NIST logo

Publications Portal

You searched on:
Topic Area: Chemical Engineering
Processing
Sorted by: title

Displaying records 21 to 30 of 106 records.
Resort by: Date / Title


21. Determining Uncertainties in Standard Dew/Frost-Point Generators for Humidity Measurements
Topic: Chemical Engineering & Processing
Published: 6/24/1996
Author: P H Huang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100296

22. Doping Effects and Reversibility Studies on Gas-Exposed alpha-Sexithiophene Thin Films
Topic: Chemical Engineering & Processing
Published: 12/25/1998
Authors: C Kendrick, Stephen Semancik
Abstract: Research on the electronic applications of organic semiconductors is growing rapidly, and both polymeric and small molcule organics are being used in the fabrication of LEDs, transistors, and biological/chemical sensors. As a part of the chemical mic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830590

23. Droplet Size Distributions in the Spray From Commercial Fogger Type Pepper Spray Products
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7334
Topic: Chemical Engineering & Processing
Published: 4/1/2008
Authors: Cary Presser, Edward V White, Alim A Fatah
Abstract: This report documents a preliminary investigation of the measurement of droplet sizes in the spray from four commercial fogger type pepper spray products. Droplet sizes were detected over the range of 2 mm to 120 mm by phase Doppler interferometry ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832150

24. Effect of Shape and Orientation on the Performance of Supercritical Water Oxidation
Topic: Chemical Engineering & Processing
Published: 12/1/1997
Author: A. M. Lee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100303

25. Effective Medium Conductivity (Diffusivity) for a Sphere in a Cube Model
Topic: Chemical Engineering & Processing
Published: 1/17/1998
Authors: J J. Pellegrino, Y S Kang, J Tighe, J Portnoy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901987

26. Equilibration Near the Liquid-Vapor Critical Point in Microgravity
Topic: Chemical Engineering & Processing
Published: 1/1/1998
Authors: R A Wilkinson, G A Zimmerli, H Hao, Michael R Moldover, Robert F Berg, W L Johnson, R A Ferrell, R W Gammon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902031

27. Evaluation of Correction Parameters for Elastic-Scattering Effects in Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Topic: Chemical Engineering & Processing
Published: 12/1/1997
Authors: Aleksander Jablonski, C J Well
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100357

28. Evanescent Wave Cavity Ring-Down Spectroscopy for Probing Surface Processes
Topic: Chemical Engineering & Processing
Published: 11/28/1997
Authors: A C. Pipino, Jeffrey W Hudgens, Robert Elliott Huie
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901991

29. Extended Law of Corresponding States and Thermodynamic Properties of Binary Mixtures In and Beyond the Critical Region
Topic: Chemical Engineering & Processing
Published: 12/1/1997
Authors: S B. Kiselev, James C. Rainwater
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901963

30. Feasibility of an Accurate Dynamic Standard for Water Flow
Topic: Chemical Engineering & Processing
Published: 6/1/2010
Authors: Iosif I Shinder, Michael R Moldover
Abstract: We used NIST's primary water flow standard to study the feasibility of accurately determining mass flow rates {I}m{/I}^ddot^ of water "dynamically," that is from the time derivative of the weight {I}W{/I} of the collection tank: {I}m{/I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832344



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series