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Topic Area: Spectroscopy
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Displaying records 11 to 20 of 114 records.
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11. Characterization of Standard Reference Material 2940, Mn-Ion-Doped Glass, Spectral Correction Standard for Fluorescence
Topic: Spectroscopy
Published: 4/1/2009
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Douglas H. Blackburn, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2940 is a cuvette-shaped, Mn-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance validation of steady-state fluorescence spectrometers. Properties of this stan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832237

12. Characterization of Standard Reference Material 2941, Uranyl-Ion-Doped Glass, Spectral Correction Standard for Fluorescence
Topic: Spectroscopy
Published: 2/1/2008
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Douglas H. Blackburn, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2941 is a cuvette-shaped, uranyl-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance validation of fluorescence spectrometers. Properties of this standard that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830546

13. Charaterization of Standard Reference Material 2943, Cu-Ion-Doped Glass, Spectral Correction Standard for Blue Fluorescence
Topic: Spectroscopy
Published: 12/1/2011
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Jeffrey R. Anderson, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2943 is a cuvette-shaped, Cu0ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance verification of steady-state florescence spectrometers. Properties of this st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907361

14. Chirped-pulse terahertz spectroscopy for broadband trace gas sensing
Topic: Spectroscopy
Published: 4/22/2011
Authors: Eyal Gerecht, Kevin O Douglass, David F Plusquellic
Abstract: We report the first demonstration of a broadband trace gas sensor based on chirp-pulse terahertz spectroscopy. The advent of newly developed solid state sources and heterodyne detectors for the terahertz frequency range have made it possible to gener ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907773

15. Combined Spectroscopic Ellipsometry and Voltammetry of Tetradecylmethyl-viologen Films on Gold
Topic: Spectroscopy
Published: 10/27/1998
Authors: Vytautas Reipa, H G Monbouquette, V L. Vilker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100602

16. Comparison of Backbone Dynamics of Oxidized and Reduced Putidaredoxin by ^u15^N NMR Relaxation Measurements
Topic: Spectroscopy
Published: 8/3/1999
Authors: Fahriye Nese Sari, Marcia J Holden, M P. Mayhew, V L. Vilker, B Coxon
Abstract: The backbone dynamics of uniformly ^u15^N-labeled reduced and oxidized putidaredoxin (Pdx) have been studied by 2D ^u15^N NMR relaxation measurements. ^u15^N T^d1^ and T^d2^ values and ^u1^H-^u15^N NOE s have been measured for the diamagnetic region ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830085

17. Comparisons of Calculated and Measured Effective Attenuation Lengths for Silicon Dioxide Over a Wide Electron Energy Range
Topic: Spectroscopy
Published: 8/1/2001
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We report calculations of effective attenuation lengths (EALs) for Si 2p photoelectrons in silicon dioxide at photoelectron energies between 82 and 1385 eV. These EALs are compared with measured values reported recently by Shimada et al. [Surf. Inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831218

18. Compton Scattering Artifacts in Electron Excited X-ray Spectra Measured with a Silicon Drift Detector
Topic: Spectroscopy
Published: 12/1/2011
Authors: Nicholas W m Ritchie, Dale E Newbury, Abigail P. Lindstrom
Abstract: Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive x-ray spectrometry. Peaks which result from non-ideal behavior in the detector or sample can fool even an experience microanalyst into believing that they have ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907003

19. Controlling Thermochromism in a Photonic Block Copolymer Gel
Topic: Spectroscopy
Published: 9/26/2012
Authors: Joseph J Walish, Yin Fan , Andrea Centrone, Edwin L. Thomas
Abstract: Controlling the color via temperature-induced changes of self-assembled photonic materials is important for their application in sensors and displays. The thermochromic behavior of a PS-P2VP photonic gel was studied (UV-VIS, FTIR) and found to origin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910499

20. Current Projects of ISO Technical Committee 201 on Surface Chemical Analysis
Topic: Spectroscopy
Published: 2/1/2001
Author: Cedric John Powell
Abstract: An overview is given of current work projects of Technical Committee 201 on Surface Chemical Analysis of the International Organization for Standardization (ISO). ISTO/TC 201 has subcommittees for Auger electron spectroscopy (AES), secondary ion mas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831198



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