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Topic Area: Nanotechnology
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Displaying records 301 to 310 of 395 records.
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301. Tools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 7/1/2003
Authors: John G Gillen, David S. Bright
Abstract: In this work we demonstrate the use of secondary ion mass spectrometry (SIMS) combined with the Lispix image processing program (Bright 1995) to generate quantitative isotope ratio images from a test sample of a calcium-aluminum rich inclusion (CA ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831237

302. Isotopic Metrology of Carbon Dioxide. I. Interlaboratory Comparison and Empirical Modeling of Inlet Equilibration Time, Inlet Pressure, and Ion Source Conductance
Topic: Nanotechnology
Published: 6/1/2003
Authors: R Michael Verkouteren, C E Allison, S A Studley, K J Leckrone
Abstract: We report a pilot study of high-precision differential isotopic ratio measurements made on replicate samples of pure carbon dioxide using three instruments of identical manufacture. Measurement protocols were designed to explore the effects of sampl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831258

303. Isotopic Metrology of Carbon Dioxide. II. Effects of Ion Source Materials, Conductance Emission, and Accelerating Voltage on Dual-Inlet Cross Contamination
Topic: Nanotechnology
Published: 6/1/2003
Authors: R Michael Verkouteren, S Assonov, D Klinedinst, W Brand
Abstract: We report high-precision isotope carbon dioxide measurements, made before and after ion source modification to gas isotope ratio mass spectrometry (IRMS) instruments. Measurement protocols were designed to explore the effects of ion surce material ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831257

304. Virtual Environment for Manipulating Microscopic Particles with Optical Tweezer
Topic: Nanotechnology
Published: 6/1/2003
Authors: Yong-Gu Lee, Kevin W Lyons, Thomas W LeBrun
Abstract: In this paper, we use virtual reality techniques to define an intuitive interface to a nanoscale manipulation device. This device utilizes optical methods to focus laser light to trap and reposition nano-to-microscopic particles. The underlying physi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822011

305. Implications of Emerging Micro and Nanotechnology
Topic: Nanotechnology
Published: 4/1/2003
Authors: S Brueck, S Picraux, J Belk, Robert Celotta, W Holton, S Janson, W Kuo, D Nagel, P Penz, A Pisano, R Smith, P Stang, G Sutton, W Tolles, R Trew, M. Young
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620546

306. Nist-Led International Collaboration Results in Improved Measurement Technology for Light Stable Isotopes Relevant to Climate Change Research
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 3/1/2003
Author: R Michael Verkouteren
Abstract: Two manuscripts recently have been accepted in RapidCommunications in Mass Spectrometry that detail aninternational collaboration to identify, understand at afundamental level, and correct measurement biasesmanifested in gas isotope ratio mass spectr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831300

307. Diffusion Barrier Cladding in Si/SiGe Resonant Interband Tunneling Diodes and Their Patterned Growth on PMOS Source/Drain Regions
Topic: Nanotechnology
Published: 1/1/2003
Authors: N Jin, A T Rice, P R Berger, P E Thompson, C Rivas, R Lake, S Sudirgo, J J Kempisty, B Curanovic, S L Rommel, K D Hirschman, S K Kurinec, P Chi, David S Simons, S.J. Chung
Abstract: Si/SiGe resonant interband tunnel diodes (RITD) employing delta-doping spikes that demonstrate negative differential resistance (NDR) at room temperature are presented. Efforts have focused on improving the tunnel diode peak-to-valley current ratio ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831272

308. Secondary Ion Mass Spectrometry Using Cluster Primary Ion Beams
Topic: Nanotechnology
Published: 1/1/2003
Authors: John G Gillen, Albert J. Fahey
Abstract: At the National Institute of Standards and Technology (NIST) we have a capability for conducting cluster SIMS experiments on both our ion microscope and TOF-SIMS instruments. This paper will review our recent work on cluster ion source development, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831247

309. Copper Oxide Precipitates in NBS Standard Reference Material 482
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 12/1/2002
Authors: Eric S Windsor, R Carlton, John G Gillen, Scott A Wight, David S. Bright
Abstract: Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831277

310. Fine Particulate Matter Source Attribution for Southeast Texas Using ^u14^C/^u13^C Ratios
Topic: Nanotechnology
Published: 11/1/2002
Authors: K R Lemire, D T Allen, George A Klouda, C. W. Lewis
Abstract: Radiocarbon analyses of fine particulate matter samples collected during the summer of 2000 in southeast Texas indicate that a substantial fraction of the aerosol carbon at an urban/suburban site (27-73%) and at a rural, forested site (45-78%) was mo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831240



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