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You searched on: Topic Area: Nanotechnology

Displaying records 81 to 90 of 197 records.
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81. Characterizing Equilibrium in Epitaxial Growth
Topic: Nanotechnology
Published: 2/20/2012
Authors: Paul N. Patrone, Russel Caflisch, Dionisios Margetis
Abstract: Using a kinetic model of epitaxial growth, we describe how geometry controls kinetic pathways through which external deposition influences the state of a vicinal surface. The state of the surface is determined by three key, adjustable parameters: th ...

82. Quantitative Measurements of the Size Scaling of Linear and Circular DNA in Nanofluidic Slitlike Confinement
Topic: Nanotechnology
Published: 2/14/2012
Authors: Elizabeth A Strychalski, Jon C Geist, Michael Gaitan, Laurie E Locascio, Samuel M Stavis
Abstract: Quantitative size measurements of single linear and circular DNA molecules in nanofluidic slitlike confinement are reported. A novel experimental method using DNA entropophoresis down a nanofluidic staircase implemented comprehensive variation of sl ...

83. Nanometrology Using Through-Focus Scanning Optical Microscopy Method
Topic: Nanotechnology
Published: 12/21/2011
Authors: Ravikiran Attota, Richard M Silver
Abstract: We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is ...

84. Feedback Control of Optically Trapped Particles
Topic: Nanotechnology
Published: 12/17/2011
Authors: Jason John Gorman, Arvind Kumar Balijepalli, Thomas W LeBrun
Abstract: Optical trapping is a method for manipulating micro- and nanoscale particles that is widely used in biophysics and colloid science, among other areas. This method uses optical forces to confine the position of a particle to a localized region, which ...

85. MOSFETs made from GaN nanowires with fully conformal cylindrical gates
Topic: Nanotechnology
Published: 12/2/2011
Authors: Paul Timothy Blanchard, Kristine A Bertness, Todd E Harvey, Aric Warner Sanders, Norman A Sanford, Steven M. George, Dragos Seghete
Abstract: We report novel metal-oxide-semiconductor field effect transistors (MOSFETs) based on individual gallium nitride (GaN) nanowires with fully conformal cylindrical gates. The W/Al^d2^O^d3^ gates were deposited by atomic layer deposition. Reverse-bi ...

86. Spectral Line-by-Line Pulse Shaping of On-Chip Microresonator Frequency Combs
Topic: Nanotechnology
Published: 12/1/2011
Authors: Fahmida Ferdous, Houxun H. Miao, Daniel E. Leaird, Kartik A Srinivasan, Jian Wang, Lei NMN Chen, Leo Tom Varghese, Andrew M Weiner
Abstract: We report, for the first time to the best of our knowledge, spectral phase characterization and line-by-line pulse shaping of an optical frequency comb generated by nonlinear wave mixing in a micro-ring resonator. The comb is compressed to a train o ...

87. Gallium nitride nanowires achieve crystalline perfection
Topic: Nanotechnology
Published: 10/25/2011
Authors: Kristine A Bertness, Norman A Sanford, John B. Schlager
Abstract: A new method of growing a common semiconductor provides an avenue for fabricating perfect crystals in a form that takes advantage of their unique optical, electrical, and mechanical properties.

88. Far-field superfocusing with optical fiber based surface plasmonic lens made of nanoscale concentric annular slits
Topic: Nanotechnology
Published: 9/30/2011
Authors: Yuxiang Liu, Hua Xu, Felix Stief, Nikolai B Zhitenev, Miao Yu
Abstract: We present experimental demonstration of three-dimensional superfocusing by using an optical fiber based surface plasmonic (SP) lens with nanoscale concentric annular slits. To the best of our knowledge, this is the first time that a far-field, sub-d ...

89. Strategies for Nanoscale Contour Metrology using Critical Dimension Atomic Force Microscopy
Topic: Nanotechnology
Published: 9/30/2011
Authors: Ndubuisi George Orji, Ronald G Dixson, Andras Vladar, Michael T Postek
Abstract: Contour metrology is one of the techniques used to verify optical proximity correction (OPC) in lithography models. The use of these methods, which are known as resolution enhancement techniques (RET), are necessitated by the continued decrease in f ...

90. Prototype cantilevers for quantitative lateral force microscopy
Topic: Nanotechnology
Published: 9/27/2011
Authors: Mark Reitsma, Richard Swift Gates, Lawrence H Friedman, Robert Francis Cook
Abstract: Prototype cantilevers that enable quantitative micro- to nano-scale surface force measurements using contact-mode atomic force microscopy (AFM) are presented. The ,HammerheadŠ cantilevers allow precise optical lever system calibrations for cantilever ...

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