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Topic Area: Microwave Measurement Services
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Displaying records 11 to 20 of 86 records.
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Topic: Microwave Measurement Services
Published: 7/30/2010
Authors: Dazhen Gu, Amanda Cox, Derek Anderson Houtz, David K Walker, James Paul Randa, Robert L Billinger
Abstract: We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at varia ...

12. COMPARISON OF NEAR-FIELD METHODS AT NIST K. MacReynolds, M.H. Francis and D. Tamura
Topic: Microwave Measurement Services
Published: 7/14/2010
Authors: Katherine MacReynolds, Michael H Francis, Douglas T. Tamura
Abstract: A comparison of the planar, spherical and cylindrical near-field techniques was completed at the National Institute of Standards and Technology (NIST) for a Ku-band Cassegrain reflector antenna. This paper discusses the measurement results for the ...

13. Comparison of Large-Signal-Network-Analyzer Calibrations
Topic: Microwave Measurement Services
Published: 2/5/2010
Authors: Dylan F Williams, Catherine A Remley, Joe Gering, Grand Aivazian
Abstract: We develop a procedure and metrics for comparing large-signal-network-analyzer calibrations. The metrics we develop provide a bound on differences between measurements obtained from large-signal-network-analyzer calibrations, as well as more specific ...

14. NISTeVerify: A fully electronic vector-network-analyzer verification system
Topic: Microwave Measurement Services
Published: 10/1/2009
Authors: Dylan F Williams, Arkadiusz C. (Arkadiusz) Lewandowski, Denis X LeGolvan, Ronald A Ginley
Abstract: The National Institute of Standards and Technology (NIST) has just introduced a fully electronic measurement verification system for microwave vector-network-analyzer (VNA) calibrations called NISTeVerify. The system allows you to quickly verify VNA ...

15. Wideband measurement of extreme impedance with a multistate reflectometer
Topic: Microwave Measurement Services
Published: 12/12/2008
Authors: Arkadiusz C. (Arkadiusz) Lewandowski, Denis X LeGolvan, Ronald A Ginley, Thomas M Wallis, Atif Imtiaz, Pavel Kabos
Abstract: Abstract: We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We ...

16. Recommended Terminology For Microwave Radiometry
Series: Technical Note (NIST TN)
Topic: Microwave Measurement Services
Published: 8/1/2008
Authors: James Paul Randa, Janne Lahtinen, Adriano Camps, A. Gasiewski, Martti Hallikainen, David Leine V, Manuel Martin-Neira, Jeff Piepmeier, Philip Rosenkranz, Christopher Ruf, James Shiue, Niels Skou
Abstract: We present recommended definitions for common terms in microwave remote-sensing radiometry. Terms are grouped into three chapters: General Terminology, Real-Aperture Radiometers, and Polarimetric Radiometry. AN alphabetical index lists the terms t ...

17. Noise-parameter measurement with automated variable terminations
Topic: Microwave Measurement Services
Published: 6/8/2008
Authors: Dazhen Gu, David K Walker, James Paul Randa
Abstract: NIST has upgraded its measurement capability of noise parameters on low-noise amplifiers with a variable termination unit in the 1 to 12.4 GHz range. Such a unit allows improved time efficiency in the noise-temperature measurements used to de-embed n ...

Topic: Microwave Measurement Services
Published: 11/30/2007
Authors: James Paul Randa, Ken Wong, Roger Pollard
Abstract: Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the DUT) and then mea ...

19. NIST Microwave Scattering Parameter and Power Measurement Services
Topic: Microwave Measurement Services
Published: 9/30/2007
Author: Ronald A Ginley
Abstract: This paper describes the microwave scattering parameter (s-parameter) and power measurement services available at NIST. This includes what is measured in each of the services, the techniques used for both calibration of the systems and subsequent mea ...

20. Microwave-Mixer Measurement with a Sampling Oscilloscope
Topic: Microwave Measurement Services
Published: 3/1/2006
Authors: Dylan F Williams, Hassen Khenissi, Fabien Ndagijimana, Catherine A Remley, Joel Dunsmore, Paul D Hale, Jack Wang, Tracy S. Clement
Abstract: We describe a straightforward method of separately characterizing up-conversion and down-conversion in microwave mixers with a sampling oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time ...

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