NIST logo

Publications Portal

You searched on:
Topic Area: Standard Reference Data
Sorted by: date

Displaying records 1 to 10 of 18 records.
Resort by: Date / Title


1. Writing Guidelines to Develop an Memorandum of Understanding for Interoperable Automated Fingerprint Identification Systems
Series: Special Publication (NIST SP)
Report Number: 1156
Topic: Standard Reference Data
Published: 5/14/2013
Authors: Susan M Ballou, Michael D Garris, Anthony Clay, Joi Dickerson, Peter T Higgins, Lisa Jackson, Joe Morrissey, Beth Owens, Joe Polski, Janet Hoin, Leo Norton, Melissa K Taylor
Abstract: This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the id ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913325

2. NIST Standard Reference Database 23: Reference Fluid Thermodynamic and Transport Properties-REFPROP, Version 9.1
Series: Natl Std. Ref. Data Series (NIST NSRDS)
Topic: Standard Reference Data
Published: 5/7/2013
Authors: Eric W Lemmon, Marcia L Huber, Mark O McLinden
Abstract: This is a new release of the NIST Standard Reference Database 23, commonly known as REFPROP. Enhancements have been made to most areas of the NIST REFPROP program, including the graphical interface, the Excel spreadsheet, the FORTRAN files (i.e., cor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912382

3. Reference measurements of Hydrogen's Dielectric Permittivity
Topic: Standard Reference Data
Published: 8/10/2009
Authors: James W Schmidt, Michael R Moldover, Eric F. May
Abstract: We used a quasi-spherical cavity resonator to measure the relative dielectric permittivity {epsilon}^dr^ of H^d2^ at frequencies from 2.4 GHz to 7.3 GHz, at pressures up to 6.5 MPa, and at the temperatures 273 K and 293 K. The resonator was calibrat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901652

4. Demonstrating the Comparability of Certified Reference Materials
Topic: Standard Reference Data
Published: 7/24/2009
Authors: David Lee Duewer, Katrice A Lippa, Stephen E Long, Karen E Murphy, Katherine E Sharpless, Lorna Tregoning Sniegoski, Michael James Welch
Abstract: Certified Reference Materials (CRMs) enable the meaningful comparison of measurement results over time and place. When CRMs are used to calibrate or verify the performance of a measurement system, results produced by that system can be related throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901468

5. Spectroscopic Line Parameters of Water Vapor for Rotation-Vibration Transitions near 7180 cm^(-1)
Topic: Standard Reference Data
Published: 5/13/2009
Authors: Daniel Lisak, Daniel K. Havey, Joseph Terence Hodges
Abstract: We present low uncertainty measurements of line parameters for fifteen rotation-vibration transitions of water vapor in the wave number range 7170.27 cm^(-1) to 7183.02 cm^(-1). These experiments incorporated frequency-stabilized cavity ring-down spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901894

6. The Electric And Magnetic Susceptibilities Of Gaseos Oxygen: Comparisons Of New Measurements and Modern Theory
Topic: Standard Reference Data
Published: 9/25/2008
Authors: Michael R Moldover, E May, James W Schmidt
Abstract: We used a cross capacitor to measure the relative dielectric permittivity {epsilon}^dr^ of O^d2^ at 273 K, 293 K, and 323 K and at pressures up to 6.5 MPa. Simultaneously we measured oxygen's complex refractive index {I}n{/I} using a quasi-spheri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832266

7. Shear Thinning Near the Critical Point of Xenon
Topic: Standard Reference Data
Published: 4/17/2008
Authors: Robert F Berg, Michael R Moldover, M Yao, G A Zimmerli
Abstract: We measured shear thinning, a viscosity decrease ordinarily associated with complex liquids, near the critical point of xenon. The data span the range of reduced shear rates: 0.001 < {gamma}{tau} < 700, where {gamma}{tau} is the shear rate scal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830987

8. International Data Series, Cumulative Indexes 1973-2005
Series: Natl Std. Ref. Data Series (NIST NSRDS)
Report Number: 76-2005-1
Topic: Standard Reference Data
Published: 12/30/2005
Authors: James C. Rainwater, Michael Frenkel
Abstract: Cumulative Indexes include Compound-Formula-Name and System-Property Indexes for the period 1973-2005
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50253

9. Characterization of SiGe Bulk Compositional Standards with Electron Probe Microanalysis
Topic: Standard Reference Data
Published: 9/1/2003
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the mic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831299

10. Compositional Homogeneity of Ferroelectric (Pb,La)(Ti,Zr)O-^d3^ Thick Films
Topic: Standard Reference Data
Published: 2/1/2003
Authors: S Bernik, Ryna B. Marinenko, J Holc, Z Samardzija, M Ceh, M Kosec
Abstract: Quantified WDS x-ray element maps were used to characterize active PLZT layers on Pt/PLZT/Al^d2^O^d3^ substrates, one fired at 1050 C and the other at 1150 C. In the layer fired at 1050 C randomly distributed micrometer size compositional irregul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831261



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series