NIST logo

Publications Portal

You searched on:
Topic Area: Physics

Displaying records 531 to 540 of 762 records.
Resort by: Date / Title

531. Direct Excitation of the Forbidden Clock Transition in Neutral 174Yb Atoms Confined to an Optical Lattice
Topic: Physics
Published: 3/1/2006
Authors: Zeb Barber, C Hoyt, Christopher W Oates, Leo W. Hollberg, A. V. Taichenachev, V. I. Yudin
Abstract: We report direct single laser excitation of the strictly forbidden (6s^u2^) ^s1S_0-(6s6p)^^u3^P_0 clock transition in the even 174Yb isotope confiend to a 1-D optical lattice. A small (1.2mT) static magnetic field is used to induce a non-zero electri ...

532. Simple Spectral Stray Light Correction Method for Array Spectroradiometers
Topic: Physics
Published: 2/20/2006
Authors: Yuqin Zong, Steven W Brown, Bettye C Johnson, Keith R Lykke, Yoshihiro Ohno
Abstract: In many applications, the measurement accuracy of spectroradiometers, particularly instruments with a single dispersive element, is limited by the presence of stray radiation within the instrument. A simple, practical method has been developed to co ...

533. Does Anybody Really Know What Time It Is? 24/7/365, Here's How Time Got On Your Best Side
Topic: Physics
Published: 2/1/2006
Author: Michael A Lombardi
Abstract: A magazine article that looks at the history of time signal stations, beginning with the first radio experiments in the 1890's and continuing to the present day. It discusses both shortwave time signal stations, best known for their voice announc ...

534. A Regenerative Frequency Comb
Topic: Physics
Published: 1/1/2006
Authors: Huascar Ascarrunz, F L. Walls, Hati a, Craig W Nelson, David Allan Howe

535. A Summary of Lightpipe Radiation Thermometry Research at NIST
Series: Journal of Research (NIST JRES)
Report Number: 111
Topic: Physics
Published: 1/1/2006
Author: Benjamin K Tsai

536. Transfer Standard Filter Radiometers: Applications to Fundamental Scales
Topic: Physics
Published: 1/1/2006
Authors: George P Eppeldauer, Steven W Brown, Keith R Lykke

537. Rotating-radio-frequency ion traps
Topic: Physics
Published: 10/20/2005
Authors: T Hasegawa, John J Bollinger
Abstract: We propose a new ion trap, the rotating-rf trap, in which motion of a charged particle is described not by Mathieu-type functions but by trigonometric functions. In the rotating-rf trap, a quadrupole electric field confines charged particles, whereas ...

538. Surface-Electrode Architecture for Ion-Trap Quantum Information Processing
Topic: Physics
Published: 9/1/2005
Authors: J Chiaverini, Brad Rodney Blakestad, Joseph Wright Britton, John D. Jost, C. Langer, Dietrich G Leibfried, R Ozeri, David J Wineland
Abstract: We investigate a surface-mounted electrode geometry for miniature linear radio frequency Paul ion traps. The electrodes reside in a single plane on a substrate, and the pseudopotential minimum of the trap is located above the substrate at a distance ...

539. A Polarizable Model for Ethylene Oxide
Topic: Physics
Published: 6/18/2005
Author: Raymond Dale Mountain
Abstract: A series of interaction models for ethylene oxide are developed for use in molecular simulation of the thermal properties of both the gas and liquid phases. While it is possible to develop nonpolarizable models to accurately generate either the gas ...

540. Wavelength References for Optical Interferometry
Topic: Physics
Published: 6/12/2005
Authors: Richard W Fox, Leo W. Hollberg
Abstract: We are exploring air wavelength references useful for interferometry. Femtosecond comb frequency measurements determine mode wavelengths of a stable optical cavity in vacuum, and subsequently a tunable laser is locked to the modes in air.

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series