Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Physics

Displaying records 71 to 80 of 300 records.
Resort by: Date / Title


71. Absolute line intensities for the nu3 band of oxirane (C2H4O)
Topic: Physics
Published: 11/15/2013
Authors: Walter Joseph Lafferty, Jean-Marie Flaud, Fridolin Kwabia, A. Perrin, M. Ngom
Abstract: Seven Fourier transform spectra of the ν3 band of oxirane (ethylene oxide) have been recorded with different pressures and used to derive individual line intensities. These line intensities were satisfactorily fit leading to accurate transition ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911937

72. Electron Energy Loss Function of Silicene and Germanene Multilayers on Silver
Topic: Physics
Published: 11/4/2013
Authors: Anna L. Rast, Vinod K Tewary
Abstract: We calculate electron energy loss spectra (EELS) for composite plasmonic structures based on silicene and germanene. A continued-fraction expression for the effective dielectric function is used to perform multiscale calculations of EELS for both ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914666

73. Novel methods for in situ characterization of individual micro- and nanoscale magnetic particles
Topic: Physics
Published: 11/1/2013
Authors: John M Moreland, Yoshihiro (Yoshihiro) Nakashima, Jacob W. (Jacob) Alldredge, Gary Zabow
Abstract: New instrumentation is being developed to better understand the in vivo properties of magnetic particles suspended in solution or lodged in tissue. We describe three novel methods with the necessary sensitivity to measure the microscopic magnetic pro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913526

74. Time Required to Injection-Lock Spin Torque Nanoscale Oscillators
Topic: Physics
Published: 10/29/2013
Authors: William H Rippard, Matthew R Pufall, Anthony B Kos
Abstract: We have injection-locked a spin-transfer oscillator to a second-harmonic electrical input signal and measured the relative phase and amplitude of the device output as a function of DC current under steady-state conditions. The relative phase of the d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912422

75. Imaging topological edge states in silicon photonics
Topic: Physics
Published: 10/20/2013
Authors: Mohammad Hafezi, Jingyun Fan, Alan L Migdall, Jacob M Taylor
Abstract: Systems with topological oder exhibit exotic phenomena including fractional statistics. While most systems with topological order have been electronic, advances in our understanding of synthetic gauge fields have enabled realization of to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912922

76. EUV-Driven Carbonaceous Film Deposition and Its Photo-oxidation on a TiO2 Film Surface
Topic: Physics
Published: 9/23/2013
Authors: Nadir S. Faradzhev, Monica McEntee, John Yate, Shannon Bradley Hill, Thomas B Lucatorto
Abstract: We report the photo-deposition of a carbonaceous layer grown on a TiO2 thin film by EUV radiation-induced chemistry of adsorbed n-tetradecane and the subsequent photo-oxidation of this film. It is found by chemical analysis of the C layer that irradi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913704

77. Development of in-situ calibration method for current-to-voltage converters for high-accuracy SI-traceable low-DC-current measurements
Topic: Physics
Published: 9/20/2013
Authors: George P Eppeldauer, Howard W Yoon, Dean G Jarrett, Thomas C Larason
Abstract: For photocurrent measurements with low uncertainties, wide-dynamic range reference current-to-voltage converters and a new converter calibration method have been developed at the National Institute of Standards and Technology (NIST). The high feedba ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914149

78. Reply to "Comment on: 'Ultrafast Demagnetization Measurements Using Extreme Ultraviolet Light: Comparison of Electronic and Magnetic Contributions'Š
Topic: Physics
Published: 9/4/2013
Authors: Justin M Shaw, Thomas J Silva, Hans Toya Nembach, Emrah Turgut, Patrik Grychtol, Chan La-O-Vorakiat, Henry Kapteyn, Margaret M. Murnane, Stefan Mathias, Martin Aeschlimann, Claus Schneider, Daniel E. Adams
Abstract: In the following, we show that the conclusions of our article titled "Ultrafast Demagnetization Measurements Using Extreme Ultraviolet Light: Comparison of Electronic and Magnetic Contributions" are correct. The Comment of Vodungbo {I}et al.{/I} arg ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913783

79. Detection of l-C3H+ in Sgr B2(N) and Sgr B2(OH) and Refinement of its Spectroscopic Constants via the Publicly Available PRIMOS Survey and the Barry E. Turner Legacy Survey
Topic: Physics
Published: 9/1/2013
Authors: Francis John Lovas, Brett A. McGuire, P. Brandon Carroll, Ryan A. Loomis, Geoffery A. Blake, Jan M. Hollis, Phillip R. Jewell, Anthony J. Remijan
Abstract: Pety et al. (2012) recently reported the detection and assignment of l-C3H+ in the Horsehead nebula. Here, we expand that analysis to include the J = 1 - 0 and J = 2 - 1 transitions of l-C3H+ observed in absorption towards Sgr B2(N) in data from the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913359

80. Report of Special Nuclear Material Validation Measurements for Backpack Type Radiation Detectors
Series: Technical Note (NIST TN)
Report Number: 1808
Topic: Physics
Published: 8/19/2013
Authors: Leticia S Pibida, Christina Ward
Abstract: This report provides results and recommendations from the validation testing for the different source configurations and radiation fields produced by special nuclear materials (SNMs) and depleted uranium (DU) listed within the Technical Capabilit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914345



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series