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Topic Area: Electromagnetics
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Displaying records 981 to 990 of 1000 records.
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981. Resistively-Tapered-Dipole Electric-Field Probes up to 40 GHz
Topic: Electromagnetics
Published: 8/1/1991
Authors: James Paul Randa, Motohisa Kanda, R. D. Orr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3576

982. Resonanct microwave power absorption and relaxation of the energy levels of the molecular nanomagnet Fe^d8^ using superconducting quantum interference device-based magnetometry
Topic: Electromagnetics
Published: 8/15/2005
Authors: Brant Cage, Stephen E Russek, David Zipse, Micah North, Naresh S Dalal
Abstract: Energy levels and saturation of molecular nanomagnet Fe^d8^ crystals were investigated using a 95 and 141 GHz electron paramagnetic resonance (EPR) technique based on a standard superconducting quantum intererence device (SQUID) magnetometer. The tec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31706

983. Results of Planar Near-field Testing with Ultralow SidelobeAntennas
Topic: Electromagnetics
Published: 6/1/1985
Authors: Allen C. Newell, Michael H Francis, D P Kremer, K. R. Grimm
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31038

984. Results of Screened-Room Measurements on NIST Standard Radiators
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5010
Topic: Electromagnetics
Published: 10/1/1993
Authors: Galen H Koepke, James Paul Randa
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16320

985. Reverberation Chamber Measurement Correlation
Topic: Electromagnetics
Published: 6/15/2012
Authors: Ryan J. Pirkl, Catherine A Remley, Christian S Lotback Patane
Abstract: This contribution evaluates the utility of several different metrics for studying reverberation chamber measurement correlation. Metrics considered are the autocovariance, the correlation matrix, and two metrics based upon the entropy of the data ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907471

986. Reverberation Chamber Relationships: Corrections and Improvements or Three Wrongs Can (Almost) Make a Right
Topic: Electromagnetics
Published: 8/1/1999
Authors: John M Ladbury, Galen H Koepke
Abstract: We correct a number of errors that have crept into the reverberation-chamber literature over the past several years.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29744

987. Reverberation Chamber Verification Procedures on How to Check if Your Chamber Ain't Broke and Suggestions on How to Fix It If It Is
Topic: Electromagnetics
Published: 8/1/2000
Author: John M Ladbury
Abstract: We present three tests for evaluating the agreement between measurements taken in a reverberation chamber and the expected results given by simple statistical models. We then apply these tests to a chamber that is known to be sub-optimal. We also g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=511

988. Reverberation Chambers Measurements for the Shielding Effectiveness of Advanced Composite Materials
Topic: Electromagnetics
Published: 9/9/2002
Authors: Christopher L Holloway, R. Garzia, John M Ladbury, David Allan Hill, Galen H Koepke
Abstract: The use of advanced composite material (ACM) is drawing considerable attention in recent years as an alternative to metals. In many applications, these materials must have the ability to shield electromagnetic fields. Shielding effectiveness (SE) is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30072

989. Reverberation-Chamber Research - Then and Now: A review of early work and comparison with current understanding
Topic: Electromagnetics
Published: 2/1/2002
Authors: Paolo Corona, John M Ladbury, Gaetano Latmiral
Abstract: The main part of this paper is an English translation (from the original Italian) of an early (1976) paper by P. Corona and G. Latmiral. Alongside this translation is an original critical review of that paper. Much of the current thory, models, and a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33083

990. Reverse Noise Measurement and Use in Device Characterization
Topic: Electromagnetics
Published: 6/10/2006
Authors: James Paul Randa, Tom McKay, Susan L. Sweeney, David K Walker, Lawrence Wagner, David R. Greenberg, Jon Tao, G. Ali Rezvani
Abstract: We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32218



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