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Topic Area: Microwave Measurement Services
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Displaying records 1 to 10 of 87 records.
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1. 0.1-10 GHZ CMOS Voltage Standard
Topic: Microwave Measurement Services
Published: 5/1/1999
Authors: Dylan F Williams, David K Walker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20565

2. A Direct Calibration Method for Measuring Equivalent Source Mismatch
Topic: Microwave Measurement Services
Published: 10/1/1997
Author: John R. Juroshek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5047

3. A Method for Comparing Vector Network Analyzers
Topic: Microwave Measurement Services
Published: 12/1/1997
Authors: Donald C. DeGroot, Roger Marks, Jeffrey A Jargon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21163

4. Accuracy of Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers
Topic: Microwave Measurement Services
Published: 6/1/1998
Authors: Roger Marks, Jeffrey A Jargon, D. K. Rytting
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20227

5. Accurate Characteristic Impedance Measurement on Silicon
Topic: Microwave Measurement Services
Published: 6/1/1998
Authors: Dylan F Williams, Uwe Arz, Hartmut Grabinski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10077

6. Amplifier Noise Measurements at NIST
Topic: Microwave Measurement Services
Published: 4/1/1997
Authors: D. F. Wait, James Paul Randa
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15902

7. Analysis for Dynamic Metrology
Topic: Microwave Measurement Services
Published: 1/30/2014
Authors: Andrew M Dienstfrey, Paul D Hale
Abstract: Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914865

8. Applications of Calibration Comparison in On-wafer Measurement
Topic: Microwave Measurement Services
Published: 8/17/2002
Authors: Uwe Arz, Dylan F Williams
Abstract: In this paper we discuss several applications of calibration comparison in on-wafer measurement. This technique can be understood as an abstraction of the well-known two-tier deembedding scheme used in test-fixture characterization. The applications ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33081

9. Artificial Neural Network Modeling for Improved On-Wafer Line-Reflect-Match Calibrations
Topic: Microwave Measurement Services
Published: 9/1/2001
Authors: Jeffrey A Jargon, Kuldip Gupta
Abstract: We model a load using an artificial neural network (ANN) to improve an on-wafer line-reflect-match (LRM) calibration of a vector network analyzer. The ANN is trained with measurement data obtained from a thru-reflect-line (TRL) calibration. The acc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16549

10. Boundary Effects on the Determination of the Effective Parameters of a Metamaterial from Normal Incidence Reflection and Transmission
Topic: Microwave Measurement Services
Published: 6/1/2011
Authors: Sung Kim, Edward E. Kuester, Christopher L Holloway, James R. Baker-Jarvis, Aaron D. Scher
Abstract: This paper presents a method for the determination of the effective electromagnetic parameters of a metamaterial, taking boundary effects at the interfaces between a conventional material and metamaterial into account. In the technique presented here ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904074



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