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Topic Area: Quantum Electrical Measurements
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Displaying records 291 to 300 of 302 records.
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291. Transient Errors in a Precision Resistive Divider
Topic: Quantum Electrical Measurements
Published: 6/1/1996
Authors: S. A. Boggs, Gerald J FitzPatrick, J. Kuang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28531

292. Ultra-Low Resistance Contacts to GaAs/AlGaAs Quantized Hall Resistors
Topic: Quantum Electrical Measurements
Published: 5/1/2000
Author: Kevin C. Lee
Abstract: Contacts to quantized Hall resistors (QHRs) must meet demanding specifications for contact resistance, reliability, ruggedness, and resistance to degradation. A study of contact materials showed that contacts composed primarily of Indium meet all of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16563

293. Ultra-high resolution alpha particle spectroscopy using calorimetry
Topic: Quantum Electrical Measurements
Published: 9/23/2008
Authors: Robert Daniel Horansky, Joel Nathan Ullom, James A Beall, Gene C Hilton, Kent D Irwin, Don Dry, Beth Hastings, Stephen Lamont, Clifford R Rudy, Michael W Rabin
Abstract: Calorimetry has been used since the late 1700?s to measure the heat output of physical processes ranging from chemical reactions to the respiration of organisms . Calorimetry is performed by measuring the temperature change caused by heat release int ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32940

294. Uncertainty budget for the NIST Electron Counting Capacitance Standard, ECCS- 1
Topic: Quantum Electrical Measurements
Published: 11/21/2007
Authors: Mark W Keller, Neil M Zimmerman, Ali L Eichenberger
Abstract: We measure a cryogenic, vacuum-gap capacitor by two methods: 1) charging it with a known number of electrons and measuring the resulting voltage, and 2) using a capacitance bridge traceable to the SI farad. We report a detailed uncertainty budget for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32798

295. Using Quantized Breakdown Voltage Signals to Determine the Maximum Electric Fields in a Quantum Hall Effect Sample
Series: Journal of Research (NIST JRES)
Topic: Quantum Electrical Measurements
Published: 5/1/1995
Authors: Marvin E. Cage, C. F. Lavine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23952

296. VARIABILITY OF CHARGE NOISE IN Al-BASED SET TRANSISTORS
Topic: Quantum Electrical Measurements
Published: 7/14/2006
Authors: Mark W Keller, B. Jeanneret, Jose Alberto Aumentado
Abstract: We measured the charge noise of four Al-based SET transistors on multiple cooldowns. We found a consistent 1/f component independent of thermal cycling and other treatments, but large variations in the total noise spectrum due to two-level fluctuator ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32202

297. Validating Surge Test Standards by Field Experience: High-Energy Tests and Varistor Performance
Topic: Quantum Electrical Measurements
Published: 11/1/1992
Authors: Charles D. Fenimore, Francois D. Martzloff
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3913

298. Versatile co-sputtered Nb/NbxSi1-x/Nb Josephson junctions for Josephson voltage standards and high-speed superconducting digital electronics
Topic: Quantum Electrical Measurements
Published: 6/16/2009
Authors: David Olaya, Paul David Dresselhaus, Samuel Paul Benz
Abstract: Josephson junctions that use co-sputtered amorphous Nb-Si barriers can be made with a wide variety of electrical properties depending on both the thickness of the barrier and its ratio of Nb to Si. Critical current density (Jc), specific capacitance ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902718

299. Voltage Ratio Measurements of a Zener Reference Using a Digital Voltmeter
Topic: Quantum Electrical Measurements
Published: 6/1/1992
Authors: Richard L Steiner, E A. Early, Curtis Kiser
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27996

300. Watt Balance Method for Determination of Planck's Constant
Topic: Quantum Electrical Measurements
Published: 4/1/1991
Authors: Weston Leo Tew, P. T. Olsen, Edwin Ross Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23703



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