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Topic Area: Microwave Measurement Services
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Displaying records 61 to 70 of 86 records.
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61. Quasi-TEM Model for Coplanar Waveguide on Silicon
Topic: Microwave Measurement Services
Published: 10/1/1997
Authors: Dylan F Williams, Michael D Janezic, A. Ralston
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16758

62. REFLECTIVITY STUDIES OF PASSIVE MICROWAVE CALIBRATION TARGETS AND ABSORPTIVE MATERIALS
Topic: Microwave Measurement Services
Published: 7/30/2010
Authors: Dazhen Gu, Amanda Cox, Derek Anderson Houtz, David K Walker, James Paul Randa, Robert L Billinger
Abstract: We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at varia ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906017

63. RF and Microwave Device Measurements Using a Digital Sampling Oscilloscope
Topic: Microwave Measurement Services
Published: 12/1/1997
Authors: Donald C. DeGroot, Jeffrey A Jargon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14288

64. Radiated Power Measurements in Reverberation Chambers
Topic: Microwave Measurement Services
Published: 12/1/2000
Authors: Galen H Koepke, John M Ladbury
Abstract: The electromagnetic reverberation chamber is widely used as a test facility to generate complex fields for interference and compatibility measurements. The chamber is also effective as a method to quantify the total radiated power from an emitter re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20773

65. Radiometer Measurements of a Near-Ambient, Variable-Temperature Noise Standard
Topic: Microwave Measurement Services
Published: 6/7/2004
Authors: George Free, James Paul Randa, Robert L Billinger
Abstract: A near-ambient, variable-temperature noise standard whose physical temperature can be accurately measured was constructed and then measured with the NIST total-power radiometer to test the accuracy of radiometer measurements in the temperature range ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31593

66. Recommended Terminology For Microwave Radiometry
Series: Technical Note (NIST TN)
Topic: Microwave Measurement Services
Published: 8/1/2008
Authors: James Paul Randa, Janne Lahtinen, Adriano Camps, A. Gasiewski, Martti Hallikainen, David Leine V, Manuel Martin-Neira, Jeff Piepmeier, Philip Rosenkranz, Christopher Ruf, James Shiue, Niels Skou
Abstract: We present recommended definitions for common terms in microwave remote-sensing radiometry. Terms are grouped into three chapters: General Terminology, Real-Aperture Radiometers, and Polarimetric Radiometry. AN alphabetical index lists the terms t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33079

67. Repeat Measurements and Metrics for Nonlinear Model Development
Topic: Microwave Measurement Services
Published: 6/6/2002
Authors: Catherine A Remley, Jeffrey A Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
Abstract: We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30001

68. Revised Uncertainty of the NIST 30 MHz Phase Shifter Measurement Service
Topic: Microwave Measurement Services
Published: 2/1/1998
Author: Jeffrey A Jargon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10068

69. Robust Statistical Analysis of Vector Network Analyzer Intercomparisons
Topic: Microwave Measurement Services
Published: 5/1/1999
Authors: Robert M. Judish, Jolene D Splett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28575

70. SIMULATIONS OF NOISE-PARAMETER VERIFICATION USING CASCADE WITH ISOLATOR OR MISMATCHED TRANSMISSION LINE
Topic: Microwave Measurement Services
Published: 11/30/2007
Authors: James Paul Randa, Ken Wong, Roger Pollard
Abstract: Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the DUT) and then mea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32814



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