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41. Counting on Today's Students
Topic: Math
Published: 9/3/2012
Author: Isabel M Beichl
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911915

42. Deconvolving LADAR Images Of Bar Codes for Construction Site Object Recognition
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7044
Topic: Math
Published: 10/1/2003
Authors: David E. Gilsinn, Geraldine S Cheok, Dianne M O'Leary
Abstract: This report discusses a general approach to reconstructing ground truth intensity images of bar codes that have been distorted by LADAR optics. The first part of this report describes the experimental data collection of several bar code images along ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50685

43. Definite integrals using orthogonality and integral transforms
Topic: Math
Published: 10/19/2012
Authors: Howard S Cohl, Hans Volkmer
Abstract: We obtain definite integrals for products of associated Legendre functions with Bessel functions, associated Legendre functions, and Chebyshev polynomials of the first kind using orthogonality and integral transforms.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911945

44. Design of the DEMO Fusion Reactor Following ITER
Series: Journal of Research (NIST JRES)
Topic: Math
Published: 7/1/2009
Authors: Geoffrey B McFadden, Paul R. Garabedian
Abstract: Runs of the NSTAB equilibrium and stability code show there are many 3D solutions of the advanced tokamak problem subject to axially symmetric boundary conditions. These numerical simulations based on mathematical equations in conservation form predi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902386

45. Determining Mechanical Reliability of Brittle Materials
Topic: Math
Published: 4/18/2013
Authors: Stephen W. Freiman, Jeffrey T Fong
Abstract: The widespread existence of slow crack growth in most glasses and ceramics due to a stress-enhanced reaction between an external environment and strained bonds at a crack tip greatly complicates the challenge of assuring the reliability of components ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910158

46. Dielectric Breakdown in a Simplified Parallel Model
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6174
Topic: Math
Published: 6/1/1998
Authors: H A Fowler, J E Devaney, John G Hagedorn, F Sullivan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900849

47. Discrete Fourier Series Approximation to Periodic Solutions of Autonomous Delay Differential Equations
Topic: Math
Published: 1/2/2006
Author: David E. Gilsinn
Abstract: We begin this expository essay by reviewing with examples what a typical engineer already knows about statistics. We then consider a central question in engineering decision making, i.e., given a computer simulation of high-consequence systems, how ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150014

48. Erratum: Statistical Interpretation of Key Comparison Reference Value and Degrees of Equivalence
Series: Journal of Research (NIST JRES)
Topic: Math
Published: 8/1/2004
Authors: Raghu N Kacker, Raju Vsnu Datla, Albert C Parr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150898

49. Estimating Critical Hopf Bifurcation Parameters for a Second Order DelayDifferential Equation with Application to Machine Tool Chatter
Topic: Math
Published: 5/1/2002
Author: David E. Gilsinn
Abstract: Nonlinear time delay differential equations are well known to have arisen in models in physiology, biology and population dynamics. They have also arisen in models of metal cutting processes. Machine tool chatter, from a process called regenerative c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150815

50. Estimating Fault Detection Effectiveness
Topic: Math
Published: 4/1/2014
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: [Poster] A t-way covering array can detect t-way faults, however they generally include other combinations beyond t-way as well. For example, a particular test set of all 5-way combinations is shown capable of detecting all seeded faults in a test pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915440



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