NIST logo

Publications Portal

You searched on:
Topic Area: Microwave Measurement Services
Sorted by: title

Displaying records 81 to 88.
Resort by: Date / Title


81. The Interaction of Radio-Frequency Fields with Materials at Macroscopic to Mesoscopic Sales
Series: Journal of Research (NIST JRES)
Report Number: 117.001
Topic: Microwave Measurement Services
Published: 2/2/2012
Authors: James R. Baker-Jarvis, Sung Kim
Abstract: The goal of this paper is to overview radio-frequency electromagnetic interactions with solid and liquid dielectric and magnetic materials from the macroscale down to the nanoscale. Because this area of research is vast, the paper concentrates on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906319

82. The National Wireless Electronic Systems Testbed and its Initial Development
Topic: Microwave Measurement Services
Published: 2/1/1999
Author: Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8651

83. The National Wireless Electronic Systems Testbed and its Initial Development
Topic: Microwave Measurement Services
Published: 12/1/1998
Author: Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21656

84. Uncertainties in NIST Noise-Temperature Measurements
Series: Technical Note (NIST TN)
Report Number: 1502
Topic: Microwave Measurement Services
Published: 3/1/1998
Author: James Paul Randa
Abstract: Uncertainty analyses are presented for NIST measurements of noise temperature. All systems currently used in NIST calibrations of thermal-noise sources are treated. These include tuned systems for 30 and 60 MHz, coaxial total-power radiometers for 1 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11498

85. VNA Calibration Software Manual
Topic: Microwave Measurement Services
Published: 6/1/2003
Authors: Dylan F Williams, Jack Wang, Uwe Arz
Abstract: This software algorithm combines a decade of experience in applying orthogonal distance regression and other iterative techniques to solving vector-network-analyzer (VNA) calibrations. The new software features a robust algorithm capable of finding s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31315

86. Vector Corrected Noise Temperature Measurements
Topic: Microwave Measurement Services
Published: 6/7/2002
Authors: Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James Paul Randa
Abstract: A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using iso ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=954

87. Wideband Frequency-Domain Characterization of High-Impedance Probes
Topic: Microwave Measurement Services
Published: 11/30/2001
Authors: Uwe Arz, Howard C. Reader, Pavel Kabos, Dylan F Williams
Abstract: In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6221

88. Wideband measurement of extreme impedance with a multistate reflectometer
Topic: Microwave Measurement Services
Published: 12/12/2008
Authors: Arkadiusz C. (Arkadiusz) Lewandowski, Denis X LeGolvan, Ronald A Ginley, Thomas M Wallis, Atif (Atif) Imtiaz, Pavel Kabos
Abstract: Abstract: We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900214



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series