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You searched on: Topic Area: Electromagnetics

Displaying records 71 to 76.
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71. Characterization and Applications of On-Wafer Diode Noise Sources
Topic: Electromagnetics
Published: 12/1/1998
Authors: Lawrence P. Dunleavy, James Paul Randa, David K Walker, Robert L. Billinger, John Rice
Abstract: A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.

72. International Comparison of Noise-Temperature Measurements at 2, 4, and 12 GHz
Topic: Electromagnetics
Published: 7/1/1998
Authors: James Paul Randa, J. Achkar, F. I Buchholz, T. Colard, D. Schubert, M. Sinclair, John Rice, G. S. Williams
Abstract: We report results of a recent international comparison of thermal noise-power measurements, performed under the auspices of CIPM/CCE. The noise temperatures of two solid-state sources with GPC-7 connectors were measured at 2, 4, and 12 GHz. All ...

73. Uncertainties in NIST Noise-Temperature Measurements
Series: Technical Note (NIST TN)
Report Number: 1502
Topic: Electromagnetics
Published: 3/1/1998
Author: James Paul Randa
Abstract: Uncertainty analyses are presented for NIST measurements of noise temperature. All systems currently used in NIST calibrations of thermal-noise sources are treated. These include tuned systems for 30 and 60 MHz, coaxial total-power radiometers for 1 ...

74. Noise Temperature Measurements on Wafer
Series: Technical Note (NIST TN)
Report Number: 1390
Topic: Electromagnetics
Published: 3/1/1997
Author: James Paul Randa

75. A Low-Frequency Model for Radio-Frequency Absorber
Series: Journal of Research (NIST JRES)
Topic: Electromagnetics
Published: 6/1/1995
Author: James Paul Randa

76. Catalogue of Electromagnetic Environment Measurements, 30 to 300 Hz
Report Number: 1507
Topic: Electromagnetics
Published: 2/1/1995
Authors: James Paul Randa, D. Gilliland, W. Gjertson, W. Lauber, M. Mcinerney

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