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Displaying records 11 to 20 of 34 records.
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11. An Investigation of Antenna Characterization Techniques in Microwave Remote Sensing Calibrations
Topic: Microwave Measurement Services
Published: 7/22/2012
Authors: Derek Anderson Houtz, Dazhen Gu, David K Walker, James Paul Randa
Abstract: We compare three methods of quantifying illumination efficiency (IE). The ratio IE describes the contribution of energy emitted from a blackbody target to the total energy measured at an antenna aperture in a free-space microwave calibration target r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911454

12. A Genetic Algorithm for Generating RF Circuit Models from Calibrated Broadband Measurements
Topic: Microwave Measurement Services
Published: 12/1/2011
Author: Thomas M Wallis
Abstract: A genetic algorithm has been developed to generate circuit models from calibrated broadband measurements of coaxial and on-wafer devices under test (DUTs). The algorithm randomly builds a population of circuit models from lumped as well as distribute ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909939

13. Microwave Radiometric Standards Development at the U.S. National Institute of Standards and Technology
Topic: Microwave Measurement Services
Published: 12/1/2011
Author: David K Walker
Abstract: NIST‰s stated mission is, ,To promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology in ways that enhance economic security and improve our quality of life.Š NIST offers an extensive range o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910146

14. Nanofibers for RF and Beyond
Topic: Microwave Measurement Services
Published: 12/1/2011
Authors: Thomas M Wallis, Kichul Kim, Pavel Kabos, Dejan Filipovic
Abstract: In order to realize new interconnect concepts based on nanofibers, reliable metrology is required. Given the clock-speeds of integrated circuits in the present as well as the foreseeable future, this metrology must be compatible with radio frequencie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908509

15. NIST's High Frequency Metrology Program: Current Capabilities and Future Directions
Topic: Microwave Measurement Services
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current ec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907842

16. NIST's High Frequency Metrology Programs: Current Capabilities and Future Directions
Topic: Microwave Measurement Services
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: Several core areas are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameter (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic condition ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907843

17. NIST‰s High Frequency Metrology Programs: Current Capabilities and Future Directions
Topic: Microwave Measurement Services
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906809

18. Superconducting multiplexer filter bank for a frequency-selective power limiter
Topic: Microwave Measurement Services
Published: 12/23/2010
Authors: Eduard Rocas, Alberto Padilla, Jordi Mateu, Juan C. Collado Gomez, James C Booth, Juan M. O'Callaghan
Abstract: This work proposes a superconducting multiplexer filter bank configuration to be used as a frequency-selective power limiter. The proposed configuration limits narrowband high power signals without degrading the signal performance in the remainder fr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906233

19. Broadband Measurements of Nanofiber Devices: Repeatability and Random Error Analysis
Topic: Microwave Measurement Services
Published: 11/30/2010
Authors: Thomas M Wallis, Atif A. Imtiaz, SangHyun (Sang-Hyun) Lim, Pavel Kabos, Kichul Kim, Paul Rice, Dejan Filipovic
Abstract: On-wafer, broadband measurements of two-port nanofiber devices were made in order to test the short-term repeatability of a widely used measurement approach that builds on established on-wafer calibration techniques. The test devices used in this stu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907154

20. Contactless Approaches for RF Characterization of Metallic Nanowires
Topic: Microwave Measurement Services
Published: 9/28/2010
Authors: Kichul Kim, Paul Rice, Thomas M Wallis, SangHyun (Sang-Hyun) Lim, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Dejan Filipovic
Abstract: Two approaches for microwave characterization of nanowire (NW) conductivity are described in this paper. To remove the uncertainty associated with contacts, the NWs are either suspended above the center conductor of a coplanar waveguide (CPW) host or ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905930



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