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Displaying records 51 to 54.
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51. Uncertainties in NIST Noise-Temperature Measurements
Series: Technical Note (NIST TN)
Report Number: 1502
Topic: Electromagnetics
Published: 3/1/1998
Author: James Paul Randa
Abstract: Uncertainty analyses are presented for NIST measurements of noise temperature. All systems currently used in NIST calibrations of thermal-noise sources are treated. These include tuned systems for 30 and 60 MHz, coaxial total-power radiometers for 1 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11498

52. Uncertainty Analysis for Noise-Parameter Measurements
Topic: Electromagnetics
Published: 6/8/2008
Author: James Paul Randa
Abstract: A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave repre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32904

53. Uncertainty Analysis for Noise-Parameter Measurements at NIST
Topic: Electromagnetics
Published: 4/9/2009
Author: James Paul Randa
Abstract: The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33026

54. Verification of Noise-Parameter Measurements and Uncertainties
Topic: Electromagnetics
Published: 11/1/2011
Authors: James Paul Randa, Dazhen Gu, David K Walker
Abstract: We propose and implement verification methods for measurements of noise parameters of amplifiers and transistors. Because the verification rests on the comparison of different measurement results, it also serves as a test of the uncertainties. The ve ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904668



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