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Topic Area: Microwave Measurement Services
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Displaying records 31 to 40 of 86 records.
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31. Estimating the Magnitude and Phase Response of a 50 GHz Sampling Oscilloscope Using the Nose-to-Nose Method
Topic: Microwave Measurement Services
Published: 6/1/2000
Authors: Paul D Hale, Tracy S. Clement, Kevin J Coakley, Chih-Ming Wang, Donald C. DeGroot, A. P. Verdoni
Abstract: We describe estimation of the magnitude and phase response of a sampling oscilloscope over 50 Ghz bandwidth using the nose-to-nose method. The measurements are corrected for the non-ideal properties of the oscilloscope and calibration apparatus, inc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27262

32. Expanding Definitions of Gain by Taking Harmonic Content into Account
Topic: Microwave Measurement Services
Published: 9/1/2003
Authors: Jeffrey A Jargon, Kuldip Gupta, Alessandro Cidronali, Donald C. DeGroot
Abstract: We expand the definitions of power gain, transducer gain, and available gain by taking harmonic content into account. Furthermore, we show that under special conditions, these expanded definitions of gain can be expressed in terms of nonlinear large- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30921

33. Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines
Topic: Microwave Measurement Services
Published: 10/1/2001
Authors: Uwe Arz, Dylan F Williams, Hartmut Grabinski
Abstract: We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7589

34. Formulations of the Basic Vector Network Analyzer Error Model Including Switch Terms
Topic: Microwave Measurement Services
Published: 12/1/1997
Author: Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1441

35. Influence of the Substrate Resistivity on the Broadband Characteristics of Silicon Transmission Lines
Topic: Microwave Measurement Services
Published: 12/1/1999
Authors: Uwe Arz, Hartmut Grabinski, Dylan F Williams
Abstract: This work investigates the broadband propagation characteristics of transmission lines fabricated on silcon substrates of different conductivities.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24545

36. International Comparison of Noise-Temperature Measurements at 2, 4, and 12 GHz
Topic: Microwave Measurement Services
Published: 7/1/1998
Authors: James Paul Randa, J. Achkar, F. I Buchholz, T. Colard, D. Schubert, M. Sinclair, Joseph Paul Rice, G. Silvia Williams
Abstract: We report results of a recent international comparison of thermal noise-power measurements, performed under the auspices of CIPM/CCE. The noise temperatures of two solid-state sources with GPC-7 connectors were measured at 2, 4, and 12 GHz. All res ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24272

37. International Comparison of Thermal Noise-Temperature Measurements at 2, 4 and 12 GHz
Topic: Microwave Measurement Services
Published: 4/1/1999
Authors: James Paul Randa, Joseph Paul Rice, J. Achkar, T. Colard, M. Sinclair, G. Silvia Williams, F. IM Bucholz, D. Schubert
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20887

38. International Comparison, Final Summary Report
Topic: Microwave Measurement Services
Published: 11/1/2000
Author: James Paul Randa
Abstract: An international comparison of noise temperature of coaxial (GPC-7) sources at 2 GHz, 4 GHz and 12 GHz has been completed. Participating laboratories included the Physikalisch-Technische Bundesanstalt (PTB); the Bureau National de Metrologie-Laborato ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29776

39. Line-Reflect-Match (LRM) Calibration Technique for the Dual Six-Port ANA
Topic: Microwave Measurement Services
Published: 4/1/1997
Author: Ronald A Ginley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14485

40. Lumped-Element Impedance Standards
Topic: Microwave Measurement Services
Published: 6/1/1998
Authors: Dylan F Williams, David K Walker
Abstract: We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard's impedance depends not only on the standard itself, but also on probe placement, probe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21060



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