Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Math

Displaying records 71 to 80 of 106 records.
Resort by: Date / Title


71. Front Matter for Special Issue of NIST Journal of Research in honor of Christoph Witzgall
Series: Journal of Research (NIST JRES)
Topic: Math
Published: 3/31/2006
Authors: David E. Gilsinn, Ronald F Boisvert
Abstract: This front matter for a special issue of the NIST Journal of Research contains a photograph and biography of Christoph Witzgall. It also contains a thank you paragraph by Christoph Witzgall for a symposium held in his honor. Many of the papers in thi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150660

72. Bayesian Alternative to the Guide's Use of the Welch-Satterthwaite Formula
Topic: Math
Published: 1/3/2006
Author: Raghu N Kacker
Abstract: The Guide to the Expression of Uncertainty in Measurement suggests that to account for the statistical uncertainty in a combined standard uncertainty that arises when one or more of its components are evaluated from a limited number of independent no ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150900

73. Discrete Fourier Series Approximation to Periodic Solutions of Autonomous Delay Differential Equations
Topic: Math
Published: 1/2/2006
Author: David E. Gilsinn
Abstract: We begin this expository essay by reviewing with examples what a typical engineer already knows about statistics. We then consider a central question in engineering decision making, i.e., given a computer simulation of high-consequence systems, how ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150014

74. Comparison of ISO-GUM, draft GUM Supplement 1, and Bayesian statistics using simple linear calibration
Topic: Math
Published: 1/1/2006
Authors: Raghu N Kacker, Blaza Toman, Ding Huang
Abstract: We compare three approaches for quantifying uncertainty using a measurement equation: the International Organization for Standardization (ISO) Guide to the Expression of Uncertainty in Measurement (GUM), draft GUM Supplement 1, and Bayesian statistic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150381

75. Response to comments on Statistical analysis of CIPM key comparisons based on the ISO Guide
Topic: Math
Published: 2/15/2005
Authors: Raghu N Kacker, Raju Vsnu Datla, Albert C Parr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150909

76. Pose of I-Beams for Construction Site Automation
Topic: Math
Published: 9/21/2004
Authors: David E. Gilsinn, Geraldine S Cheok, Alan M. (Alan M.) Lytle
Abstract: Automation of construction processes can result in reduced project costs and increased worker safety. A process that lends itself to automation is the picking and placing of objects. However, determining the pose (position and orientation) of an ob ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150893

77. Erratum: Statistical Interpretation of Key Comparison Reference Value and Degrees of Equivalence
Series: Journal of Research (NIST JRES)
Topic: Math
Published: 8/1/2004
Authors: Raghu N Kacker, Raju Vsnu Datla, Albert C Parr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150898

78. Comparative Statistical Analysis of Test Parts Manufactured in Production Environments
Series: NIST Interagency/Internal Report (NISTIR)
Topic: Math
Published: 2/2/2004
Authors: David E. Gilsinn, Alice V. Ling
Abstract: Estimating error uncertainties arising in production parts isnot a well understood process. This study developed an approach to estimatethese uncertainties. Machine tool error components on a vertical turningcenter were measured. Multiple parts were ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150867

79. Approximating Limit Cycles of a Van der Pol Equation with Delay
Topic: Math
Published: 1/15/2004
Author: David E. Gilsinn
Abstract: In this paper a theorem of Stokes is used to establish the existence of a periodic solution of a Van der Pol equation with fixed delay in the neighborhood of an approximating solution that satisfies a certain noncriticality condition.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50684

80. Using Nanoscillatory Splines to Model Urban Environments
Topic: Math
Published: 1/15/2004
Authors: David E. Gilsinn, Marjorie A McClain, Christoph Johann Witzgall
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150887



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series