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You searched on: Topic Area: Spectroscopy Sorted by: date

Displaying records 71 to 80 of 94 records.
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71. High-Resolution Cavity Ring-Down Spectroscopy of H216O at 10687.36 cm-1
Topic: Spectroscopy
Published: 2/11/2004
Author: Joseph Terence Hodges
Abstract: We describe a frequency-stabilized cavity ring-down spectroscopy apparatus enabling high-resolution line shape measurements of water vapor. The measured line strength and broadening parameter for the H216O transition at 10687.36 cm-1 are compared to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830856

72. Grazing Incidence X-Ray Photoelectron Spectroscopy: A Method to Study Gate Dielectric Films on Si
Topic: Spectroscopy
Published: 11/1/2002
Authors: Terrence J Jach, E Landree
Abstract: Grazing Incidence X-ray Photoelectron Spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemistry of ultrathin gate dielectric films. It combines aspects of x-ray reflectivity and convent ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831285

73. On the Application of Quantitative Cavity Ring Down Spectroscopy to Measruements of Line Shapes and Continuum Absorption
Topic: Spectroscopy
Published: 6/7/2002
Authors: J G. Cormier, Joseph Terence Hodges, J R Drummond
Abstract: Cavity ringdown spectroscopy (CRDS) is a highly sensitive spectroscopic technique that has been successfully applied to problems such as trace gas detection and the observation of weak spectra. Despite possessing several intrinsic advantages over oth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830795

74. The NIST Electron Effective-Attenuation-Length Database
Series: OTHER
Topic: Spectroscopy
Published: 2/1/2002
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: The NIST Electron Effective-Attenuation-Length Database provides values of electron effective attenuation lengths (EALs) in solid elements and compounds at selected electron energies between 50 eV and 2,000 eV. The database was designed mainly to pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831244

75. Influence of Elastic-Electron Scattering on Measurements of Sillicon Dioxide Film Thicknesses by X-Ray Photoelectron Spectroscopy
Topic: Spectroscopy
Published: 9/1/2001
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We investigate the systematic error due to neglet of elastic scattering of photoelectrons in measurements of the thicknesses of thin films of SiO^d2^ on Si by x-ray photoelectron spectroscopy (XPS). Calulations were made of substrate Si 2p photoelec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831215

76. Comparisons of Calculated and Measured Effective Attenuation Lengths for Silicon Dioxide Over a Wide Electron Energy Range
Topic: Spectroscopy
Published: 8/1/2001
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We report calculations of effective attenuation lengths (EALs) for Si 2p photoelectrons in silicon dioxide at photoelectron energies between 82 and 1385 eV. These EALs are compared with measured values reported recently by Shimada et al. [Surf. Inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831218

77. Current Projects of ISO Technical Committee 201 on Surface Chemical Analysis
Topic: Spectroscopy
Published: 2/1/2001
Author: Cedric John Powell
Abstract: An overview is given of current work projects of Technical Committee 201 on Surface Chemical Analysis of the International Organization for Standardization (ISO). ISTO/TC 201 has subcommittees for Auger electron spectroscopy (AES), secondary ion mas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831198

78. Characterization of Silicon-Oxynitride Dielectric Thin Films Using Grazing Incidence X-ray Photoelectron Spectroscopy
Topic: Spectroscopy
Published: 1/1/2001
Authors: E Landree, Terrence J Jach, D Brady, A. Karamcheti, J Canterbury, W Chism, A C Diebold
Abstract: To achieve the future goals for logic device dielectric film thickness and composition metrology, a set of well-characterized calibration reference material standards are needed for validating real-time diagnostic techniques used during production. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831214

79. Cytochrome c at Model Membrane Surfaces: Exploration via Second Harmonic Generation - Circular Dichroism and Surface-Enhanced Resonance Raman Spectroscopy
Topic: Spectroscopy
Published: 7/11/2000
Authors: T Petralli-Mallow, Anne L Plant, M Lewis, J Hicks
Abstract: The novel nonlinear optical method second harmonic generation-circular dichroism (SHG-CD) has been used to follow the adsorption and redox properties of a peripheral membrane protein horse heart cytochrome c, adsorbed at several model membrane surfac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830091

80. Evaluation of Electron Inelastic Mean Free Paths for Selected Elements and Compounds
Topic: Spectroscopy
Published: 2/1/2000
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We have performed an evaluation of calculated and measured electron inelastic mean free paths (IMFPs) for selected materials and for electron energies between 50 eV and 10,000 eV. This evaluation is based on IMFPs calculated from experimental optica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831121



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