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You searched on: Topic Area: Microwave Measurement Services

Displaying records 1 to 10 of 35 records.
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1. Millimeter-Wave Near-Field Measurements Using Coordinated Robotics
Topic: Microwave Measurement Services
Published: 12/1/2015
Authors: Joshua A Gordon, David R Novotny, Ronald Curtis Wittmann, Michael H Francis, Miranda Leigh Butler, Jeffrey R Guerrieri
Abstract: The National Institute of Standards and Technology(NIST) recently developed a new robotic scanning system for performing near-field measurements at millimeter-wave (mm-wave)frequencies above 100 GHz, the configurable robotic millimeterwave antenna (C ...

2. On-wafer Magnetic Resonance of Magnetite Nanoparticles
Topic: Microwave Measurement Services
Published: 5/11/2015
Authors: Charles Anderson Enright Little, Stephen E Russek, James C Booth, Pavel Kabos, Robert J. Usselman
Abstract: Magnetic resonance measurements of ferumoxytol and TEMPO were made using an on-wafer transmission line technique with a vector network analyzer, allowing for broadband measurements of small sample volumes (4 nl) and a small numbers of spin (1 nmole). ...

3. Numerical Modelling and the Uncertainty Analysis of Transistor Noise-Parameter Measurements
Topic: Microwave Measurement Services
Published: 12/5/2014
Author: James Paul Randa
Abstract: This paper provides an overview of the use of noise parameters as a numerical model to represent the noise characteristics of transistors, particularly in the context of a Monte Carlo evaluation of the uncertainties in noise-parameter measurements. ...

4. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Microwave Measurement Services
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian J Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...

5. Colored Noise and Regularization Parameter Selection for Waveform Metrology
Topic: Microwave Measurement Services
Published: 7/8/2014
Authors: Andrew M Dienstfrey, Paul D Hale
Abstract: We study six regularization parameter selection algorithms applied to deconvolution problems relevant for characterization of high-speed communication measurement systems. In particular we investigate the performance of these selectors in the presen ...

6. Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope
Topic: Microwave Measurement Services
Published: 7/2/2014
Authors: Atif A. Imtiaz, Thomas M Wallis, Joel C Weber, Kevin J Coakley, Matthew David Brubaker, Paul T Blanchard, Kristine A Bertness, Norman A Sanford
Abstract: We used a broadband, atomic-force-microscope-based, scanning microwave microscope (AFM-SMM) to probe the axial dependence of the depletion in a GaN nanowire (NW) p-n junction structure. The NWs were c-axis oriented and grown by molecular beam epitax ...

7. An Approximate Approach to Determining the Permittivity and Permeability near Lambda/2 Resonances in Transmission/Reflection Measurements
Topic: Microwave Measurement Services
Published: 3/1/2014
Authors: Sung Kim, Michael D. Janezic, James R. Baker-Jarvis
Abstract: We present a simple and straightforward approximate approach to removing resonant artifacts that arise in the material parameters extracted near half-wavelength resonances that arise from transmission/reflection (T/R) measurements on low-loss materia ...

8. Analysis for Dynamic Metrology
Topic: Microwave Measurement Services
Published: 1/30/2014
Authors: Andrew M Dienstfrey, Paul D Hale
Abstract: Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may b ...

9. Near-Field Scaning Microwave Microscope (NSMM)
Topic: Microwave Measurement Services
Published: 12/31/2012
Authors: Atif A. Imtiaz, Thomas M Wallis, Pavel Kabos
Abstract: Electromagnetic waves in the microwave frequency range are an essential tool for the investigation of material and device properties across a broad range of applications. Examples of materials of interest include: ferroelectric materials, ferromagnet ...

10. Full-Wave Analysis of Dielectric-Loaded Cylindrical Waveguides and Cavities Using a New Four-Port Ring Network
Topic: Microwave Measurement Services
Published: 8/31/2012
Authors: Felipe Penaranda-foix, Michael D. Janezic, Jose M. Catala-Civera, Antoni J. Canos-Marin
Abstract: In this paper, a full-wave method for the electromagnetic analysis of dielectric-loaded cylindrical and coaxial waveguides and cavities is developed. For this purpose, a new four-port ring network is proposed, and the mode-matching method is applied ...

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  • SP 250-XX: Calibration Services
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