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1. Chapter 13. Color Quality of White LEDs
Topic: Optical Technology
Published: 5/24/2013
Author: Yoshihiro Ohno
Abstract: This chapter overviews the fundamentals of chromaticity and color rendering as the two important aspects of color quality of light sources for general illumination, with special focus on the use for solid state light sources. The section for chrom ...

2. Cholesterol/Phospholipid Interactions in Hybrid Bilayer Membranes
Topic: Optical Technology
Published: 5/25/2007
Authors: Dustin Levy, Kimberly A Briggman
Abstract: The interactions between cholesterol and saturated phospholipids in hybrid bilayer membranes (HBMs) were investigated using the interface-sensitive technique of vibrational sum frequency spectroscopy (VSFS). The unique sensitivity of VSFS to order/di ...

3. Comparison of laser-based and monochromator-based thermodynamic temperature measurements
Topic: Optical Technology
Published: 3/19/2012
Authors: George P Eppeldauer, Howard W Yoon, Jorge Enrique Neira, Vladimir Khromchenko, Charles E Gibson, Allan W. Smith
Abstract: In this work, we describe the comparisons between the laser-based and monochromator-based radiance responsivity calibrations of a radiation thermometer. The spectral selection of the radiation thermometer is performed using a photopic-response fi ...

4. Development of in-situ calibration method for current-to-voltage converters for high-accuracy SI-traceable low-DC-current measurements
Topic: Optical Technology
Published: 9/20/2013
Authors: George P Eppeldauer, Howard W Yoon, Dean G Jarrett, Thomas C Larason
Abstract: For photocurrent measurements with low uncertainties, wide-dynamic range reference current-to-voltage converters and a new converter calibration method have been developed at the National Institute of Standards and Technology (NIST). The high feedba ...

5. Dimensional Metrology of Lab on a Chip Internal Structures: a Comparison of Optical Coherence Tomography with Coherence Fluorescence Microscopy
Topic: Optical Technology
Published: 4/8/2015
Authors: Darwin R Reyes-Hernandez, Michael W Halter, Jeeseong Hwang
Abstract: The characterization of internal structures in a polymeric device, specifically of a final product, will require a different set of metrology techniques than those traditionally use in the characterization of microelectronic devices. OCT is relative ...

6. Extension of the NIST tristimulus colorimeter for solid-state light source measurements
Topic: Optical Technology
Published: 5/29/2009
Authors: George P Eppeldauer, Carl C Miller, Thomas C Larason, Yoshihiro Ohno
Abstract: In order to obtain improved color measurement uncertainties for solid state light (SSL) sources, the second generation tristimulus colorimeter of NIST has been extended with a fifth channel to perform efficient matrix corrections for the spectral mis ...

7. Harnessing 3D Scattered Optical Fields for sub-20 nm Defect Detection
Topic: Optical Technology
Published: 6/24/2013
Authors: Bryan M Barnes, Martin Y Sohn, Francois R. Goasmat, Hui Zhou, Richard M Silver, Abraham Arceo
Abstract: Experimental imaging at =193 nm of sub-resolved defects performed at several focus positions yields a volume of spatial and intensity data. Defects are located in a differential volume, given a reference, with up to 5x increase in sensitivity ...

8. Hyperspectral Imaging and Analysis of Single Erythrocytes
Topic: Optical Technology
Published: 8/12/2011
Authors: Ji Y. Lee, Matthew Lawrence Clarke, Fuyuki Tokumasu, John F. Lesoine, David W Allen, Robert C. Chang, Maritoni Abatayo Litorja, Jeeseong Hwang
Abstract: We report a hyperspectral imaging and analysis technique to resolve unique physico-chemical characteristics of subcellular substances in single erythrocytes. We constructed a microscope system installed with a spectral light engine capable of contr ...

9. IR-enhanced Si reference detectors for 1-step scale transfers from 300 nm to 1000 nm
Topic: Optical Technology
Published: 11/20/2014
Authors: George P Eppeldauer, Thomas C Larason, Jeanne M Houston, Robert Edward Vest, Uwe Arp, Howard W Yoon
Abstract: IR-enhanced Si photodiodes have improved radiometric and electronic characteristics as compared to other widely used Si photodiodes and can be used as responsivity standards in the wavelength range from 300 nm to 1000 nm. Their low predicted uncerta ...

10. Metrology for Lab-on-a-Chip Final-Product Devices
Topic: Optical Technology
Published: 5/12/2013
Authors: Darwin R Reyes-Hernandez, Michael W Halter, Jeeseong Hwang
Abstract: New metrology tools to measure the critical parameters of internal structures in lab on a chip devices are greatly needed in order to develop standard tests for this technology. Here we present a method that combines a custom made optical coherence ...

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