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Displaying records 31 to 40 of 53 records.
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31. Reverse Noise Measurement and Use in Device Characterization
Topic: Electromagnetics
Published: 6/10/2006
Authors: James Paul Randa, Tom McKay, Susan L. Sweeney, David K Walker, Lawrence Wagner, David R. Greenberg, Jon Tao, G. Ali Rezvani
Abstract: We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32218

32. Precision Measurement Method for Cryogenic Amplifier Noise Temperatures Below 5 K
Topic: Electromagnetics
Published: 3/1/2006
Authors: James Paul Randa, Eyal Gerecht, Dazhen Gu, Robert L. Billinger
Abstract: We report precision measurements of the effective input noise temperature of a cryogenic (liquid helium temperature) MMIC amplifier at the amplifier reference planes within the cryostat. A method is given for characterizing and removing the effect of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32017

33. INTER-LABORATORY COMPARISON OF NOISE-PARAMETER MEASUREMENTS ON CMOS DEVICES WITH 0.12 um GATE LENGTH
Topic: Electromagnetics
Published: 12/1/2005
Authors: James Paul Randa, Susan L. Sweeney, Tom McKay, David K Walker, David R. Greenberg, Jon Tao, Judah Mendez, G. Ali Rezvani, John J. Pekarik
Abstract: We present results of an interlaboratory comparison of S-parameter and noise-parameter measurements performed on 0.12 {mu}m gate-length CMOS transistors. Copies of the same device were measured at three different laboratories (IBM, NIST, RFMD), and t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32120

34. Checks of Amplifier Noise-Parameter Measurements
Topic: Electromagnetics
Published: 6/11/2004
Authors: James Paul Randa, David K Walker
Abstract: We propose two verification methods for measurements of noise parameters of amplifiers, particularly low-noise amplifiers (LNAs). One method is a direct measurement of the parameter Trev, the noise temperature from the amplifier input, and the compar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31669

35. Monte Carlo Simulation of Noise Parameter Uncertainties
Topic: Electromagnetics
Published: 11/1/2002
Authors: James Paul Randa, Wojciech Wiatr
Abstract: We present results for uncertainties in noise-parameter measurements, obtained using a Monte Carlo simulation of the measurements. Sets of data were generated to simulate measurements on a low-noise amplifier, with given uncertainties in the underlyi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12549

36. Noise-Parameter Uncertainties: A Monte Carlo Simulation
Series: Journal of Research (NIST JRES)
Topic: Electromagnetics
Published: 10/1/2002
Author: James Paul Randa
Abstract: This paper reports the formulation and results of a Monte Carlo study of uncertainties in noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33085

37. Noise Parameter Uncertainties from Monte Carlo Simulations
Topic: Electromagnetics
Published: 11/8/2001
Authors: James Paul Randa, Wojciech Wiatr
Abstract: We present results for uncertainties in noise-parameter measurements, obtained using a Monte Carlo simulation of the measurements. Sets of data were generated to simulate measurements on a low-noise amplifier, with given uncertainties in the underlyi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16620

38. Noise Characterization of Multiport Amplifiers
Topic: Electromagnetics
Published: 10/1/2001
Author: James Paul Randa
Abstract: I address the issue of the definition and measurement of noise figure and parameters to characterize multiport devices, particularly differential amplifiers. A parameterization in terms of the noise matrix appears to be the most practical. the noise ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5219

39. Stability Measurements on Noise Sources
Topic: Electromagnetics
Published: 4/1/2001
Authors: James Paul Randa, L. A. Terrell, Lawrence P. Dunleavy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3392

40. International Comparison, Final Summary Report
Topic: Electromagnetics
Published: 11/1/2000
Author: James Paul Randa
Abstract: An international comparison of noise temperature of coaxial (GPC-7) sources at 2 GHz, 4 GHz and 12 GHz has been completed. Participating laboratories included the Physikalisch-Technische Bundesanstalt (PTB); the Bureau National de Metrologie-Laborato ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29776



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