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You searched on: Topic Area: Nanotechnology Sorted by: date

Displaying records 301 to 310 of 402 records.
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301. Dynamic SIMS Utilizing SF^d5^^u+^ Polyatomic Primary Ion Beams for Drug Delivery Applications
Topic: Nanotechnology
Published: 6/1/2004
Authors: Christine M. Mahoney, S V. Roberson, John G Gillen
Abstract: The behavior of various biodegradable polymer films (e.g. polylactic acid, polyglycolic acid and polycaprolactone) as well as some model drugs (theophylline and 4-acetamidophenol) under dynamic SF^d5^^u+^ primary ion bombardment is explored. A serie ...

302. Relative humidity effects on the determination of elastic properties with atomic force acoustic microscopy
Topic: Nanotechnology
Published: 3/1/2004
Authors: Donna C. Hurley, J Turner
Abstract: We have investigated how ambient humidity can affect quantitative measurements of elastic properties on the nanoscale. Using an emerging technique called atomic force acoustic microscopy (AFAM), two samples were examined: a thin film of fluorosilica ...

303. Membrane Surface Dynamics of DNA-Threaded Nanopores Revealed by Simultaneous Single-Molecule Optical and Ensemble Electrical Recording
Topic: Nanotechnology
Published: 2/3/2004
Authors: E L Chandler, A L Smith, Lisa K Burden, John J Kasianowicz, D L Burden
Abstract: We demonstrate a method for simultaneous real-time electrical and single-molecule optical recordings of the interactions between single-stranded DNA and nanoscopic pores in planar lipid membranes. Electrophysiological techniques are used to measure ...

304. Semiconductor Nanocrystal Probes for Human Metaphase Chromosomes
Topic: Nanotechnology
Published: 2/1/2004
Authors: Yan Xiao, Peter E. Dr. Barker
Abstract: Novel inorganic fluorophores called semiconductor nanocrystals have recently been incorporated into protein, antibody and microbead oligonucleotide detection methods where previously, organic dyes were universally employed. To improve quantitation o ...

305. Nanometrology - FY 2003 Program and Selected Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Topic: Nanotechnology
Published: 12/15/2003
Authors: C M Allocca, Stephen Weil Freiman
Abstract: The emphasis on nanotechnology around the world is leading to the development and commercialization of unique products based upon significantly smaller devices and material ensembles. Materials at the nanoscale in three dimensions (NEMS, MEMS), two ...

306. Value Assignment and Uncertainty Estimation of Selected Light Stable Isotope Reference Materials: RMs 8543-8545, RMs 8562-8564, and RM 8566
Series: Special Publication (NIST SP)
Report Number: 260-149
Topic: Nanotechnology
Published: 12/1/2003
Authors: R Michael Verkouteren, D Klinedinst
Abstract: We report the technical basis for value assignments of several carbon and oxygen stable isotope reference materials distributed by NIST and the International Atomic Energy Agency (IAEA), and make recommendations regarding laboratory practices and fut ...

307. Ferroelectric Phase Transitions in Nano-Scale Chemically Ordered PbSc^d0.5^Nb^d0.5^O^d3^ Using a First-Principles Model Hamiltonian
Topic: Nanotechnology
Published: 7/1/2003
Authors: U Waghmare, Eric J Cockayne, Benjamin P Burton
Abstract: fects of chemical order, disorder, short range order, and anti-phase boundaries on phase transitions and dielectric properties of PBSc^d1/2^Nb^d1/2^O^d3^ are studied through molecular dynamics simulations of a FP model. Simulations of large systems ...

308. Tools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 7/1/2003
Authors: John G Gillen, David S. Bright
Abstract: In this work we demonstrate the use of secondary ion mass spectrometry (SIMS) combined with the Lispix image processing program (Bright 1995) to generate quantitative isotope ratio images from a test sample of a calcium-aluminum rich inclusion (CA ...

309. Isotopic Metrology of Carbon Dioxide. I. Interlaboratory Comparison and Empirical Modeling of Inlet Equilibration Time, Inlet Pressure, and Ion Source Conductance
Topic: Nanotechnology
Published: 6/1/2003
Authors: R Michael Verkouteren, C E Allison, S A Studley, K J Leckrone
Abstract: We report a pilot study of high-precision differential isotopic ratio measurements made on replicate samples of pure carbon dioxide using three instruments of identical manufacture. Measurement protocols were designed to explore the effects of sampl ...

310. Isotopic Metrology of Carbon Dioxide. II. Effects of Ion Source Materials, Conductance Emission, and Accelerating Voltage on Dual-Inlet Cross Contamination
Topic: Nanotechnology
Published: 6/1/2003
Authors: R Michael Verkouteren, S Assonov, D Klinedinst, W Brand
Abstract: We report high-precision isotope carbon dioxide measurements, made before and after ion source modification to gas isotope ratio mass spectrometry (IRMS) instruments. Measurement protocols were designed to explore the effects of ion surce material ...

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