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Topic Area: Microwave Measurement Services

Displaying records 1 to 10 of 85 records.
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1. Analysis for Dynamic Metrology
Topic: Microwave Measurement Services
Published: 1/30/2014
Authors: Andrew M Dienstfrey, Paul D Hale
Abstract: Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914865

2. The Interaction of Radio-Frequency Fields with Materials at Macroscopic to Mesoscopic Sales
Series: Journal of Research (NIST JRES)
Report Number: 117.001
Topic: Microwave Measurement Services
Published: 2/2/2012
Authors: James R. Baker-Jarvis, Sung Kim
Abstract: The goal of this paper is to overview radio-frequency electromagnetic interactions with solid and liquid dielectric and magnetic materials from the macroscale down to the nanoscale. Because this area of research is vast, the paper concentrates on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906319

3. Calibrated nanoscale dopant profiling using a scanning microwave microscope.
Topic: Microwave Measurement Services
Published: 1/3/2012
Authors: Pavel Kabos, Thomas M Wallis, H P. Hubner, I. Humer, M. Hochleitner, M. Fenner, M. Moertelmaier, C. Rankl, Atif Imtiaz, H. Tanbakuchi, P. Hinterdorfer, J. Smoliner, Joseph J Kopanski, F. Kienberger
Abstract: The scanning microwave microscope (SMM) is used for calibrated capacitance spectroscopy and spatially resolved dopant profiling measurements. It consists of an atomic force microscope (AFM) combined with a vector network analyzer operating between 1- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908761

4. Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports
Topic: Microwave Measurement Services
Published: 1/1/2012
Author: Dylan F Williams
Abstract: We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port impe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909155

5. Microwave generation with low residual phase noise from a femtosecond fiber laser with an intracavity electro-optic modulator
Topic: Microwave Measurement Services
Published: 11/14/2011
Authors: William C Swann, Esther Baumann, Fabrizio Raphael Giorgetta, Nathan Reynolds Newbury
Abstract: Low phase-noise microwave generation has previously been demonstrated using self-referenced frequency combs to divide down a low noise optical reference. We demonstrate an approach based on a fs Er-fiber laser that avoids the complexity of self-refer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909568

6. Microwave near-field probes for photovoltaic applications
Topic: Microwave Measurement Services
Published: 6/19/2011
Author: Joel Calvin Weber
Abstract: The photoresponse of three different photovoltaic Cu(In, Ga)Se^d2^ (CIGS) samples as well as GaAs and silicon bulk samples is measured using near-field scanning microwave microscopy (NSMM). Modeling predicts light-dependent conductivity values fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908757

7. Boundary Effects on the Determination of the Effective Parameters of a Metamaterial from Normal Incidence Reflection and Transmission
Topic: Microwave Measurement Services
Published: 6/1/2011
Authors: Sung Kim, Edward E. Kuester, Christopher L Holloway, James R. Baker-Jarvis, Aaron D. Scher
Abstract: This paper presents a method for the determination of the effective electromagnetic parameters of a metamaterial, taking boundary effects at the interfaces between a conventional material and metamaterial into account. In the technique presented here ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904074

8. NIST's High Frequency Metrology Program: Current Capabilities and Future Directions
Topic: Microwave Measurement Services
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current ec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907842

9. Comparison of Microwave Black-Body Target Radiometric Measurements
Topic: Microwave Measurement Services
Published: 7/30/2010
Authors: David K Walker, Dazhen Gu, Katherine MacReynolds, Randy Direen, James Paul Randa, Amanda Cox, Derek Anderson Houtz, Robert L Billinger
Abstract: Accurate characterization of the brightness temperature (T_B) of black-body targets used for calibrating microwave remote-sensing radiometers includes many inputs: antenna pattern and loss, target temperature, target emissivity, mechanical alignment, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906078

10. REFLECTIVITY STUDIES OF PASSIVE MICROWAVE CALIBRATION TARGETS AND ABSORPTIVE MATERIALS
Topic: Microwave Measurement Services
Published: 7/30/2010
Authors: Dazhen Gu, Amanda Cox, Derek Anderson Houtz, David K Walker, James Paul Randa, Robert L Billinger
Abstract: We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at varia ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906017



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