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Displaying records 21 to 28.
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21. On-wafer Magnetic Resonance of Magnetite Nanoparticles
Topic: Microwave Measurement Services
Published: 5/11/2015
Authors: Charles Anderson Enright Little, Stephen E Russek, James C Booth, Pavel Kabos, Robert J. Usselman
Abstract: Magnetic resonance measurements of ferumoxytol and TEMPO were made using an on-wafer transmission line technique with a vector network analyzer, allowing for broadband measurements of small sample volumes (4 nl) and a small numbers of spin (1 nmole). ...

Topic: Microwave Measurement Services
Published: 7/30/2010
Authors: Dazhen Gu, Amanda Cox, Derek Anderson Houtz, David K Walker, James Paul Randa, Robert L. Billinger
Abstract: We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at varia ...

23. Radiometer Measurements of a Near-Ambient, Variable-Temperature Noise Standard
Topic: Microwave Measurement Services
Published: 6/7/2004
Authors: George Free, James Paul Randa, Robert L. Billinger
Abstract: A near-ambient, variable-temperature noise standard whose physical temperature can be accurately measured was constructed and then measured with the NIST total-power radiometer to test the accuracy of radiometer measurements in the temperature range ...

24. Recommended Terminology For Microwave Radiometry
Series: Technical Note (NIST TN)
Topic: Microwave Measurement Services
Published: 8/1/2008
Authors: James Paul Randa, Janne Lahtinen, Adriano Camps, A. Gasiewski, Martti Hallikainen, David Leine V, Manuel Martin-Neira, Jeff Piepmeier, Philip Rosenkranz, Christopher Ruf, James Shiue, Niels Skou
Abstract: We present recommended definitions for common terms in microwave remote-sensing radiometry. Terms are grouped into three chapters: General Terminology, Real-Aperture Radiometers, and Polarimetric Radiometry. AN alphabetical index lists the terms t ...

Topic: Microwave Measurement Services
Published: 11/30/2007
Authors: James Paul Randa, Ken Wong, Roger Pollard
Abstract: Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the DUT) and then mea ...

26. Simulations of Noise-Parameter Uncertainties
Topic: Microwave Measurement Services
Published: 6/7/2002
Author: James Paul Randa
Abstract: This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlyin ...

27. Vector Corrected Noise Temperature Measurements
Topic: Microwave Measurement Services
Published: 6/7/2002
Authors: Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James Paul Randa
Abstract: A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using iso ...

28. Wideband measurement of extreme impedance with a multistate reflectometer
Topic: Microwave Measurement Services
Published: 12/12/2008
Authors: Arkadiusz C. Lewandowski, Denis X. (Denis Xavier) LeGolvan, Ronald A Ginley, Thomas M Wallis, Atif A. Imtiaz, Pavel Kabos
Abstract: Abstract: We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We ...

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