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Topic Area: Optoelectronics
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Displaying records 51 to 60.
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51.
Synchronization monitoring of I/Q data and pulse carving misalignment for a serial-type 80-Gb/s RZ-DQPSK transmitter through optical/RF clock tone measurement
Topic: Optoelectronics
Published: 8/4/2008
Authors: Jeffrey A Jargon, Xiaoxia Wu, Louis Christen, Scott Nuccio, Omer F. Yilmaz, Loukas Paraschis, Yannick K. Lize, Alan Willner
Abstract: We experimentally demonstrate a monitoring technique for determining misalignment between the in-phase/ quadrature (I/Q) data streams and between the data and pulse carving in an 80 Gb/s serial-type return-to-zero differential quadrature phase-shift-
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33136
52.
Tensile measurement of single crystal gallium nitride nanowires on MEMS test stages
Topic: Optoelectronics
Published: 4/18/2010
Authors: J. J. Brown, A. I. Baca, Kristine A Bertness, D. A. Dikin, R. S. Ruoff, Victor M. Bright
Abstract: This paper reports the first direct tensile tests on nearly defect free, n-type (Si-doped) gallium nitride single crystal nanowires. Here, for the first time, nanowires have been integrated with actuated, active microelectromechanical (MEMS) structur
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902539
53.
Terahertz Mobility Measurements on P3HT Films: Device Comparison, Molecular Weight and Film Processing Effects
Topic: Optoelectronics
Published: Date unknown
Authors: Okan Esenturk, Joseph S Melinger
Abstract: We report the first direct comparison of relative carrier mobilities in semiconducting organic polymer films measured using non-contact optical pump terahertz probe spectroscopy to those reported in electrical device studies. Relative transient sign
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841108
54.
The Next Generation of Laser Radiometry at NIST
Topic: Optoelectronics
Published: 2/27/2006
Authors: John H Lehman, Christopher L Cromer, Marla L Dowell
Abstract: High accuracy laser radiometry is on the verge of significant improvements just as new laser technologies are evolving. Our present tasks are directed toward anticipating and meeting the measurement needs in two areas; higher power and shorter wavele
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32135
55.
The effect of growth orientation and diameter on the elasticity of GaN Nanowires - a combined insitu TEM and atomistic modeling investigation
Topic: Optoelectronics
Published: 12/20/2010
Authors: Kristine A Bertness, Norman A Sanford, Albert Davydov
Abstract: We characterized the elastic properties of GaN nanowires grown along different crystallographic orientations. In situ transmission electron microscopy tensile tests were conducted using a MEMS-based nanoscale testing system. Complementary atomistic s
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906878
56.
Traceable waveform calibration with a covariance-based uncertainty analysis
Topic: Optoelectronics
Published: 10/1/2009
Authors: Paul D Hale, Dylan F Williams, Andrew M Dienstfrey, Arkadiusz C. (Arkadiusz) Lewandowski, Tracy S. Clement, Darryl A. Keenan
Abstract: We describe a method for calibrating the voltage that a step-like pulse generator produces at a load at every time point in themeasured waveform. The calibration includes an equivalent-circuit
model of the generator that can be used to determine how
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33129
57.
Transfer function analysis of measured transfer matrices
Topic: Optoelectronics
Published: 8/1/1989
Authors: Shao Yang, Igor Vayshenker, A. R. Mickelson
Abstract: Measurements of mode transfer matrices of various multimode fiber optic connectors are presented. To
analyze the accuracy and repeatability of such measurements, a theoretical framework which employs mode transmission functions is derived. It is sho
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912635
58.
Transfer function approach to the experimental determination of mode transfer matrices
Topic: Optoelectronics
Published: 7/20/1990
Authors: Shao Yang, Igor Vayshenker, D. R. Hjelme, I. P. Januar, A. R. Mickelson
Abstract: An improved scheme for characterization of multimode fiber systems is investigated. Characterization with transfer matrices requires multiple measurements for each component. The transfer function approach herein investigated requires only a single l
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912634
59.
Ultra-low-noise all-fiber photon pair source
Topic: Optoelectronics
Published: 8/21/2008
Authors: Shellee Dawn Dyer, Martin J Stevens, Burm Baek, Sae Woo Nam
Abstract: We demonstrate an all-fiber photon pair source with the highest coincidence-to-accidental ratio (CAR) reported to date in the fiber optic telecom C-band.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33011
60.
Waveform metrology and a quantitative study of regularized deconvolution
Topic: Optoelectronics
Published: 5/1/2010
Authors: Paul D Hale, Andrew M Dienstfrey
Abstract: We present methodology and preliminary results of a Monte-Carlo simulation to perform a quantified analysis of regularized deconvolution in the context of full waveform metrology. We analyze the behavior of different regularized inversion methods wi
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904937