NIST logo

Publications Portal

You searched on:
Author: Zachary Levine

Displaying records 1 to 10 of 101 records.
Resort by: Date / Title


1. Polarization-Entangled Photon Pairs From Periodically-Poled Crystalline Waveguides Over a Range of Frequencies
Series: Journal of Research (NIST JRES)
Report Number: 118.018
Published: 8/15/2013
Authors: Zachary H Levine, Dylan A. Heberle
Abstract: We propose a method to extend the range of polarization entanglement in periodically poled rubidium- doped potassium titanyl phosphate (Rb:KTP) and titanium in-diffused lithium niobate (Ti:LN) waveguides. By fabricating waveguides at an angle rel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911998

2. An algorithm for finding clusters with a known distribution and its application to photon-number resolution using a superconducting transition-edge sensor
Published: 7/20/2012
Authors: Zachary H Levine, Thomas Gerrits, Alan L Migdall, Daniel Victor Samarov, Brice R. Calkins, Adriana Eleni Lita, Sae Woo Nam
Abstract: Improving photon-number resolution of single-photon sensitive detectors is important for many applications, as is extending the range of such detectors. Here we seek improved resolution for a particular Superconducting Transition-Edge Sensor (TES) t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911195

3. Uncertainty in RECIST as a measure of volume for lung nodules and liver malignoma
Published: 4/27/2012
Authors: Zachary H Levine, Adam L Pintar, John G Hagedorn, Charles D. Fenimore, Claus P. Heussel
Abstract: The authors investigate the extent to which the RESPONSE Evaluation Criateria in Solid Tumors (RECIST) can predict tumor volumes and changes in volume using clinical data. The data presented are a reanalysis of data acquired in other studies, includ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909862

4. Tumor volume measurement errors RECIST studied with realistic tumor models
Series: Journal of Research (NIST JRES)
Published: 5/16/2011
Authors: Benjamin R. Galloway, Adele P Peskin, Zachary H Levine
Abstract: RECIST (Response Evaluation Criteria in Solid Tumors) is a linear measure intended to predict tumor volume in medical computed tomography (CT). In this work, using purely geometrical considerations, we estimate how well RECIST can predict the volume ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907952

5. Frequency-bin Entangled Comb of Photon Pairs From a Silicon-on-Insulator Micro-Resonator
Published: 1/13/2011
Authors: Jun Chen, Zachary H Levine, Jingyun Fan, Alan L Migdall
Abstract: We present a quantum-mechanical theory to describe narrow-band photon- pair generation via four-wave mixing in a Silicon-on-Insulator (SOI) micro- resonator. We also provide design principles for efficient photon-pair generation in an SOI mic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906297

6. Heralded, pure-state single-photon source based on a Potassium Titanyl Phosphate waveguide
Published: 2/15/2010
Authors: Zachary H Levine, Jingyun Fan, Jun Chen, Alexander E. Ling, Alan L Migdall
Abstract: WWe analyze the generation of single spatial mode, spectrally uncorrelated photon pairs via type II spontaneous parametric downconversion in a Potassium Titanyl Phosphate (KTP) waveguide using real experimental parameters. We show that this source ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904223

7. Design considerations for a cascaded grating interferometer suitable for EUV interference lithography
Published: 4/10/2009
Authors: Zachary H Levine, Thomas B Lucatorto, Steven E Grantham
Abstract: The potential of a cascaded grating interferometer to perform Extreme Ultraviolet Interference Lithography (EUV-IL) depends on its beng coupled to a source that is bright enought to allow exposures ina reasonable time.   This work presents a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842467

8. A Low-Cost Density Reference Phantom for Computed Tomography
Published: 1/2/2009
Authors: Zachary H Levine, Ming-Dong Li, Anthony P Reeves, David F Yankelevitz, Joseph J Chen, Eliot L Siegel, Adele P Peskin, Diana N. Zeiger
Abstract: We have characterized a commercially-available polyurethane foam which is marketed for modeling parts in the aircraft, automotive, and related industries. We find that the foam may be suitable for use as a density reference standard in the range bel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842519

9. A Low Cost Fiducial Reference for Computed Tomography
Published: 11/11/2008
Authors: Zachary H Levine, Steven E Grantham, Daniel S Sawyer, Anthony P Reeves, David F Yankelevitz
Abstract: Rationale and Objectives. To detect the growth in lesions, it is necessary to ensure that the apparent changes in size are above the noise floor of the system. By introducing a fiducial reference, it may be possible to detect smaller changes in le ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842437

10. Diffraction and Electron Energy Loss to Plasmons in Silicon Slabs
Published: 3/10/2008
Author: Zachary H Levine
Abstract: Dynamic diffraction patterns have been calculated for 25-nm thick slabs of silicon with [001], [111], and [110] faces for a 120 keV electron beam. The calculation used the mixed dynamical form factor in the dielectric formulation. Dielectric matric ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840261



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series