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Displaying records 11 to 20 of 87 records.
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11. Catalogue of Electromagnetic Environment Measurements, 30 to 300 Hz
Report Number: 1507
Topic: Electromagnetics
Published: 2/1/1995
Authors: James Paul Randa, D. Gilliland, W. Gjertson, W. Lauber, M. Mcinerney
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3828

12. Characterization and Applications of On-Wafer Diode Noise Sources
Topic: Electromagnetics
Published: 12/1/1998
Authors: Lawrence P. Dunleavy, James Paul Randa, David K Walker, Robert L. Billinger, John Rice
Abstract: A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5598

13. Characterization of Tissue-Equivalent Materials for High-Frequency Applications (200 MHz to 20 GHz)
Series: Technical Note (NIST TN)
Report Number: 1554
Topic: Electromagnetics
Published: 7/1/2010
Authors: James R. Baker-Jarvis, Sung Kim, Luke Leschallinger, Justin Johnson, Brad Givot
Abstract: The purpose of this report is to summarize the characterization of a number of high-frequency solid, liquid, and semisolid tissue-equivalent materials, from 200 MHz to 20 GHz. Carbon black and liquid mixtures were studied, but were found to be uns ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905167

14. Characterizing a Device's susceptibility to broadband signals: A case study
Topic: Electromagnetics
Published: 8/4/2014
Authors: Jason B Coder, John M Ladbury, David Hunter
Abstract: It is common for electronic devices to be tested for their susceptibility to radiated signals they may be exposed to during their normal operation. A reverberation chamber is well suited to perform this type of testing because it can expose the d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915392

15. Checks of Amplifier Noise-Parameter Measurements
Topic: Electromagnetics
Published: 6/11/2004
Authors: James Paul Randa, David K Walker
Abstract: We propose two verification methods for measurements of noise parameters of amplifiers, particularly low-noise amplifiers (LNAs). One method is a direct measurement of the parameter Trev, the noise temperature from the amplifier input, and the compar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31669

16. Comparison of Adapter Characterization Methods
Topic: Electromagnetics
Published: 12/1/1999
Authors: James Paul Randa, Wojciech Wiatr, Robert L. Billinger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21880

17. Comparison of Methods for Adapter Characterization
Topic: Electromagnetics
Published: 6/1/1999
Authors: James Paul Randa, Wojciech Wiatr, Robert L. Billinger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4428

18. Confidence in VNA Measurements ‹ The ARFTG Measurement Comparison Program
Topic: Electromagnetics
Published: 3/14/2011
Author: Ronald A Ginley
Abstract: This paper describes the ARFTG scattering parameter Measurement Comparison Program (MCP) which is supported by NIST. The ARFTG MCP is designed specifically to allow users of vector network analyzers to compare their measurements to those of their pee ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907841

19. Design and Testing of NFRad - A New Noise Measurement System
Series: Technical Note (NIST TN)
Report Number: 1518
Topic: Electromagnetics
Published: 3/1/2000
Authors: Chriss A. Grosvenor, James Paul Randa, Robert L. Billinger
Abstract: The NIST Noise project has constructed and tested a new, automated, coaxial (GPC-7) radiometer for the measurement of noise sources in the 8-12 GHz frequency band. It is an isolated, total-power radiometer that relies on lookup tables for relevant re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6264

20. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Electromagnetics
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian J Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011



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