NIST logo

Publications Portal

You searched on:
Topic Area: Spectroscopy
Sorted by: title

Displaying records 91 to 100 of 109 records.
Resort by: Date / Title

91. Spectrum Simulation in DTSA-II
Report Number: 832430
Topic: Spectroscopy
Published: 10/1/2009
Author: Nicholas W m Ritchie
Abstract: Spectrum simulation is a useful practical and pedagogical tool. Particularly with complex samples or trace constituents, a simulation can help to understand the limits of the technique and how to optimize the tools for the optimal measurement. DTSA- ...

92. Standard Photoacoustic Spectrometer: Model and Validation using O2 A-Band Spectra
Topic: Spectroscopy
Published: 6/30/2010
Authors: Keith A Gillis, Daniel K. Havey, Joseph Terence Hodges
Abstract: We model and measure the absolute response of an intensity-modulated photoacoustic spectrometer comprising a 10 cm long resonator and having a {I}Q{/I}-factor of approximately 30. We present a detailed theoretical analysis of the system and predict ...

93. Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy III. Errors With Different Curve-Fitting Approaches
Topic: Spectroscopy
Published: 12/1/2000
Authors: Joseph M Conny, Cedric John Powell
Abstract: We present results in the final part of a three-part of a three-part study employing standard test data (STD) to estimate errors in peak parameters derived from data analysis procedures used in x-ray photoelectron spectroscopy (XPS). XPS-STD are sim ...

94. Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy: II. Peak Intensities
Topic: Spectroscopy
Published: 7/1/2000
Authors: Joseph M Conny, Cedric John Powell
Abstract: Standard test data for x-ray photoelectron spectroscopy (XPS-STD) have been developed for determining bias and random error in peak parameters derived from curve fitting in XPS. The XPS-STD are simulated C 1s spectra from spline polynomial models of ...

95. Stark Spectroscopy of Tryptamine Immobilized on a Gold Electrode
Topic: Spectroscopy
Published: 7/15/1998
Authors: Adolfas Kastytis Gaigalas, Vytautas Reipa, G. Niaura

96. Structural Alterations of the Heme Environment of Cytochrome P450cam and the Y96F Mutant as Deduced by Resonance Raman Spectroscopy
Topic: Spectroscopy
Published: 1/1/2003
Authors: G Niaura, Vytautas Reipa, M P. Mayhew, Marcia J Holden, V L. Vilker
Abstract: Resonance Raman spectroscopy at 2.5 cm-1 resolution was used to probe differences in wild type and Y96F mutant P450cam (CYP101), both with and without bound camphor or styrene substrates. In the substrate-free state, the spin state equilibrium is sh ...

97. Structure of Polystyrene at the Interface With Various Liquids
Topic: Spectroscopy
Published: 9/4/2004
Authors: Clayton S. Yang, P T. Wilson, Lee J Richter
Abstract: Vibrationally resonant sum frequency generation (VR-SFG) is used to determine the structure of the phenyl side groups of deuterated polystyrene at the liquid/solid interface for the nonsolvent liquids: hexane, methanol, ethanol, glycerol, and water. ...

98. Surface Sensitive Raman Microscopy with Total Internal Reflection Illumination
Topic: Spectroscopy
Published: 1/27/2010
Author: Chris A Michaels
Abstract: A Raman microscope utilizing a total internal reflection (TIR), annular illumination geometry through a ZnSe solid immersion lens (SIL) is described. Spectra of a thin film sample of the transparent organic conductor poly(3,4-ethylenedioxythiophene) ...

99. Surface-enhanced Raman spectroscopy of phosphate anions: Adsorption on silver, gold, and copper electrodes
Topic: Spectroscopy
Published: 11/6/1997
Authors: G Niaura, Adolfas Kastytis Gaigalas, V L. Vilker

100. Temperature-induced structural changes in putidaredoxin: a circular dichroism and UV-VIS absorption study
Topic: Spectroscopy
Published: 6/1/2004
Authors: Vytautas Reipa, Marcia J Holden, M P. Mayhew, V L. Vilker

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series