NIST logo

Publications Portal

You searched on: Topic Area: Electromagnetics

Displaying records 81 to 90.
Resort by: Date / Title

81. Comparison of Adapter Characterization Methods
Topic: Electromagnetics
Published: 12/1/1999
Authors: James Paul Randa, Wojciech Wiatr, Robert L. Billinger

82. On-Wafer Measurements of Noise Temperature
Topic: Electromagnetics
Published: 12/1/1999
Authors: James Paul Randa, Robert L. Billinger
Abstract: The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on wafer. This report summarizes the theoretical formulation and describes the design, methods, and results ...

83. Comparison of Methods for Adapter Characterization
Topic: Electromagnetics
Published: 6/1/1999
Authors: James Paul Randa, Wojciech Wiatr, Robert L. Billinger

84. International Comparison of Thermal Noise-Temperature Measurements at 2, 4 and 12 GHz
Topic: Electromagnetics
Published: 4/1/1999
Authors: James Paul Randa, J. Achkar, F. IM Bucholz, T. Colard, John Rice, D. Schubert, M. Sinclair, G. S. Williams

85. Characterization and Applications of On-Wafer Diode Noise Sources
Topic: Electromagnetics
Published: 12/1/1998
Authors: Lawrence P. Dunleavy, James Paul Randa, David K Walker, Robert L. Billinger, John Rice
Abstract: A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.

86. International Comparison of Noise-Temperature Measurements at 2, 4, and 12 GHz
Topic: Electromagnetics
Published: 7/1/1998
Authors: James Paul Randa, J. Achkar, F. I Buchholz, T. Colard, D. Schubert, M. Sinclair, John Rice, G. S. Williams
Abstract: We report results of a recent international comparison of thermal noise-power measurements, performed under the auspices of CIPM/CCE. The noise temperatures of two solid-state sources with GPC-7 connectors were measured at 2, 4, and 12 GHz. All ...

87. Uncertainties in NIST Noise-Temperature Measurements
Series: Technical Note (NIST TN)
Report Number: 1502
Topic: Electromagnetics
Published: 3/1/1998
Author: James Paul Randa
Abstract: Uncertainty analyses are presented for NIST measurements of noise temperature. All systems currently used in NIST calibrations of thermal-noise sources are treated. These include tuned systems for 30 and 60 MHz, coaxial total-power radiometers for 1 ...

88. Noise Temperature Measurements on Wafer
Series: Technical Note (NIST TN)
Report Number: 1390
Topic: Electromagnetics
Published: 3/1/1997
Author: James Paul Randa

89. A Low-Frequency Model for Radio-Frequency Absorber
Series: Journal of Research (NIST JRES)
Topic: Electromagnetics
Published: 6/1/1995
Author: James Paul Randa

90. Catalogue of Electromagnetic Environment Measurements, 30 to 300 Hz
Report Number: 1507
Topic: Electromagnetics
Published: 2/1/1995
Authors: James Paul Randa, D. Gilliland, W. Gjertson, W. Lauber, M. Mcinerney

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series