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Topic Area: Microwave Measurement Services
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Displaying records 31 to 40 of 85 records.
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31. Repeat Measurements and Metrics for Nonlinear Model Development
Topic: Microwave Measurement Services
Published: 6/6/2002
Authors: Catherine A Remley, Jeffrey A Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
Abstract: We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30001

32. The 30/60 MHz Tuned Radiometer - The NIST System for Noise Temperature Measurements
Series: Technical Note (NIST TN)
Report Number: 1525
Topic: Microwave Measurement Services
Published: 5/1/2002
Authors: Chriss A. Grosvenor, Robert L Billinger
Abstract: The NIST Noise Project has completed reconstruction of their 30/60 MHz tuned, coaxial (Type N) radiometer system. This system is used at low frequencies where isolators are impractical to incorporate. Without isolators, the ambient and cryogenic stan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14689

33. Wideband Frequency-Domain Characterization of High-Impedance Probes
Topic: Microwave Measurement Services
Published: 11/30/2001
Authors: Uwe Arz, Howard C. Reader, Pavel Kabos, Dylan F Williams
Abstract: In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6221

34. Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines
Topic: Microwave Measurement Services
Published: 10/1/2001
Authors: Uwe Arz, Dylan F Williams, Hartmut Grabinski
Abstract: We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7589

35. Artificial Neural Network Modeling for Improved On-Wafer Line-Reflect-Match Calibrations
Topic: Microwave Measurement Services
Published: 9/1/2001
Authors: Jeffrey A Jargon, Kuldip Gupta
Abstract: We model a load using an artificial neural network (ANN) to improve an on-wafer line-reflect-match (LRM) calibration of a vector network analyzer. The ANN is trained with measurement data obtained from a thru-reflect-line (TRL) calibration. The acc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16549

36. Characteristic-Impedance Measurement Error on Lossy Substrates
Topic: Microwave Measurement Services
Published: 7/1/2001
Authors: Dylan F Williams, Uwe Arz, Hartmut Grabinski
Abstract: This paper examines error in the characteristic impedance measured by the calibration comparison method.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13906

37. Measurement Comparison of a Low-Intermodulation Termination for the U.S. Wireless Industry
Series: Technical Note (NIST TN)
Report Number: 1521
Topic: Microwave Measurement Services
Published: 7/1/2001
Author: Jeffrey A Jargon
Abstract: After the recent, successful completion of a passive intermodulation measurement comparison for nonlinear two-port devices, the National Institute of Standards and Technology was requested to perform a second comparison for a one-port termination. W ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7229

38. Stability Measurements on Noise Sources
Topic: Microwave Measurement Services
Published: 4/1/2001
Authors: James Paul Randa, L. A. Terrell, Lawrence P. Dunleavy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3392

39. Lumped-Element Models for On-Wafer Calibration
Topic: Microwave Measurement Services
Published: 12/1/2000
Authors: David K Walker, Raian K. Kaiser, Dylan F Williams, Kevin J Coakley
Abstract: We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped sta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30211

40. Radiated Power Measurements in Reverberation Chambers
Topic: Microwave Measurement Services
Published: 12/1/2000
Authors: Galen H Koepke, John M Ladbury
Abstract: The electromagnetic reverberation chamber is widely used as a test facility to generate complex fields for interference and compatibility measurements. The chamber is also effective as a method to quantify the total radiated power from an emitter re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20773



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