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You searched on: Topic Area: Microwave Measurement Services Sorted by: date

Displaying records 31 to 40 of 88 records.
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31. Developing Frequency-Domain Models for Nonlinear Circuits Based on Large-Signal Measurements
Topic: Microwave Measurement Services
Published: 8/17/2002
Authors: Jeffrey A Jargon, Kuldip Gupta, Dominique Schreurs, Donald C. DeGroot

32. Simulations of Noise-Parameter Uncertainties
Topic: Microwave Measurement Services
Published: 6/7/2002
Author: James Paul Randa
Abstract: This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlyin ...

33. Vector Corrected Noise Temperature Measurements
Topic: Microwave Measurement Services
Published: 6/7/2002
Authors: Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James Paul Randa
Abstract: A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using iso ...

34. Repeat Measurements and Metrics for Nonlinear Model Development
Topic: Microwave Measurement Services
Published: 6/6/2002
Authors: Catherine A Remley, Jeffrey A Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
Abstract: We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different me ...

35. The 30/60 MHz Tuned Radiometer - The NIST System for Noise Temperature Measurements
Series: Technical Note (NIST TN)
Report Number: 1525
Topic: Microwave Measurement Services
Published: 5/1/2002
Authors: Chriss A. Grosvenor, Robert L Billinger
Abstract: The NIST Noise Project has completed reconstruction of their 30/60 MHz tuned, coaxial (Type N) radiometer system. This system is used at low frequencies where isolators are impractical to incorporate. Without isolators, the ambient and cryogenic stan ...

36. Wideband Frequency-Domain Characterization of High-Impedance Probes
Topic: Microwave Measurement Services
Published: 11/30/2001
Authors: Uwe Arz, Howard C. Reader, Pavel Kabos, Dylan F Williams
Abstract: In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization ...

37. Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines
Topic: Microwave Measurement Services
Published: 10/1/2001
Authors: Uwe Arz, Dylan F Williams, Hartmut Grabinski
Abstract: We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study ...

38. Artificial Neural Network Modeling for Improved On-Wafer Line-Reflect-Match Calibrations
Topic: Microwave Measurement Services
Published: 9/1/2001
Authors: Jeffrey A Jargon, Kuldip Gupta
Abstract: We model a load using an artificial neural network (ANN) to improve an on-wafer line-reflect-match (LRM) calibration of a vector network analyzer. The ANN is trained with measurement data obtained from a thru-reflect-line (TRL) calibration. The acc ...

39. Characteristic-Impedance Measurement Error on Lossy Substrates
Topic: Microwave Measurement Services
Published: 7/1/2001
Authors: Dylan F Williams, Uwe Arz, Hartmut Grabinski
Abstract: This paper examines error in the characteristic impedance measured by the calibration comparison method.

40. Measurement Comparison of a Low-Intermodulation Termination for the U.S. Wireless Industry
Series: Technical Note (NIST TN)
Report Number: 1521
Topic: Microwave Measurement Services
Published: 7/1/2001
Author: Jeffrey A Jargon
Abstract: After the recent, successful completion of a passive intermodulation measurement comparison for nonlinear two-port devices, the National Institute of Standards and Technology was requested to perform a second comparison for a one-port termination. W ...

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