Publications Portal

You searched on:
Topic Area: Microwave Measurement Services
Sorted by: title

Displaying records 81 to 83.
Resort by: Date / Title

81. Vector Corrected Noise Temperature Measurements
Topic: Microwave Measurement Services
Published: 6/7/2002
Authors: Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James Paul Randa
Abstract: A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using iso ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=954

82. Wideband Frequency-Domain Characterization of High-Impedance Probes
Topic: Microwave Measurement Services
Published: 11/30/2001
Authors: Uwe Arz, Howard C. Reader, Pavel Kabos, Dylan F Williams
Abstract: In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6221

83. Wideband measurement of extreme impedance with a multistate reflectometer
Topic: Microwave Measurement Services
Published: 12/12/2008
Authors: Arkadiusz C. (Arkadiusz) Lewandowski, Denis X LeGolvan, Ronald A Ginley, Thomas M Wallis, Atif Imtiaz, Pavel Kabos
Abstract: Abstract: We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900214