NIST logo

Publications Portal

You searched on:
Topic Area: Microwave Measurement Services
Sorted by: title

Displaying records 31 to 40 of 85 records.
Resort by: Date / Title


31. Expanding Definitions of Gain by Taking Harmonic Content into Account
Topic: Microwave Measurement Services
Published: 9/1/2003
Authors: Jeffrey A Jargon, Kuldip Gupta, Alessandro Cidronali, Donald C. DeGroot
Abstract: We expand the definitions of power gain, transducer gain, and available gain by taking harmonic content into account. Furthermore, we show that under special conditions, these expanded definitions of gain can be expressed in terms of nonlinear large- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30921

32. Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines
Topic: Microwave Measurement Services
Published: 10/1/2001
Authors: Uwe Arz, Dylan F Williams, Hartmut Grabinski
Abstract: We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7589

33. Formulations of the Basic Vector Network Analyzer Error Model Including Switch Terms
Topic: Microwave Measurement Services
Published: 12/1/1997
Author: Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1441

34. Influence of the Substrate Resistivity on the Broadband Characteristics of Silicon Transmission Lines
Topic: Microwave Measurement Services
Published: 12/1/1999
Authors: Uwe Arz, Hartmut Grabinski, Dylan F Williams
Abstract: This work investigates the broadband propagation characteristics of transmission lines fabricated on silcon substrates of different conductivities.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24545

35. International Comparison of Noise-Temperature Measurements at 2, 4, and 12 GHz
Topic: Microwave Measurement Services
Published: 7/1/1998
Authors: James Paul Randa, J. Achkar, F. I Buchholz, T. Colard, D. Schubert, M. Sinclair, Joseph Paul Rice, G. Silvia Williams
Abstract: We report results of a recent international comparison of thermal noise-power measurements, performed under the auspices of CIPM/CCE. The noise temperatures of two solid-state sources with GPC-7 connectors were measured at 2, 4, and 12 GHz. All res ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24272

36. International Comparison of Thermal Noise-Temperature Measurements at 2, 4 and 12 GHz
Topic: Microwave Measurement Services
Published: 4/1/1999
Authors: James Paul Randa, Joseph Paul Rice, J. Achkar, T. Colard, M. Sinclair, G. Silvia Williams, F. IM Bucholz, D. Schubert
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20887

37. International Comparison, Final Summary Report
Topic: Microwave Measurement Services
Published: 11/1/2000
Author: James Paul Randa
Abstract: An international comparison of noise temperature of coaxial (GPC-7) sources at 2 GHz, 4 GHz and 12 GHz has been completed. Participating laboratories included the Physikalisch-Technische Bundesanstalt (PTB); the Bureau National de Metrologie-Laborato ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29776

38. Line-Reflect-Match (LRM) Calibration Technique for the Dual Six-Port ANA
Topic: Microwave Measurement Services
Published: 4/1/1997
Author: Ronald A Ginley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14485

39. Lumped-Element Impedance Standards
Topic: Microwave Measurement Services
Published: 6/1/1998
Authors: Dylan F Williams, David K Walker
Abstract: We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard's impedance depends not only on the standard itself, but also on probe placement, probe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21060

40. Lumped-Element Models for On-Wafer Calibration
Topic: Microwave Measurement Services
Published: 12/1/2000
Authors: David K Walker, Raian K. Kaiser, Dylan F Williams, Kevin J Coakley
Abstract: We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped sta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30211



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series