Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Physics

Displaying records 81 to 90 of 300 records.
Resort by: Date / Title


81. Giant Secondary Grain Growth in Cu Films on Sapphire
Topic: Physics
Published: 8/1/2013
Authors: David L. Miller, Mark W Keller, Justin M Shaw, Katherine P. Rice, Robert R Keller, Kyle M. Diederichsen
Abstract: Single crystal metal films on insulating substrates are attractive for microelectronics and other applications, but they are difficult to achieve on macroscopic length scales. The conventional approach to obtaining such films is epitaxial growth at h ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913924

82. Mode reconstruction of a light field by multi-photon statistics
Topic: Physics
Published: 7/15/2013
Authors: Elizabeth A. Goldschmidt, Fabrizio Piacentini, I. Ruo Berchera, Sergey V Polyakov, Silke Peters, Stefan Kuck, Giorgio Brida, Ivo Pietro Degiovanni, Alan L Migdall, Marco Genovese
Abstract: Knowing the underlying number and structure of occupied modes of a light field plays a crucial role in minimizing loss and decoherence of quantum information. Typically, full characterization of the mode structure involves a series of several separ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913292

83. Spectral responsivity based calibration of photometer and colorimeter standards
Topic: Physics
Published: 6/19/2013
Author: George P Eppeldauer
Abstract: Several new generation transfer- and working-standard illuminance meters and tristimulus colorimeters have been developed at the National Institute of Standards and Technology (NIST) to measure all kinds of light sources with low uncertainty. The spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913528

84. Implementation of generalized quantum measurements for unambiguous discrimination of multiple nonorthogonal coherent states
Topic: Physics
Published: 6/18/2013
Authors: Francisco E. Becerra Chavez, Jingyun Fan, Alan L Migdall
Abstract: Generalized quantum measurements can perform perfect discrimination of nonorthogonal states by allowing for inconclusive results, task which is impossible performing only measurements with definite outcomes. We demonstrate the realization of genera ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912966

85. Classical over-the-barrier model for neutralization of highly charged ions above thin dielectric films
Topic: Physics
Published: 6/3/2013
Authors: Joshua M Pomeroy, Russell Lake, C E Sosolik
Abstract: We apply the classical over-the-barrier model (COB) to charge transfer between highly charged ions (HCIs)and targets consisting of thin dielectric films on metals. Distances for the onset of classically allowed above surface electron capture are ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912480

86. Lattice damage in superconducting microcalorimeter detectors
Topic: Physics
Published: 6/3/2013
Authors: Robert D Horansky, Joel Nathan Ullom, Michael W Rabin
Abstract: There is currently significant interest in using superconducting detectors for measurement of ion kinetic energies. Unprecedented resolution is possible with an order of magnitude improvement over semiconductors. Superconducting detectors are now ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912643

87. Modulated photocurrent spectroscopy of CdTe/CdS solar cells-equivalent circuit analysis
Topic: Physics
Published: 5/20/2013
Authors: Behrang H Hamadani, John F Roller, Kounavis Panagiotis, Nikolai B Zhitenev, David J Gundlach
Abstract: We have used the technique of photocurrent modulated spectroscopy to investigate the dynamic response of charge carrier transport in thin film CdTe/CdS solar cells as a function of light bias and temperature over a broad excitation frequency range. T ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912092

88. A microscene approach to the evaluation of hyperspectral system level performance
Topic: Physics
Published: 5/18/2013
Authors: David W Allen, Ronald Resmini, Christopher Deloye
Abstract: Assessing the ability of a hyperspectral imaging (HSI) system to detect the presence of a substance or to quantify abundance requires an understanding of the many factors in the end-to-end remote sensing scenario from scene to sensor to data expl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913840

89. Controlling the Competition between Optically Induced Ultrafast Spin-Flip Scattering and Spin Transport in Magnetic Multilayers
Topic: Physics
Published: 5/7/2013
Authors: Justin M Shaw, Hans Toya Nembach, Thomas J Silva, Margaret M. Murnane, Henry C. Kapteyn, Martin Aeschlimann, Claus M. Schneider, Emrah Turgut, Stefan Mathias, Patrik Grychtol, Chan La-O-Vorakiat, Dennis Rudolf, Roman Adam
Abstract: The study of ultrafast dynamics in magnetic materials provides rich opportunities for greater fundamental understanding of correlated phenomena in solid-state matter, because many of the basic microscopic mechanisms involved are as-yet unclear and ar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912515

90. Demonstrating a High Symmetric Single-Photon Heralding Efficiency in Spontaneous Parametric Downconversion
Topic: Physics
Published: 5/6/2013
Authors: Marcelo Pereira, Francisco E. Becerra Chavez, Boris L. Glebov, Jingyun Fan, Sae Woo Nam, Alan L Migdall
Abstract: We demonstrate a symmetric, single-spatial mode, single-photon heralding efficiency of 84% for a type-II spontaneous parametric downconversion process. This achievement of high efficiency, single-spatial mode collection is key to enabling many quantu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913209



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series