NIST logo

Publications Portal

You searched on:
Author: Chih-Ming Wang

Displaying records 1 to 10 of 65 records.
Resort by: Date / Title

1. Statistical Sampling of Carbon Nanotube Populations by Thermogravimetric Analysis
Published: 12/25/2013
Authors: Elisabeth Mansfield, Aparna Kar, Chih-Ming Wang, Ann Chiaramonti Chiaramonti Debay
Abstract: Carbon nanotubes are one of the most promising nanomaterials on the market, with applications in electronics devices, sensing, batteries, composites and medical communities. Strict control of the carbon nanotube chemistry and properties is neces ...

2. Baseband Corrections for Precision Millimeter Wave Signal Measurements
Published: 8/12/2013
Authors: Catherine A Remley, Saeed Farsi, Dominique Schreurs, Dylan F Williams, Paul D Hale, Chih-Ming Wang
Abstract: NA

3. A Precision Millimeter-Wave Modulated-Signal Source
Published: 6/6/2013
Authors: Catherine A Remley, Paul D Hale, Dylan F Williams, Chih-Ming Wang
Abstract: We develop and characterize a modulated-signal source for use at millimeter-wave frequencies. Components within the source are phase locked by a 10 GHz reference source to minimize drift and improve synchronization. The complex frequency response of ...

4. Assessing the Effect of Mode-Stirring Method on Uncertainty in Reverberation-Chamber Measurements
Published: 1/14/2013
Authors: Catherine A Remley, Ryan J. Pirkl, Chih-Ming Wang, Haider Shah
Abstract: We develop methods for assessing the standard uncertainty arising from various combinations of mode-stirring methods used in reverberation-chamber measurements. By use of a straightforward measurement-based technique, the combination of mode-stirring ...

5. Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform
Published: 10/1/2012
Authors: Chih-Ming Wang, Paul D Hale, Jeffrey A Jargon, Dylan F Williams, Catherine A Remley
Abstract: We present a procedure for correcting the timebase distortion and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the timebase distortion and jitter sequentially with overlapping measurements and using the informatio ...

6. Pivotal Methods in the Propagation of Distributions
Published: 4/24/2012
Authors: Chih-Ming Wang, Jan Hannig, Hariharan K. (Hariharan K.) Iyer
Abstract: We propose a method for assigning a probability distribution to an input quantity. The distribution is used in the Monte Carlo method for uncertainty evaluation. The proposed method provides an alternative to other methods, such as the principle of m ...

7. Fiducial Prediction Intervals
Published: 2/18/2012
Authors: Chih-Ming Wang, Jan Hannig, Hariharan K. (Hariharan K.) Iyer
Abstract: This paper presents an approach for constructing prediction intervals for any given distribution. The approach is based on the principle of fiducial inference. We use several examples, including the normal, binomial, gamma, and Weibull distributions, ...

8. A statistical study of de-embedding applied to eye diagram analysis
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...

9. On Non-Linear Estimation of a Measurand
Published: 11/7/2011
Authors: Chih-Ming Wang, Hariharan K. (Hariharan K.) Iyer
Abstract: We consider an estimation problem described in the Guide to the Expression of Uncertainty in Measurement (GUM). The problem is concerned with estimating a measurand that is a non-linear function of input quantities. The GUM describes two methods for ...

10. On Multiple-Method Studies
Published: 10/4/2010
Authors: Chih-Ming Wang, Hariharan K. (Hariharan K.) Iyer
Abstract: In this paper we review statistical models that describe measurements from a multiple-method study such as in the development of a reference material. We also review requirements for the so-called GUM compliance as this appears to be an important cri ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series