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Topic Area: Microwave Measurement Services
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Displaying records 21 to 30 of 84 records.
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21. Expanding Definitions of Gain by Taking Harmonic Content into Account
Topic: Microwave Measurement Services
Published: 9/1/2003
Authors: Jeffrey A Jargon, Kuldip Gupta, Alessandro Cidronali, Donald C. DeGroot
Abstract: We expand the definitions of power gain, transducer gain, and available gain by taking harmonic content into account. Furthermore, we show that under special conditions, these expanded definitions of gain can be expressed in terms of nonlinear large- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30921

22. StatistiCAL Vector-Network-Analyzer Calibration Software
Topic: Microwave Measurement Services
Published: 6/1/2003
Authors: Dylan F Williams, Jack Wang, Uwe Arz
Abstract: StatistiCAL is a new freeware package for calibrating vector network analyzers (VNAs) developed at the National Institute of Standards and Technology (NIST).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31335

23. VNA Calibration Software Manual
Topic: Microwave Measurement Services
Published: 6/1/2003
Authors: Dylan F Williams, Jack Wang, Uwe Arz
Abstract: This software algorithm combines a decade of experience in applying orthogonal distance regression and other iterative techniques to solving vector-network-analyzer (VNA) calibrations. The new software features a robust algorithm capable of finding s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31315

24. Multiline TRL Revealed
Topic: Microwave Measurement Services
Published: 12/5/2002
Authors: Donald C. DeGroot, Jeffrey A Jargon, Roger Marks
Abstract: We reveal the techniques behind a successful implementation of the Multiline TRL calibration for vector network analyzers (VNAs). For the first time, this paper describes the inner workings of NIST's Multical software, an evolved, automated implement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30862

25. Applications of Calibration Comparison in On-wafer Measurement
Topic: Microwave Measurement Services
Published: 8/17/2002
Authors: Uwe Arz, Dylan F Williams
Abstract: In this paper we discuss several applications of calibration comparison in on-wafer measurement. This technique can be understood as an abstraction of the well-known two-tier deembedding scheme used in test-fixture characterization. The applications ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33081

26. Characteristic Impedance Measurement of Planar Transmission Lines
Topic: Microwave Measurement Services
Published: 8/17/2002
Authors: Uwe Arz, Dylan F Williams, Hartmut Grabinski
Abstract: In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines like CPW and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33080

27. Developing Frequency-Domain Models for Nonlinear Circuits Based on Large-Signal Measurements
Topic: Microwave Measurement Services
Published: 8/17/2002
Authors: Jeffrey A Jargon, Kuldip Gupta, Dominique Schreurs, Donald C. DeGroot
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30828

28. Simulations of Noise-Parameter Uncertainties
Topic: Microwave Measurement Services
Published: 6/7/2002
Author: James Paul Randa
Abstract: This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlyin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24469

29. Vector Corrected Noise Temperature Measurements
Topic: Microwave Measurement Services
Published: 6/7/2002
Authors: Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James Paul Randa
Abstract: A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using iso ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=954

30. Repeat Measurements and Metrics for Nonlinear Model Development
Topic: Microwave Measurement Services
Published: 6/6/2002
Authors: Catherine A Remley, Jeffrey A Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
Abstract: We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30001



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