NIST logo

Publications Portal

You searched on:
Topic Area: Advanced Materials
Sorted by: title

Displaying records 1 to 10 of 31 records.
Resort by: Date / Title

1. A Self-Attenuating Superconducting Transmission Line for Use as a Microwave Power Limiter
Topic: Advanced Materials
Published: 6/1/2003
Authors: James C Booth, David A Rudman, Ronald H. Ono
Abstract: We have designed, fabricated, and tested a microwave power limiter based on high temperature superconductor thin film technology. The signal limiter takes the form of a 50 {Ohm} coplanar waveguide transmission line that is reversibly driven from the ...

2. A Superconducting Microwave Power Limiter for Protection of High-Performance Superconducting Electronics
Topic: Advanced Materials
Published: 7/11/2003
Authors: James C Booth, Kenneth Leong, Susan Schima
Abstract: We report on the development of a microwave power limiter based on high temperature superconductor technology. The power limiter takes the form of a 50 Ω coplanar waveguide transmission line that can be reversibly driven into the normal state as ...

3. Band offsets of atomic-layer-deposited Al2O3 on GaAs and the effects of surface treatment.
Topic: Advanced Materials
Published: 8/27/2008
Authors: Nhan V Nguyen, Oleg A Kirillov, Weirong Jiang, Wenyong Wang, John S Suehle, P. D Ye, Y. Xuan, N. Goel, Kwang-Woo Choi, Wilman Tsai
Abstract: In this letter we report the band offsets of the Al/Al2O3/GaAs structure determined by internal photoemission and spectroscopic ellipsometry.  The energy barrier height at the Al2O3 and sulfur-passivated GaAs interface is found to be 3.0 eV, whi ...

4. Black optical coating for high-power laser measurements from carbon nanotubes and silicate
Topic: Advanced Materials
Published: 1/15/2009
Authors: Christopher L Cromer, Katie Hurst, Xiaoyu X. Li, John H Lehman
Abstract: We describe a coating based on potassium silicate, commonly known as water glass, and multiwall carbon nanotubes. The coating has a high absorbance (0.96 at 1064 nm in wavelength) and a laser damage threshold that is comparable to that of ceramic coa ...

5. Challenges and Opportunities of Organic Electronics
Topic: Advanced Materials
Published: 4/2/2010
Author: Calvin Chan

6. Constraint Effect in Deformation of Copper Interconnect Lines Subjected to Cyclic Joule Heating
Topic: Advanced Materials
Published: 11/26/2007
Authors: David Thomas Read, Roy Howard Geiss, Nicholas Barbosa
Abstract: Using finite element analysis, we calculate the temperature range and the resulting cyclic Von Mises strain resulting from Joule heating, generated by the application of alternating current, applied to specimens representative of commercial copper da ...

7. Demonstration of Impedance Matching Using a mu-Negative (MNG) Metamaterial
Topic: Advanced Materials
Published: 4/14/2009
Authors: Christopher L Holloway, R. B Greegor, C. G Parazzoli, J. A Nielsen, M. H Tanielian, D Vier, S Schultz, Richard Ziolkowski
Abstract: A mu-negative (MNG) metamaterial hemisphere was used to demonstrate impedance matching for a magnetic loop. The metamaterial was comprised of copper spirals deposited on an alumina substrate. The spirals, hemisphere, and magnetic loop were designed ...

8. Description of the Nonlinear Behavior of Superconductors Using a Complex Conductivity
Topic: Advanced Materials
Published: 6/1/2003
Authors: James C Booth, Susan Schima, Donald C. DeGroot
Abstract: The origin of the detrimental nonlinear response in the high Tc superconductor (HTS) microwave devices is currently not well understood. In order to help elucidate the origin of these nonlinear effects, we have performed phase-sensitive measurements ...

9. Designing High-Performance PbS and PbSe Nanocrystal Electronic Devices through Stepwise, Post-Synthesis, Colloidal Atomic Layer Deposition
Topic: Advanced Materials
Published: 2/6/2014
Authors: Soong Ju Oh, Nathaniel E. Berry, Hi-Hyuk Choi, E. Ashley Gaulding, Hangfei Lin, Taejong Paik, Benjamin T. Diroll, Shinichiro Muramoto, Murray B. Christopher, Cherie R. Kagan
Abstract: We report a facile, solution based, post synthetic colloidal atomic layer deposition (PS-cALD) process to engineer the surface stoichiometry and therefore electronic properties of lead chalcogenide nanocrystal (NC) thin films. Using the stepwise and ...

10. Direct Measurement of Intrinsic Dirac Point and Fermi level at Graphene/Oxide interface and Its Band Alignment by Cavity Enhanced Internal Photoemission
Topic: Advanced Materials
Published: 12/17/0012
Authors: Kun Xu, Caifu Zeng, Qin Zhang, Rusen Yan, Peide Ye, Kang Wang, Alan C. Seabaugh, Huili G. Xing, John S Suehle, Curt A Richter, David J Gundlach, Nhan V Nguyen
Abstract: We report the first direct measurement of the Dirac point, the Fermi level, and the work function of graphene by performing internal photoemission measurements on a graphene/SiO2/Si structure with a unique optical-cavity enhanced test structure. ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series