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Displaying records 21 to 30 of 54 records.
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21. Impact of RF Interference between a Passive RFID System and a Frequency Hopping Communications System in the 900 MHz ISM Band
Topic: Electromagnetics
Published: 7/25/2010
Author: Michael R Souryal
Abstract: We present experimental measurements and analysis of RF interference between a passive RFID system and a generic frequency hopping communications system in the 902 928 MHz ISM radio band. Interference in both directions is considered, RFID to communi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904764

22. Characterization of Tissue-Equivalent Materials for High-Frequency Applications (200 MHz to 20 GHz)
Series: Technical Note (NIST TN)
Report Number: 1554
Topic: Electromagnetics
Published: 7/1/2010
Authors: James R. Baker-Jarvis, Sung Kim, Luke Leschallinger, Justin Johnson, Brad Givot
Abstract: The purpose of this report is to summarize the characterization of a number of high-frequency solid, liquid, and semisolid tissue-equivalent materials, from 200 MHz to 20 GHz. Carbon black and liquid mixtures were studied, but were found to be uns ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905167

23. High-Frequency Dielectric Measurements: A Tutorial
Topic: Electromagnetics
Published: 4/1/2010
Authors: James R. Baker-Jarvis, Michael D Janezic, Donald C. DeGroot
Abstract: KNOWLEDGE of the response of materials to electromagnetic (EM) fields in the frequency range of radio frequency (RF) through terahertz (THz) is critical to numerous research projects and electronic product development activities. Electromagnetic wave ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904207

24. Transport in Electromagnetic Metrology Based on Nonequilibrium Statistical Mechanics
Topic: Electromagnetics
Published: 11/3/2009
Authors: James R. Baker-Jarvis, Jack T Surek
Abstract: Current research is probing transport on ever smaller scales. Modeling of the electromagnetic interaction with nanoparticles or small collections of dipoles and its associated the energy transport and nonequilibrium characteristics requires a deta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902856

25. Uncertainty Analysis for Noise-Parameter Measurements at NIST
Topic: Electromagnetics
Published: 4/9/2009
Author: James Paul Randa
Abstract: The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33026

26. EEEL Technical Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7568
Topic: Electromagnetics
Published: 3/30/2009
Author: Erik M Secula
Abstract: This document describes the technical work of the Electronics and Electrical Engineering Laboratory. In this report, you will find that EEEL researchers are developing the world's most advanced sensors, providing advanced gamma ray imagers for astro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901701

27. Uncertainty Analysis for Noise-Parameter Measurements
Topic: Electromagnetics
Published: 6/8/2008
Author: James Paul Randa
Abstract: A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave repre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32904

28. SIMULATIONS OF NOISE-PARAMETER VERIFICATION USING CASCADE WITH ISOLATOR OR MISMATCHED TRANSMISSION LINE
Topic: Electromagnetics
Published: 11/30/2007
Authors: James Paul Randa, Ken Wong, Roger Pollard
Abstract: Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the DUT) and then mea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32814

29. On-Wafer Measurement of Transistor Noise Parameters at NIST
Topic: Electromagnetics
Published: 4/1/2007
Authors: James Paul Randa, David K Walker
Abstract: NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32348

30. On-Wafer Noise-Parameter Measurements at NIST
Topic: Electromagnetics
Published: 7/14/2006
Authors: James Paul Randa, David K Walker
Abstract: NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched tran ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32179



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