measurement system in its ability to meet the metrology needs of the semiconductor industry. Lacking an acceptable metric for the assessing the health of metrology for the semiconductor i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32296

109. Cellular Immobilization within Microfluidic Microenvironments: Dielectophoresis with Polyelectrolyte Multilayers
Topic: Semiconductors
Published: 10/25/2006
Authors: Samuel P. Forrey, Darwin R Reyes-Hernandez, Michael Gaitan, Laurie E Locascio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32513

110. Future Perspective of RF and Analog/Mixed-Signal Integrated Circuit Technologies for Mobile Communications
Topic: Semiconductors
Published: 10/23/2006
Authors: Bin Zhao, Herbert S Bennett, Julio Costa, Peter Cottrell, Anthony A. Immorlica, Margaret Huang, Jan-Erik Mueller, Marco Racanelli, Hisashi Shichijo, Charles E. Weitzel
Abstract: Radio frequency (RF) and analog/mixed-signal (AMS) integrated circuits (ICs) are key enabling components for mobile and wireless communications and their advancements continue to drive the growth of the related semiconductor market. The circuit and t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32445



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