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You searched on: Topic Area: Electromagnetics Sorted by: title

Displaying records 11 to 20 of 91 records.
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11. Boundary Effects on the Determination of the Effective Parameters of a Metamaterial from Normal Incidence Reflection and Transmission
Topic: Electromagnetics
Published: 6/1/2011
Authors: Sung Kim, Edward E. Kuester, Christopher L Holloway, James R. Baker-Jarvis, Aaron D. Scher
Abstract: This paper presents a method for the determination of the effective electromagnetic parameters of a metamaterial, taking boundary effects at the interfaces between a conventional material and metamaterial into account. In the technique presented here ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904074

12. Catalogue of Electromagnetic Environment Measurements, 30 to 300 Hz
Report Number: 1507
Topic: Electromagnetics
Published: 2/1/1995
Authors: James Paul Randa, D. Gilliland, W. Gjertson, W. Lauber, M. Mcinerney
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3828

13. Characterization and Applications of On-Wafer Diode Noise Sources
Topic: Electromagnetics
Published: 12/1/1998
Authors: Lawrence P. Dunleavy, James Paul Randa, David K Walker, Robert L. Billinger, John Rice
Abstract: A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5598

14. Characterization of Tissue-Equivalent Materials for High-Frequency Applications (200 MHz to 20 GHz)
Series: Technical Note (NIST TN)
Report Number: 1554
Topic: Electromagnetics
Published: 7/1/2010
Authors: James R. Baker-Jarvis, Sung Kim, Luke Leschallinger, Justin Johnson, Brad Givot
Abstract: The purpose of this report is to summarize the characterization of a number of high-frequency solid, liquid, and semisolid tissue-equivalent materials, from 200 MHz to 20 GHz. Carbon black and liquid mixtures were studied, but were found to be uns ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905167

15. Characterizing a Device's susceptibility to broadband signals: A case study
Topic: Electromagnetics
Published: 8/4/2014
Authors: Jason B Coder, John M Ladbury, David Hunter
Abstract: It is common for electronic devices to be tested for their susceptibility to radiated signals they may be exposed to during their normal operation. A reverberation chamber is well suited to perform this type of testing because it can expose the d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915392

16. Checks of Amplifier Noise-Parameter Measurements
Topic: Electromagnetics
Published: 6/11/2004
Authors: James Paul Randa, David K Walker
Abstract: We propose two verification methods for measurements of noise parameters of amplifiers, particularly low-noise amplifiers (LNAs). One method is a direct measurement of the parameter Trev, the noise temperature from the amplifier input, and the compar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31669

17. Comparison of Adapter Characterization Methods
Topic: Electromagnetics
Published: 12/1/1999
Authors: James Paul Randa, Wojciech Wiatr, Robert L. Billinger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21880

18. Comparison of Electrical Techniques for Magnetization Dynamics Measurements in Micro/Nanoscale Structures
Topic: Electromagnetics
Published: 3/25/2011
Authors: SangHyun S. Lim, Thomas M Wallis, Atif A. Imtiaz, Dazhen Gu, Pavel Kabos, Pavol Krivosik
Abstract: We compared three electrical detection techniques; differential resistance (dV/dI), RF/microwave transmission, and spin rectification measurements for magnetization dynamics in individual patterned sub-micron structures. Different electrical techniqu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906822

19. Comparison of Methods for Adapter Characterization
Topic: Electromagnetics
Published: 6/1/1999
Authors: James Paul Randa, Wojciech Wiatr, Robert L. Billinger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4428

20. Confidence in VNA Measurements ‹ The ARFTG Measurement Comparison Program
Topic: Electromagnetics
Published: 3/14/2011
Author: Ronald A Ginley
Abstract: This paper describes the ARFTG scattering parameter Measurement Comparison Program (MCP) which is supported by NIST. The ARFTG MCP is designed specifically to allow users of vector network analyzers to compare their measurements to those of their pee ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907841



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