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You searched on: Topic Area: Standard Reference Data

Displaying records 11 to 19.
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11. Compositional Homogeneity of Ferroelectric (Pb,La)(Ti,Zr)O-^d3^ Thick Films
Topic: Standard Reference Data
Published: 2/1/2003
Authors: S Bernik, Ryna B. Marinenko, J Holc, Z Samardzija, M Ceh, M Kosec
Abstract: Quantified WDS x-ray element maps were used to characterize active PLZT layers on Pt/PLZT/Al^d2^O^d3^ substrates, one fired at 1050 C and the other at 1150 C. In the layer fired at 1050 C randomly distributed micrometer size compositional irregul ...

12. NIST Standards for Microanalysis and the Certification Process
Topic: Standard Reference Data
Published: 12/1/2002
Author: Ryna B. Marinenko
Abstract: Procedures for testing research materials for the determination of the extent of within-specimen heterogeneity and between-specimen heterogeneity are described. These procedures, which have been developed and used at NIST in the certification of sev ...

13. Chemical Characterization of Silicon-Germanium Single Crystals - Initial Evaluation of the Extent of Heterogeneity
Topic: Standard Reference Data
Published: 8/1/2002
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Initial heterogeneity testing with the electron microprobe using WDS of three SiGe wafers cut from single-crystal boules of different concentrations (nominally 3.5, 6.5, and 14 atomic % Ge) is described. Random and repeat samplings over the entire s ...

14. Evaluation of a Lead Lanthanum Zirconium Titanate (PLZT) Specimen for use as an Electron Microprobe Reference Material
Topic: Standard Reference Data
Published: 8/1/2001
Authors: Ryna B. Marinenko, Z Samardzija, S Bernik, M Kosec, M Ceh
Abstract: A Lead lanthanum zirconium titanate (PLZT) spec imen was studiedwith the wavelength dispersive electron probe microanalysis (EPMA) todetermine the composition and the extent of microheterogeneity of thematerial. Quantitative analysis of the specimen ...

15. Web-Based Interactive Data Processing: Application to Stable Isotope Metrology
Topic: Standard Reference Data
Published: 8/1/2001
Authors: R Michael Verkouteren, J N. Lee
Abstract: To address a fundamental need in stable isotope metrology, the National Institute of Standards and Technology (NIST) has established a Web-based interactive data processing system accessible through a common gateway interface (CGI) program on the int ...

16. NIST Data Resources for X-Ray Photoelectron Spectroscopy
Topic: Standard Reference Data
Published: 10/1/2000
Author: Cedric John Powell
Abstract: A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an ...

17. NIST 101. Computational Chemistry Comparison and Benchmark Database
Topic: Standard Reference Data
Published: 11/1/1999
Author: Russell D Johnson III
Abstract: The CCCBDB is a collection of experimental and theoretical thermochemical properties for 580 neutral gas-phase species. The goal of the database/website is to provide a benchmark set of molecules and reactions for the evaluation of ab initio computat ...

18. Sicklist Database
Topic: Standard Reference Data
Published: 10/1/1999
Author: Russell D Johnson III
Abstract: This is a database of problems that arise from using a particular ab initio computational method with a particular molecule. It is intended to serve as a guide to prevent people from wasting resources struggling with known problems and to offer solut ...

19. NIST Standard Reference Database 23: NIST Thermodynamic and Transport Properties of Refrigerants and Refrigerant Mixtures-REFPROP, Version 6.0
Series: Natl Std. Ref. Data Series (NIST NSRDS)
Topic: Standard Reference Data
Published: 9/1/1998
Authors: Mark O McLinden, S. A. Klein, Eric W Lemmon, Adele P Peskin

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