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You searched on: Topic Area: Microwave Measurement Services

Displaying records 1 to 10 of 88 records.
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1. Scattering of microwaves in thin metallic films near the metal - non-metal transition
Topic: Microwave Measurement Services
Published: 9/15/2014
Author: Jan Obrzut
Abstract: We present measurements demonstrating significant scattering of microwaves in a thin metal films near the metal ‹ non-metal percolation transition. Gold films 3 nm to 12 nm thick were characterized using patterned coplanar waveguides over a frequenc ...

2. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Microwave Measurement Services
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian John Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...

3. Colored Noise and Regularization Parameter Selection for Waveform Metrology
Topic: Microwave Measurement Services
Published: 7/8/2014
Authors: Andrew M Dienstfrey, Paul D Hale
Abstract: We study six regularization parameter selection algorithms applied to deconvolution problems relevant for characterization of high-speed communication measurement systems. In particular we investigate the performance of these selectors in the presen ...

4. Analysis for Dynamic Metrology
Topic: Microwave Measurement Services
Published: 1/30/2014
Authors: Andrew M Dienstfrey, Paul D Hale
Abstract: Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may b ...

5. The Interaction of Radio-Frequency Fields with Materials at Macroscopic to Mesoscopic Sales
Series: Journal of Research (NIST JRES)
Report Number: 117.001
Topic: Microwave Measurement Services
Published: 2/2/2012
Authors: James R. Baker-Jarvis, Sung Kim
Abstract: The goal of this paper is to overview radio-frequency electromagnetic interactions with solid and liquid dielectric and magnetic materials from the macroscale down to the nanoscale. Because this area of research is vast, the paper concentrates on ...

6. Calibrated nanoscale dopant profiling using a scanning microwave microscope.
Topic: Microwave Measurement Services
Published: 1/3/2012
Authors: Pavel Kabos, Thomas M Wallis, H P. Hubner, I. Humer, M. Hochleitner, M. Fenner, M. Moertelmaier, C. Rankl, Atif (Atif) Imtiaz, H. Tanbakuchi, P. Hinterdorfer, J. Smoliner, Joseph J Kopanski, F. Kienberger
Abstract: The scanning microwave microscope (SMM) is used for calibrated capacitance spectroscopy and spatially resolved dopant profiling measurements. It consists of an atomic force microscope (AFM) combined with a vector network analyzer operating between 1- ...

7. Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports
Topic: Microwave Measurement Services
Published: 1/1/2012
Author: Dylan F Williams
Abstract: We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port impe ...

8. Microwave generation with low residual phase noise from a femtosecond fiber laser with an intracavity electro-optic modulator
Topic: Microwave Measurement Services
Published: 11/14/2011
Authors: William C Swann, Esther Baumann, Fabrizio Raphael Giorgetta, Nathan Reynolds Newbury
Abstract: Low phase-noise microwave generation has previously been demonstrated using self-referenced frequency combs to divide down a low noise optical reference. We demonstrate an approach based on a fs Er-fiber laser that avoids the complexity of self-refer ...

9. Microwave near-field probes for photovoltaic applications
Topic: Microwave Measurement Services
Published: 6/19/2011
Author: Joel C. Weber
Abstract: The photoresponse of three different photovoltaic Cu(In, Ga)Se^d2^ (CIGS) samples as well as GaAs and silicon bulk samples is measured using near-field scanning microwave microscopy (NSMM). Modeling predicts light-dependent conductivity values fo ...

10. Boundary Effects on the Determination of the Effective Parameters of a Metamaterial from Normal Incidence Reflection and Transmission
Topic: Microwave Measurement Services
Published: 6/1/2011
Authors: Sung Kim, Edward E. Kuester, Christopher L Holloway, James R. Baker-Jarvis, Aaron D. Scher
Abstract: This paper presents a method for the determination of the effective electromagnetic parameters of a metamaterial, taking boundary effects at the interfaces between a conventional material and metamaterial into account. In the technique presented here ...

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